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IEEE

International Conference on Microelectronic Test Structures (ICMTS)

Location: Tokyo , Japan

Conference dates: 3/27/2023 - 3/30/2023

Research H-index
4

Ranking & Metrics

Discipline name Position Best Scientists Publications D-Index
Materials Science 145 5 10 2
Electronics and Electrical Engineering 506 22 29 4
Engineering and Technology 447 5 12 2

Call for Papers

Original papers
are solicited presenting new developments in topics relevant to ICMTS, including but not limited to, test
structures, measurements, and results, in the following areas:
• Design
o Methodologies, Verification
o Within-die circuits for process characterization/monitoring
o Design enablement – Characterization and validation of digital and analog libraries
o Devices and Circuit Modeling
• Measurement techniques
o DC, AC and RF measurements: setup, test and analysis
o Reliability test - including thermal stability, failure analysis, prediction, etc.
o Statistical analysis, variability, throughput increase, smart test strategies
o Use of machine learning and AI in analysis of data sets - parameter extraction etc.
o Wafer probing, within-die measurements, in-line metrology
o Throughput, testing strategies, yield enhancement and process control tests
• Applications
o Emerging memory technologies (single cell, arrays, and application in neural networks)
o Emerging transistor technologies for digital/analog/power applications
o Photonic devices - silicon integration, new displays (OLED, μ-displays)
o Flexible electronics and sensors (organic and inorganic materials)
o M(N)EMS, actuators, sensors, PV cells and other emerging devices

Overview

This page presents a comprehensive ranking of scientific conferences in the field of Engineering and Technology, carefully compiled to offer researchers, academics, and industry professionals a reliable benchmark for assessing conference impact and prestige. The ranking has been meticulously prepared by Research.com, a leading platform recognized for providing trusted and authoritative data on scientific contributions across all major fields—including Engineering and Technology—since 2014.

Conference positions in the ranking are determined using a unique bibliometric score developed by Research.com. This scoring system draws upon both the estimated h-index and the number of leading scientists who have participated in each conference over the preceding three years, offering a nuanced measure of scientific influence and engagement. The Impact Score values represented in this ranking are based on data collected as of 2024-11-27, ensuring that the information is both current and relevant to today’s research landscape.

The development of this ranking involved an extensive process, which included the evaluation of more than 2,262 conferences. These were selected following a rigorous inspection of over 26,934 scientific documents published within the last three years by 9,385 of the most respected and influential scientists in Engineering and Technology. This thorough approach underscores the credibility and reliability of the resulting rankings, reflecting the dedication and expertise of the Research.com team in delivering objective, data-driven evaluations.

Further details regarding the precise methodology employed to compute the ranking scores can be found on our Methodology Page.

Papers citation over time

A key indicator for each conference is its effectiveness in reaching other researchers with the papers published at that venue.

The chart below presents the interquartile range (first quartile 25%, median 50% and third quartile 75%) of the number of citations of articles over time.

The top authors publishing at International Conference on Microelectronic Test Structures (based on the number of publications) are:

  • Anthony J. Walton (66 papers) published 5 papers at the last edition, 1 more than at the previous edition,
  • Stewart Smith (63 papers) published 5 papers at the last edition, 1 more than at the previous edition,
  • J.T.M. Stevenson (32 papers) absent at the last edition,
  • Gerard Ghibaudo (28 papers) published 6 papers at the last edition, 4 more than at the previous edition,
  • Jonathan G. Terry (25 papers) published 5 papers at the last edition, 3 more than at the previous edition.

The overall trend for top authors publishing at this conference is outlined below. The chart shows the number of publications at each edition of the conference for top authors.

Only papers with recognized affiliations are considered

The top affiliations publishing at International Conference on Microelectronic Test Structures (based on the number of publications) are:

  • University of Edinburgh (66 papers) published 5 papers at the last edition, 1 more than at the previous edition,
  • STMicroelectronics (62 papers) published 4 papers at the last edition, 2 more than at the previous edition,
  • NXP Semiconductors (31 papers) published 2 papers at the last edition the same number as at the previous edition,
  • Katholieke Universiteit Leuven (28 papers) published 1 paper at the last edition, 1 less than at the previous edition,
  • IBM (26 papers) absent at the last edition.

The overall trend for top affiliations publishing at this conference is outlined below. The chart shows the number of publications at each edition of the conference for top affiliations.

Publication chance based on affiliation

The publication chance index shows the ratio of articles published by the best research institutions at the conference edition to all articles published within that conference. The best research institutions were selected based on the largest number of articles published during all editions of the conference.

The chart below presents the percentage ratio of articles from top institutions (based on their ranking of total papers).Top affiliations were grouped by their rank into the following tiers: top 1-10, top 11-20, top 21-50, and top 51+. Only articles with a recognized affiliation are considered.

During the most recent 2017 edition, 2.78% of publications had an unrecognized affiliation. Out of the publications with recognized affiliations, 45.71% were posted by at least one author from the top 10 institutions publishing at the conference. Another 8.57% included authors affiliated with research institutions from the top 11-20 affiliations. Institutions from the 21-50 range included 22.86% of all publications and 22.86% were from other institutions.

Returning Authors Index

A very common phenomenon observed among researchers publishing scientific articles is the intentional selection of conferences they have already attended in the past. In particular, it is worth analyzing the case when the authors participate in the same conference from year to year.

The Returning Authors Index presented below illustrates the ratio of authors who participated in both a given as well as the previous edition of the conference in relation to all participants in a given year.

Returning Institution Index

The graph below shows the Returning Institution Index, illustrating the ratio of institutions that participated in both a given and the previous edition of the conference in relation to all affiliations present in a given year.

The experience to innovation index

Our experience to innovation index was created to show a cross-section of the experience level of authors publishing at a conference. The index includes the authors publishing at the last edition of a conference, grouped by total number of publications throughout their academic career (P) and the total number of citations of these publications ever received (C).

The group intervals were selected empirically to best show the diversity of the authors' experiences, their labels were selected as a convenience, not as judgment. The authors were divided into the following groups:

  • Novice - P < 5 or C < 25 (the number of publications less than 5 or the number of citations less than 25),
  • Competent - P < 10 or C < 100 (the number of publications less than 10 or the number of citations less than 100),
  • Experienced - P < 25 or C < 625 (the number of publications less than 25 or the number of citations less than 625),
  • Master - P < 50 or C < 2500 (the number of publications less than 50 or the number of citations less than 2500),
  • Star - P ≥ 50 and C ≥ 2500 (both the number of publications greater than 50 and the number of citations greater than 2500).

The chart below illustrates experience levels of first authors in cases of publications with multiple authors.

Related Online Degrees & Career Pathways

Pursuing a degree in Electronics and Electrical Engineering opens numerous career opportunities, but students may also explore complementary fields to diversify their skills. For example, online programs like the online msw programs offer pathways into social work, blending technical expertise with community-focused roles.

Choosing the right accredited institution is crucial for career growth. The accredited online degree programs highlighted provide quality education, ensuring degrees are recognized by employers and professional bodies.

For those inclined toward leadership or counseling roles within tech companies, degrees such as the psyd or a masters in organizational leadership can prepare graduates for managerial and psychological support roles that complement technical careers.

Exploring these diverse online degree options can enrich your qualifications, helping you forge a versatile and resilient career path in the evolving tech landscape.

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