World's Best Scientists 2026 revealed!

D-Index & Metrics

Materials Science

D-Index
90
Citations
31292
World Ranking
1678
National Ranking
517

Physics

D-Index
89
Citations
30139
World Ranking
2312
National Ranking
1163

Alexei Gruverman publication distribution in Materials Science in 2026

The chart shows the distribution of publications by all Research.com ranked scientists in the field of Materials Science in 2026. The highlighted bar marks where Alexei Gruverman sits on this spectrum.

50–69 publications: 28 scientists 70–89 publications: 152 scientists 90–109 publications: 356 scientists 110–129 publications: 487 scientists 130–149 publications: 723 scientists 150–169 publications: 835 scientists 170–189 publications: 850 scientists 190–209 publications: 891 scientists 210–229 publications: 862 scientists 230–249 publications: 766 scientists 250–269 publications: 726 scientists 270–289 publications: 665 scientists 290–309 publications: 593 scientists 310–329 publications: 537 scientists 330–349 publications: 477 scientists 350–369 publications: 440 scientists 370–389 publications: 356 scientists 390–409 publications: 321 scientists 410–429 publications: 256 scientists 430–449 publications: 246 scientists 450–469 publications: 216 scientists 470–489 publications: 212 scientists 490–509 publications: 174 scientists 510–529 publications: 194 scientists 530–549 publications: 162 scientists 550–569 publications: 131 scientists 570–589 publications: 111 scientists 590–609 publications: 103 scientists 610–629 publications: 99 scientists 630–649 publications: 77 scientists 650–669 publications: 92 scientists 670–689 publications: 56 scientists 690–709 publications: 53 scientists 710–729 publications: 53 scientists 730–749 publications: 38 scientists 750–769 publications: 52 scientists 770–789 publications: 43 scientists 790–809 publications: 38 scientists 810–829 publications: 34 scientists 830–849 publications: 25 scientists 850–869 publications: 18 scientists 870–889 publications: 20 scientists 890–909 publications: 24 scientists 910–929 publications: 27 scientists 930–949 publications: 20 scientists 950–969 publications: 17 scientists 970–989 publications: 10 scientists 990–1,009 publications: 16 scientists 1,010–1,029 publications: 13 scientists 1,030–1,049 publications: 12 scientists 1,050–1,069 publications: 9 scientists 1,070–1,089 publications: 8 scientists 1,090–1,109 publications: 7 scientists 1,110–1,129 publications: 9 scientists 1,130–1,149 publications: 2 scientists 1,150–1,162 publications: 5 scientists 1,163+ publications: 100 scientists
50 publications 1,163+

This scientist: 349 publications — 70th percentile

70% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 1,163 publications or more.

Alexei Gruverman D-index placement in Materials Science in 2026

The chart shows the D-index (discipline H-index) distribution of Materials Science scientists ranked by Research.com in 2026. The highlighted bar marks where Alexei Gruverman sits on this spectrum.

