World's Best Scientists 2026 revealed!

D-Index & Metrics

Engineering and Technology

D-Index
38
Citations
6242
World Ranking
8013
National Ranking
2210

Majeed M. Hayat publication distribution in Engineering and Technology in 2026

The chart shows the distribution of publications by all Research.com ranked scientists in the field of Engineering and Technology in 2026. The highlighted bar marks where Majeed M. Hayat sits on this spectrum.

38–47 publications: 20 scientists 48–57 publications: 35 scientists 58–67 publications: 96 scientists 68–77 publications: 135 scientists 78–87 publications: 190 scientists 88–97 publications: 259 scientists 98–107 publications: 283 scientists 108–117 publications: 369 scientists 118–127 publications: 341 scientists 128–137 publications: 386 scientists 138–147 publications: 372 scientists 148–157 publications: 457 scientists 158–167 publications: 415 scientists 168–177 publications: 407 scientists 178–187 publications: 421 scientists 188–197 publications: 378 scientists 198–207 publications: 403 scientists 208–217 publications: 317 scientists 218–227 publications: 346 scientists 228–237 publications: 321 scientists 238–247 publications: 260 scientists 248–257 publications: 280 scientists 258–267 publications: 240 scientists 268–277 publications: 214 scientists 278–287 publications: 242 scientists 288–297 publications: 203 scientists 298–307 publications: 166 scientists 308–317 publications: 154 scientists 318–327 publications: 175 scientists 328–337 publications: 159 scientists 338–347 publications: 99 scientists 348–357 publications: 131 scientists 358–367 publications: 106 scientists 368–377 publications: 118 scientists 378–387 publications: 97 scientists 388–397 publications: 108 scientists 398–407 publications: 82 scientists 408–417 publications: 71 scientists 418–427 publications: 64 scientists 428–437 publications: 55 scientists 438–447 publications: 54 scientists 448–457 publications: 60 scientists 458–467 publications: 47 scientists 468–477 publications: 40 scientists 478–487 publications: 30 scientists 488–497 publications: 29 scientists 498–507 publications: 38 scientists 508–517 publications: 40 scientists 518–527 publications: 32 scientists 528–537 publications: 23 scientists 538–547 publications: 28 scientists 548–557 publications: 23 scientists 558–567 publications: 19 scientists 568–577 publications: 16 scientists 578–587 publications: 17 scientists 588–597 publications: 18 scientists 598–607 publications: 22 scientists 608–617 publications: 15 scientists 618–627 publications: 9 scientists 628–637 publications: 11 scientists 638–647 publications: 21 scientists 648–657 publications: 12 scientists 658–667 publications: 9 scientists 668–677 publications: 11 scientists 678–687 publications: 9 scientists 688–697 publications: 6 scientists 698–707 publications: 14 scientists 708–717 publications: 7 scientists 718–727 publications: 8 scientists 728–737 publications: 10 scientists 738–747 publications: 9 scientists 748–757 publications: 5 scientists 758–767 publications: 5 scientists 768–777 publications: 11 scientists 778–787 publications: 7 scientists 788–797 publications: 2 scientists 798–803 publications: 4 scientists 804+ publications: 100 scientists
38 publications 804+

This scientist: 290 publications — 74th percentile

74% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 804 publications or more.

Majeed M. Hayat D-index placement in Engineering and Technology in 2026

The chart shows the D-index (discipline H-index) distribution of Engineering and Technology scientists ranked by Research.com in 2026. The highlighted bar marks where Majeed M. Hayat sits on this spectrum.

