World's Best Scientists 2026 revealed!
IEEE

IEEE European Test Symposium (ETS)

Location: Milan , Italy

Conference dates: 5/22/2023 - 5/26/2023

Research H-index
9

Ranking & Metrics

Discipline name Position Best Scientists Publications D-Index
Electronics and Electrical Engineering 205 35 84 8
Computer Science 390 39 77 9

Call for Papers

The areas of interest include
(but are not limited to) the following topics:
28 IEEE European Test Symposium
th
Venice, Italy - Hybrid Conference
May 22 - 26, 2023
cas.polito.it/ETS23
Call for Papers
Dependable AI and AI for Testing (Hot Topic)
Functional Safety and Reliability in Automotive (Hot Topic)
Emerging technologies and architectures (Hot Topic)
Security and Trust (Hot Topic)
Analog, Mixed-Signal, RF
DfT and Test Access Standards
Validation, Verification Debug and Diagnosis
Test generation, Fault Simulation, Fault Tolerance, Application and evaluation

Overview

This ranking presents a comprehensive assessment of scientific conferences in the field of Computer Science, meticulously compiled by Research.com, a recognized authority in science research and analytics. Since 2014, Research.com has provided trusted data and insights across all major scientific disciplines, including Computer Science, enabling the academic community to evaluate scientific contributions with precision and reliability.

The ranking is determined by a unique bibliometric score, an advanced metric developed by Research.com, that incorporates the estimated h-index and the number of leading scientists who have contributed to each conference over the preceding three years. This rigorous approach ensures an objective and meaningful reflection of both the scientific impact and the reputational standing of each conference.

For this edition, all Impact Score values reflect data collected as of 2024-11-27. The ranking process entailed a thorough review of more than 2,742 conferences, each selected following stringent preliminary evaluations. Over 148,739 scientific documents, authored by 13,184 leading and widely respected Computer Science researchers, were analyzed from the last three years, to ensure accuracy and depth in the conference assessments.

The creation of this ranking underscores Research.com's dedication to robust and transparent research methodologies, underpinned by expert analysis and the careful consideration of vast bibliometric datasets. For more detailed information on the methodologies employed in calculating these ranking scores, please consult our Methodology Page.

Papers citation over time

A key indicator for each conference is its effectiveness in reaching other researchers with the papers published at that venue.

The chart below presents the interquartile range (first quartile 25%, median 50% and third quartile 75%) of the number of citations of articles over time.

The top authors publishing at European Test Symposium (based on the number of publications) are:

  • Alberto Bosio (18 papers) published 1 paper at the last edition the same number as at the previous edition,
  • Krishnendu Chakrabarty (17 papers) published 3 papers at the last edition, 1 less than at the previous edition,
  • Patrick Girard (17 papers) published 1 paper at the last edition the same number as at the previous edition,
  • Hans-Joachim Wunderlich (17 papers) published 2 papers at the last edition, 1 more than at the previous edition,
  • Arnaud Virazel (16 papers) published 1 paper at the last edition the same number as at the previous edition.

The overall trend for top authors publishing at this conference is outlined below. The chart shows the number of publications at each edition of the conference for top authors.

Only papers with recognized affiliations are considered

The top affiliations publishing at European Test Symposium (based on the number of publications) are:

  • Mentor Graphics (22 papers) published 5 papers at the last edition, 4 more than at the previous edition,
  • Polytechnic University of Turin (19 papers) published 4 papers at the last edition the same number as at the previous edition,
  • Duke University (18 papers) published 3 papers at the last edition, 1 less than at the previous edition,
  • University of Stuttgart (17 papers) published 2 papers at the last edition, 1 more than at the previous edition,
  • NXP Semiconductors (17 papers) published 2 papers at the last edition the same number as at the previous edition.

The overall trend for top affiliations publishing at this conference is outlined below. The chart shows the number of publications at each edition of the conference for top affiliations.

Publication chance based on affiliation

The publication chance index shows the ratio of articles published by the best research institutions at the conference edition to all articles published within that conference. The best research institutions were selected based on the largest number of articles published during all editions of the conference.

The chart below presents the percentage ratio of articles from top institutions (based on their ranking of total papers).Top affiliations were grouped by their rank into the following tiers: top 1-10, top 11-20, top 21-50, and top 51+. Only articles with a recognized affiliation are considered.

During the most recent 2016 edition, 5.66% of publications had an unrecognized affiliation. Out of the publications with recognized affiliations, 36.00% were posted by at least one author from the top 10 institutions publishing at the conference. Another 14.00% included authors affiliated with research institutions from the top 11-20 affiliations. Institutions from the 21-50 range included 26.00% of all publications and 24.00% were from other institutions.

Returning Authors Index

A very common phenomenon observed among researchers publishing scientific articles is the intentional selection of conferences they have already attended in the past. In particular, it is worth analyzing the case when the authors participate in the same conference from year to year.

The Returning Authors Index presented below illustrates the ratio of authors who participated in both a given as well as the previous edition of the conference in relation to all participants in a given year.

Returning Institution Index

The graph below shows the Returning Institution Index, illustrating the ratio of institutions that participated in both a given and the previous edition of the conference in relation to all affiliations present in a given year.

The experience to innovation index

Our experience to innovation index was created to show a cross-section of the experience level of authors publishing at a conference. The index includes the authors publishing at the last edition of a conference, grouped by total number of publications throughout their academic career (P) and the total number of citations of these publications ever received (C).

The group intervals were selected empirically to best show the diversity of the authors' experiences, their labels were selected as a convenience, not as judgment. The authors were divided into the following groups:

  • Novice - P < 5 or C < 25 (the number of publications less than 5 or the number of citations less than 25),
  • Competent - P < 10 or C < 100 (the number of publications less than 10 or the number of citations less than 100),
  • Experienced - P < 25 or C < 625 (the number of publications less than 25 or the number of citations less than 625),
  • Master - P < 50 or C < 2500 (the number of publications less than 50 or the number of citations less than 2500),
  • Star - P ≥ 50 and C ≥ 2500 (both the number of publications greater than 50 and the number of citations greater than 2500).

The chart below illustrates experience levels of first authors in cases of publications with multiple authors.

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