40–41 D-Index: 211 scientists 42–43 D-Index: 450 scientists 44–45 D-Index: 612 scientists 46–47 D-Index: 612 scientists 48–49 D-Index: 598 scientists 50–51 D-Index: 657 scientists 52–53 D-Index: 667 scientists 54–55 D-Index: 621 scientists 56–57 D-Index: 597 scientists 58–59 D-Index: 610 scientists 60–61 D-Index: 587 scientists 62–63 D-Index: 606 scientists 64–65 D-Index: 533 scientists 66–67 D-Index: 490 scientists 68–69 D-Index: 469 scientists 70–71 D-Index: 378 scientists 72–73 D-Index: 421 scientists 74–75 D-Index: 359 scientists 76–77 D-Index: 323 scientists 78–79 D-Index: 299 scientists 80–81 D-Index: 230 scientists 82–83 D-Index: 210 scientists 84–85 D-Index: 195 scientists 86–87 D-Index: 203 scientists 88–89 D-Index: 175 scientists 90–91 D-Index: 175 scientists 92–93 D-Index: 142 scientists 94–95 D-Index: 121 scientists 96–97 D-Index: 117 scientists 98–99 D-Index: 107 scientists 100–101 D-Index: 88 scientists 102–103 D-Index: 85 scientists 104–105 D-Index: 68 scientists 106–107 D-Index: 62 scientists 108–109 D-Index: 57 scientists 110–111 D-Index: 45 scientists 112–113 D-Index: 49 scientists 114–115 D-Index: 50 scientists 116–117 D-Index: 34 scientists 118–119 D-Index: 38 scientists 120–121 D-Index: 37 scientists 122–123 D-Index: 29 scientists 124–125 D-Index: 28 scientists 126–127 D-Index: 24 scientists 128–129 D-Index: 33 scientists 130–131 D-Index: 28 scientists 132–133 D-Index: 21 scientists 134–135 D-Index: 20 scientists 136–137 D-Index: 23 scientists 138–139 D-Index: 17 scientists 140–141 D-Index: 12 scientists 142–143 D-Index: 17 scientists 144–145 D-Index: 21 scientists 146–147 D-Index: 13 scientists 148–149 D-Index: 11 scientists 150–151 D-Index: 14 scientists 152–153 D-Index: 13 scientists 154–155 D-Index: 9 scientists 156–157 D-Index: 10 scientists 158–159 D-Index: 7 scientists 160–161 D-Index: 4 scientists 162–163 D-Index: 4 scientists 164 D-Index: 3 scientists 165+ D-Index: 98 scientists
40 D-Index 165+

This scientist: 90 D-Index — 87th percentile

87% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 165 D-Index or more.

Research.com Recognitions

  • 2013 - Fellow of American Physical Society (APS) Citation For pioneering contribution to the development of piezoresponse force microscopy as a probing and controlling tool of nanoscale phenomena in ferroelectric and piezoelectric heterostructures

Overview

Alexei Gruverman is affiliated with the University of Nebraska-Lincoln in the United States. Their research primarily spans the fields of Materials Science and Engineering, with a particular focus on Materials Chemistry and Electrical and Electronic Engineering as key subfields. Biomedical Engineering, Electronic, Optical and Magnetic Materials, and Atomic and Molecular Physics and Optics also represent areas of their interdisciplinary research interest.

Their scientific output covers a range of topics, notably in Ferroelectric and Piezoelectric Materials, Ferroelectric and Negative Capacitance Devices, and Acoustic Wave Resonator Technologies. Other main topics include Perovskite Materials and Applications, 2D Materials and Applications, Multiferroics and related materials, and MXene and MAX Phase Materials.

Gruverman has contributed to several frequent publication venues, including Advanced Functional Materials, Advanced Materials, Nature Communications, arXiv (Cornell University), and Advanced Electronic Materials. These platforms reflect the intersection of their expertise in electronic materials and applied physics.

Recent significant papers showcasing their research include:

  1. Electrical and Elastic Properties of Individual Single-Layer Nb4C3Tx MXene Flakes, 2020, Advanced Electronic Materials
  2. Intrinsic ferroelectricity in Y-doped HfO2 thin films, 2022, Nature Materials
  3. Ferroelectric Domain Wall Memristor, 2020, Advanced Functional Materials
  4. Metallic surface doping of metal halide perovskites, 2021, Nature Communications
  5. Roadmap on ferroelectric hafnia- and zirconia-based materials and devices, 2023, APL Materials

They have collaborated extensively with various researchers, with frequent co-authors including Haidong Lu, Pratyush Buragohain, Alexander Sinitskii, Alexey Lipatov, and Xiaoshan Xu.

Alexei Gruverman received the honor of Fellow of the American Physical Society (APS) in 2013. This recognition cited their pioneering contribution to the development of piezoresponse force microscopy as a tool for probing and controlling nanoscale phenomena in ferroelectric and piezoelectric heterostructures.