30 D-Index: 59 scientists 31 D-Index: 114 scientists 32 D-Index: 129 scientists 33 D-Index: 189 scientists 34 D-Index: 200 scientists 35 D-Index: 262 scientists 36 D-Index: 311 scientists 37 D-Index: 312 scientists 38 D-Index: 350 scientists 39 D-Index: 385 scientists 40 D-Index: 348 scientists 41 D-Index: 362 scientists 42 D-Index: 426 scientists 43 D-Index: 380 scientists 44 D-Index: 310 scientists 45 D-Index: 341 scientists 46 D-Index: 301 scientists 47 D-Index: 306 scientists 48 D-Index: 271 scientists 49 D-Index: 246 scientists 50 D-Index: 210 scientists 51 D-Index: 253 scientists 52 D-Index: 213 scientists 53 D-Index: 221 scientists 54 D-Index: 195 scientists 55 D-Index: 186 scientists 56 D-Index: 170 scientists 57 D-Index: 167 scientists 58 D-Index: 166 scientists 59 D-Index: 144 scientists 60 D-Index: 152 scientists 61 D-Index: 141 scientists 62 D-Index: 138 scientists 63 D-Index: 131 scientists 64 D-Index: 118 scientists 65 D-Index: 114 scientists 66 D-Index: 119 scientists 67 D-Index: 95 scientists 68 D-Index: 87 scientists 69 D-Index: 77 scientists 70 D-Index: 89 scientists 71 D-Index: 69 scientists 72 D-Index: 54 scientists 73 D-Index: 46 scientists 74 D-Index: 55 scientists 75 D-Index: 54 scientists 76 D-Index: 49 scientists 77 D-Index: 53 scientists 78 D-Index: 46 scientists 79 D-Index: 28 scientists 80 D-Index: 39 scientists 81 D-Index: 36 scientists 82 D-Index: 24 scientists 83 D-Index: 26 scientists 84 D-Index: 36 scientists 85 D-Index: 18 scientists 86 D-Index: 25 scientists 87 D-Index: 19 scientists 88 D-Index: 26 scientists 89 D-Index: 27 scientists 90 D-Index: 23 scientists 91 D-Index: 15 scientists 92 D-Index: 12 scientists 93 D-Index: 9 scientists 94 D-Index: 15 scientists 95 D-Index: 10 scientists 96 D-Index: 13 scientists 97 D-Index: 13 scientists 98 D-Index: 9 scientists 99 D-Index: 7 scientists 100 D-Index: 7 scientists 101 D-Index: 8 scientists 102 D-Index: 7 scientists 103 D-Index: 7 scientists 104 D-Index: 9 scientists 105 D-Index: 6 scientists 106 D-Index: 9 scientists 107+ D-Index: 99 scientists
30 D-Index 107+

This scientist: 38 D-Index — 20th percentile

20% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 107 D-Index or more.

Research.com Recognitions

  • 2014 - IEEE Fellow For contributions to the modeling of impact ionization and noise in avalanche-photodiode devices
  • 2013 - OSA Fellows For pioneering the dead-space formulation of impact ionization and noise in avalanche photodiodes and developing nonuniformity correction algorithms for infrared sensors.
  • 2012 - SPIE Fellow

Overview

Majeed M. Hayat is affiliated with Marquette University in the United States. Their research primarily covers fields such as Engineering and Computer Science, with significant contributions in subfields including Control and Systems Engineering, Computer Networks and Communications, Electrical and Electronic Engineering, Information Systems, and Industrial and Manufacturing Engineering.

The scientist's work addresses multiple topics focused on system security, resilience, and network analysis. Key topics include:

  • Smart Grid Security and Resilience
  • Blockchain Technology Applications and Security
  • Network Security and Intrusion Detection
  • Power System Optimization and Stability
  • Infrastructure Resilience and Vulnerability Analysis
  • Complex Network Analysis Techniques
  • Optimal Power Flow Distribution

Majeed M. Hayat has authored several recent papers, showcasing a range of research interests and collaborations. Some notable publications are:

  • "Data-Integrity Aware Stochastic Model for Cascading Failures in Power Grids," 2022, IEEE Transactions on Power Systems
  • "Mitigating Cascading Failures in Power Grids via Markov Decision-Based Load-Shedding With DC Power Flow Model," 2022, IEEE Systems Journal
  • "Engineering of impact ionization characteristics in In0.53Ga0.47As/Al0.48In0.52As superlattice avalanche photodiodes on InP substrate," 2020, Scientific Reports
  • "Modal Decomposition of the Linear Swing Equation in Networks With Symmetries," 2021, IEEE Transactions on Network Science and Engineering
  • "Blockchain-Secured Iot Framework for Smart Waste Management in Urban Environments," 2025, The Critical Review of Social Sciences Studies

Frequent collaborators include Pankaz Das, Engr. Rukhsar Zaka, Rezoan A. Shuvro, SA Haider, and Kassie Povinelli, indicating an active engagement in interdisciplinary research teams.

Publications featuring Majeed M. Hayat regularly appear in venues such as:

  • IEEE Systems Journal
  • The Critical Review of Social Sciences Studies
  • Physical Education Health and Social Sciences
  • SSRN Electronic Journal
  • IEEE Transactions on Power Systems

Recognized by several professional organizations, Majeed M. Hayat has received distinctions including:

  • IEEE Fellow (2014) for contributions to modeling impact ionization and noise in avalanche-photodiode devices
  • OSA Fellow (2013) for pioneering work on dead-space formulation of impact ionization and noise in avalanche photodiodes and developing nonuniformity correction algorithms for infrared sensors
  • SPIE Fellow (2012)

Best Publications

  • Kalman filtering for adaptive nonuniformity correction in infrared focal-plane arrays.

