The chart shows the distribution of publications by all Research.com ranked scientists in the field of Materials Science in 2026. The highlighted bar marks where Chang-Beom Eom sits on this spectrum.
This scientist: 811 publications — 97th percentile
97% of scientists in this discipline score the same or lower.
The last bar groups every scientist with 1,163 publications or more.
The chart shows the D-index (discipline H-index) distribution of Materials Science scientists ranked by Research.com in 2026. The highlighted bar marks where Chang-Beom Eom sits on this spectrum.
This scientist: 112 D-Index — 95th percentile
95% of scientists in this discipline score the same or lower.
The last bar groups every scientist with 165 D-Index or more.
Chang-Beom Eom is affiliated with the University of Wisconsin-Madison in the United States. Their research primarily focuses on materials science, physics and astronomy, and engineering, with an emphasis on several subfields including materials chemistry, electronic, optical and magnetic materials, electrical and electronic engineering, atomic and molecular physics and optics, and condensed matter physics.
The scientist's work covers a variety of main research topics including:
Chang-Beom Eom has published numerous influential papers, with some recent examples being:
The scientist frequently collaborates with other researchers including Kitae Eom, M. S. Rzchowski, Patrick Irvin, Jeremy Levy, and Hyungwoo Lee. Their work often appears in a range of scientific venues, with notable frequent publication sources such as arXiv (Cornell University), Physical Review B, APL Materials, Science Advances, and Nature Communications.
Among their recognitions, Chang-Beom Eom has received the David Adler Lectureship Award in the Field of Materials Physics in 2020. They were also named a Fellow of the American Association for the Advancement of Science (AAAS) in 2018 and a Fellow of the Materials Research Society in 2011.
K. J. Choi;M. Biegalski;Y. L. Li;A. Sharan
T. Zhao;T. Zhao;A. Scholl;F. Zavaliche;K. Lee
Darrell G. Schlom;Long Qing Chen;Chang Beom Eom;Karin M. Rabe
D. C. Larbalestier;L. D. Cooley;M. O. Rikel;A. A. Polyanskii
D.C. Larbalestier;M.O. Rikel;L.D. Cooley;A.A. Polyanskii
Haidong Lu;C.-W. Bark;D. Esque de los Ojos;J. Alcala
C. B. Eom;R. J. Cava;R. M. Fleming;Julia M. Phillips
Cb B. Eom;Mk K. Lee;Jh H. Choi;Lj J. Belenky
C.B. Eom;M.K. Lee;J.H. Choi;L. Belenky
Christopher T. Nelson;Benjamin Winchester;Yi Zhang;Yi Zhang;Sung Joo Kim
Gertjan Koster;L. Klein;W. Siemons;Augustinus J.H.M. Rijnders
D. A. Dikin;M. Mehta;C. W. Bark;C. M. Folkman
C. B. Eom;R. B. Van Dover;Julia M. Phillips;D. J. Werder
S. H. Baek;H. W. Jang;C. M. Folkman;Y. L. Li
A. Gruverman;D. Wu;H. Lu;Y. Wang
C. B. Eom;J. Z. Sun;K. Yamamoto;A. F. Marshall
S. H. Baek;J. Park;D. M. Kim;Vladimir A. Aksyuk
F. Tsui;M. C. Smoak;T. K. Nath;C. B. Eom
J. Z. Sun;D. W. Abraham;R. A. Rao;C. B. Eom
Christopher T. Nelson;Peng Gao;Jacob R. Jokisaari;Colin Heikes
D. C. Larbalestier
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