World's Best Scientists 2026 revealed!

D-Index & Metrics

Engineering and Technology

D-Index
38
Citations
6242
World Ranking
8011
National Ranking
2209

Research.com Recognitions

  • 2014 - IEEE Fellow For contributions to the modeling of impact ionization and noise in avalanche-photodiode devices
  • 2013 - OSA Fellows For pioneering the dead-space formulation of impact ionization and noise in avalanche photodiodes and developing nonuniformity correction algorithms for infrared sensors.
  • 2012 - SPIE Fellow

Overview

Majeed M. Hayat is affiliated with Marquette University in the United States. Their research primarily covers fields such as Engineering and Computer Science, with significant contributions in subfields including Control and Systems Engineering, Computer Networks and Communications, Electrical and Electronic Engineering, Information Systems, and Industrial and Manufacturing Engineering.

The scientist's work addresses multiple topics focused on system security, resilience, and network analysis. Key topics include:

  • Smart Grid Security and Resilience
  • Blockchain Technology Applications and Security
  • Network Security and Intrusion Detection
  • Power System Optimization and Stability
  • Infrastructure Resilience and Vulnerability Analysis
  • Complex Network Analysis Techniques
  • Optimal Power Flow Distribution

Majeed M. Hayat has authored several recent papers, showcasing a range of research interests and collaborations. Some notable publications are:

  • "Data-Integrity Aware Stochastic Model for Cascading Failures in Power Grids," 2022, IEEE Transactions on Power Systems
  • "Mitigating Cascading Failures in Power Grids via Markov Decision-Based Load-Shedding With DC Power Flow Model," 2022, IEEE Systems Journal
  • "Engineering of impact ionization characteristics in In0.53Ga0.47As/Al0.48In0.52As superlattice avalanche photodiodes on InP substrate," 2020, Scientific Reports
  • "Modal Decomposition of the Linear Swing Equation in Networks With Symmetries," 2021, IEEE Transactions on Network Science and Engineering
  • "Blockchain-Secured Iot Framework for Smart Waste Management in Urban Environments," 2025, The Critical Review of Social Sciences Studies

Frequent collaborators include Pankaz Das, Engr. Rukhsar Zaka, Rezoan A. Shuvro, SA Haider, and Kassie Povinelli, indicating an active engagement in interdisciplinary research teams.

Publications featuring Majeed M. Hayat regularly appear in venues such as:

  • IEEE Systems Journal
  • The Critical Review of Social Sciences Studies
  • Physical Education Health and Social Sciences
  • SSRN Electronic Journal
  • IEEE Transactions on Power Systems

Recognized by several professional organizations, Majeed M. Hayat has received distinctions including:

  • IEEE Fellow (2014) for contributions to modeling impact ionization and noise in avalanche-photodiode devices
  • OSA Fellow (2013) for pioneering work on dead-space formulation of impact ionization and noise in avalanche photodiodes and developing nonuniformity correction algorithms for infrared sensors
  • SPIE Fellow (2012)

Best Publications

  • Kalman filtering for adaptive nonuniformity correction in infrared focal-plane arrays.

    Sergio N. Torres;Majeed M. Hayat

  • Effect of dead space on gain and noise of double-carrier-multiplication avalanche photodiodes

    M.M. Hayat;B.E.A. Saleh;M.C. Teich

  • Scene-based Nonuniformity Correction with Video Sequences and Registration

    Russell C. Hardie;Majeed M. Hayat;Ernest E. Armstrong;Brian Yasuda

  • Statistical algorithm for nonuniformity correction in focal-plane arrays.

    Majeed M. Hayat;Sergio N. Torres;Ernest Armstrong;Stephen C. Cain

  • An Algebraic Algorithm for Nonuniformity Correction in Focal-Plane Arrays

    Bradley Michael Ratliff;Majeed M. Hayat;Russell C. Hardie

  • Impact-ionization and noise characteristics of thin III-V avalanche photodiodes

    M.A. Saleh;M.M. Hayat;P.P. Sotirelis;A.L. Holmes

  • Stochastic Analysis of Cascading-Failure Dynamics in Power Grids

    Mahshid Rahnamay-Naeini;Zhuoyao Wang;Nasir Ghani;Andrea Mammoli

  • Projection-based image registration in the presence of fixed-pattern noise

    S.C. Cain;M.M. Hayat;E.E. Armstrong

  • Effect of dead space on gain and noise in Si and GaAs avalanche photodiodes

    M.M. Hayat;W.L. Sargeant;B.E.A. Saleh

  • Dynamic Load Balancing in Distributed Systems in the Presence of Delays: A Regeneration-Theory Approach

    Sagar Dhakal;Majeed M. Hayat;Jorge E. Pezoa;Cundong Yang

  • Cascading Failures in Interdependent Infrastructures: An Interdependent Markov-Chain Approach

    Mahshid Rahnamay-Naeini;Majeed M. Hayat

  • Effect of dead space on the excess noise factor and time response of avalanche photodiodes

    B.E.A. Saleh;M.M. Hayat;M.C. Teich

  • Scene-based nonuniformity correction for focal plane arrays by the method of the inverse covariance form

    Sergio N. Torres;Jorge E. Pezoa;Majeed M. Hayat

  • Dead-space-based theory correctly predicts excess noise factor for thin GaAs and AlGaAs avalanche photodiodes

    M.A. Saleh;M.M. Hayat;B.E.A. Saleh;M.C. Teich

  • Generalized algebraic scene-based nonuniformity correction algorithm.

    Bradley M. Ratliff;Majeed M. Hayat;J. Scott Tyo

  • Spectrally adaptive infrared photodetectors with bias-tunable quantum dots

    Ünal Sakoğlu;J. Scott Tyo;Majeed M. Hayat;Sunil Raghavan

  • Statistical properties of the impulse response function of double-carrier multiplication avalanche photodiodes including the effect of dead space

    M.M. Hayat;B.E.A. Saleh

  • Radiometrically accurate scene-based nonuniformity correction for array sensors

    Bradley M. Ratliff;Majeed M. Hayat;J. Scott Tyo

  • Boundary effects on multiplication noise in thin heterostructure avalanche photodiodes: theory and experiment [Al/sub 0.6/Ga/sub 0.4/As/GaAs]

    M.M. Hayat;Oh-Hyun Kwon;Shuling Wang;J.C. Campbell

  • SAR-Based Vibration Estimation Using the Discrete Fractional Fourier Transform

    Qi Wang;M. Pepin;R. J. Beach;R. Dunkel

  • Modeling Stochastic Correlated Failures and their Effects on Network Reliability

    Mahshid Rahnamay-Naeini;Jorge E. Pezoa;Ghady Azar;Nasir Ghani

Frequent Co-Authors

Sanjay Krishna
Sanjay Krishna The Ohio State University
Bahaa E. A. Saleh
Bahaa E. A. Saleh University of Central Florida
Malvin C. Teich
Malvin C. Teich Boston University
Joe C. Campbell
Joe C. Campbell University of Virginia
John P. R. David
John P. R. David University of Sheffield
Chaouki T. Abdallah
Chaouki T. Abdallah Georgia Institute of Technology
John Chiasson
John Chiasson Boise State University
Russell C. Hardie
Russell C. Hardie University of Dayton
Samee U. Khan
Samee U. Khan Mississippi State University
Bahram Javidi
Bahram Javidi University of Connecticut

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