    Sergio N. Torres;Majeed M. Hayat

  • Effect of dead space on gain and noise of double-carrier-multiplication avalanche photodiodes

    M.M. Hayat;B.E.A. Saleh;M.C. Teich

  • Scene-based Nonuniformity Correction with Video Sequences and Registration

    Russell C. Hardie;Majeed M. Hayat;Ernest E. Armstrong;Brian Yasuda

  • Statistical algorithm for nonuniformity correction in focal-plane arrays.

    Majeed M. Hayat;Sergio N. Torres;Ernest Armstrong;Stephen C. Cain

  • An Algebraic Algorithm for Nonuniformity Correction in Focal-Plane Arrays

    Bradley Michael Ratliff;Majeed M. Hayat;Russell C. Hardie

  • Impact-ionization and noise characteristics of thin III-V avalanche photodiodes

    M.A. Saleh;M.M. Hayat;P.P. Sotirelis;A.L. Holmes

  • Stochastic Analysis of Cascading-Failure Dynamics in Power Grids

    Mahshid Rahnamay-Naeini;Zhuoyao Wang;Nasir Ghani;Andrea Mammoli

  • Projection-based image registration in the presence of fixed-pattern noise

    S.C. Cain;M.M. Hayat;E.E. Armstrong

  • Effect of dead space on gain and noise in Si and GaAs avalanche photodiodes

    M.M. Hayat;W.L. Sargeant;B.E.A. Saleh

  • Dynamic Load Balancing in Distributed Systems in the Presence of Delays: A Regeneration-Theory Approach

    Sagar Dhakal;Majeed M. Hayat;Jorge E. Pezoa;Cundong Yang

  • Cascading Failures in Interdependent Infrastructures: An Interdependent Markov-Chain Approach

    Mahshid Rahnamay-Naeini;Majeed M. Hayat

  • Effect of dead space on the excess noise factor and time response of avalanche photodiodes

    B.E.A. Saleh;M.M. Hayat;M.C. Teich

  • Scene-based nonuniformity correction for focal plane arrays by the method of the inverse covariance form

    Sergio N. Torres;Jorge E. Pezoa;Majeed M. Hayat

  • Dead-space-based theory correctly predicts excess noise factor for thin GaAs and AlGaAs avalanche photodiodes

    M.A. Saleh;M.M. Hayat;B.E.A. Saleh;M.C. Teich

  • Generalized algebraic scene-based nonuniformity correction algorithm.

    Bradley M. Ratliff;Majeed M. Hayat;J. Scott Tyo

  • Spectrally adaptive infrared photodetectors with bias-tunable quantum dots

    Ünal Sakoğlu;J. Scott Tyo;Majeed M. Hayat;Sunil Raghavan

  • Statistical properties of the impulse response function of double-carrier multiplication avalanche photodiodes including the effect of dead space

    M.M. Hayat;B.E.A. Saleh

  • Radiometrically accurate scene-based nonuniformity correction for array sensors

    Bradley M. Ratliff;Majeed M. Hayat;J. Scott Tyo

  • Boundary effects on multiplication noise in thin heterostructure avalanche photodiodes: theory and experiment [Al/sub 0.6/Ga/sub 0.4/As/GaAs]

    M.M. Hayat;Oh-Hyun Kwon;Shuling Wang;J.C. Campbell

  • SAR-Based Vibration Estimation Using the Discrete Fractional Fourier Transform

    Qi Wang;M. Pepin;R. J. Beach;R. Dunkel

  • Modeling Stochastic Correlated Failures and their Effects on Network Reliability

    Mahshid Rahnamay-Naeini;Jorge E. Pezoa;Ghady Azar;Nasir Ghani

Frequent Co-Authors

Sanjay Krishna
Sanjay Krishna The Ohio State University
Bahaa E. A. Saleh
Bahaa E. A. Saleh University of Central Florida
Malvin C. Teich
Malvin C. Teich Boston University
Joe C. Campbell
Joe C. Campbell University of Virginia
John P. R. David
John P. R. David University of Sheffield
Chaouki T. Abdallah
Chaouki T. Abdallah Georgia Institute of Technology
John Chiasson
John Chiasson Boise State University
Russell C. Hardie
Russell C. Hardie University of Dayton
Samee U. Khan
Samee U. Khan Mississippi State University
Bahram Javidi
Bahram Javidi University of Connecticut

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