Best Publications

  • Giant switchable photovoltaic effect in organometal trihalide perovskite devices

    Zhengguo Xiao;Yongbo Yuan;Yuchuan Shao;Qi Wang

  • Grain boundary dominated ion migration in polycrystalline organic–inorganic halide perovskite films

    Yuchuan Shao;Yanjun Fang;Tao Li;Qi Wang

  • Elastic properties of 2D Ti3C2Tx MXene monolayers and bilayers

    Alexey Lipatov;Haidong Lu;Mohamed H. Alhabeb;Babak Anasori

  • Mechanical Writing of Ferroelectric Polarization

    Haidong Lu;C.-W. Bark;D. Esque de los Ojos;J. Alcala

  • Monolithic integration of hybrid perovskite single crystals with heterogenous substrate for highly sensitive X-ray imaging

    Wei Wei;Yang Zhang;Qiang Xu;Haotong Wei

  • Efficiency enhancement in organic solar cells with ferroelectric polymers

    Yongbo Yuan;Timothy J. Reece;Pankaj Sharma;Shashi Poddar

  • Thin Insulating Tunneling Contacts for Efficient and Water-Resistant Perovskite Solar Cells.

    Qi Wang;Qingfeng Dong;Tao Li;Alexei Gruverman

  • Imaging and control of domain structures in ferroelectric thin films via scanning force microscopy

    Alexei Gruverman;Orlando Auciello;Hiroshi Tokumoto

  • Tunneling electroresistance effect in ferroelectric tunnel junctions at the nanoscale.

    A. Gruverman;D. Wu;H. Lu;Y. Wang

  • Scanning Probe Microscopy : Electrical and Electromechanical Phenomena at the Nanoscale

    Sergei Kalinin;Alexei Gruverman

  • Nanoscale ferroelectrics: processing, characterization and future trends

    A Gruverman;A Kholkin

  • Molecular doping enabled scalable blading of efficient hole transport layer-free perovskite solar cells

    Jinsong Huang;Wuqiang Wu

  • Piezoresponse force microscopy and recent advances in nanoscale studies of ferroelectrics

    A. Gruverman;Sergei Kalinin

  • Piezoresponse force microscopy and nanoferroic phenomena.

    Alexei Gruverman;Marin Alexe;Dennis Meier

  • Ferroelectric tunnel memristor.

    D. J. Kim;H. Lu;S. Ryu;C.-W. Bark

  • Electric‐Field‐Driven Reversible Conversion Between Methylammonium Lead Triiodide Perovskites and Lead Iodide at Elevated Temperatures

    Yongbo Yuan;Qi Wang;Yuchuan Shao;Haidong Lu

  • Enhanced tunnelling electroresistance effect due to a ferroelectrically induced phase transition at a magnetic complex oxide interface

    Y. W. Yin;Y. W. Yin;J. D. Burton;Y-M. Kim;A. Y. Borisevich

  • Emergence of room-temperature ferroelectricity at reduced dimensions

    D. Lee;H. Lu;Y. Gu;S.-Y. Choi

  • Nanoscale characterisation of ferroelectric materials : scanning probe microscopy approach

    M. Alexe;A. Gruverman

  • Nanoscale investigation of fatigue effects in Pb(Zr,Ti)O3 films

    Alexei Gruverman;O. Auciello;H. Tokumoto

Frequent Co-Authors

Brian J. Rodriguez
Brian J. Rodriguez University College Dublin
Chang-Beom Eom
Chang-Beom Eom University of Wisconsin–Madison
Evgeny Y. Tsymbal
Evgeny Y. Tsymbal University of Nebraska–Lincoln
Sergei V. Kalinin
Sergei V. Kalinin University of Tennessee at Knoxville
Jinsong Huang
Jinsong Huang University of North Carolina at Chapel Hill
Alexander Sinitskii
Alexander Sinitskii University of Nebraska–Lincoln
Stephen Ducharme
Stephen Ducharme University of Nebraska–Lincoln
Robert Nemanich
Robert Nemanich Arizona State University
Angus I. Kingon
Angus I. Kingon Brown University
Chung Wung Bark
Chung Wung Bark Gachon University

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