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IEEE

8th Joint International EuroSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS)

Location: Udine , Italy

Submission deadline: 3/25/2022

Conference dates: 5/18/2022 - 5/20/2022

Research H-index
6

Ranking & Metrics

Discipline name Position Best Scientists Publications D-Index
Materials Science 42 10 18 5
Electronics and Electrical Engineering 326 30 51 6

Call for Papers

High-quality contributions in the following areas are solicited:

Advanced SOI materials and structures, innovative SOI-like devices.
Alternative transistor architectures (FDSOI, Nanowire, FinFET, MuGFET, vertical MOSFET, FeFET and TFET, MEMS/NEMS, Beyond-CMOS).
New channel materials for CMOS (strained Si/Ge, III-V, carbon nanotubes; graphene and other 2D materials).
Properties of ultra-thin and buried oxides, defects, interface quality; thin gate dielectrics: high-κ materials for switches and memory.
New functionalities and innovative devices in the More than Moore domain: nanoelectronic sensors, biosensor devices, energy harvesting devices, RF devices, imagers, etc.
Transport phenomena, compact modeling, device simulation, front- and back-end process simulation.
CMOS scaling perspectives; device/circuit level performance evaluation; switches and memory scaling; three-dimensional integration of devices and circuits, heterogeneous integration.
Advanced test structures and characterization techniques, parameter extraction, reliability and variability assessment
techniques for new materials and novel devices

Overview

This ranking presents a comprehensive evaluation of scientific conferences within the field of Electronics and Electrical Engineering. Curated by Research.com, one of the leading platforms dedicated to science research across all major disciplines, the ranking delivers trusted and meticulously gathered data on scientific contributions since 2014.

The listed conferences have been assessed and ranked according to a unique bibliometric score developed by Research.com experts. This score is calculated based on the estimated h-index and the number of leading scientists who have participated in each conference over the most recent three-year period. The Impact Score values featured in this ranking were collected as of 2024-11-27.

The ranking process entailed an extensive analysis of over 2,204 conferences, which were selected following a rigorous examination. This involved the thorough review of more than 95,378 scientific documents published over the last three years by a distinguished group of 6,160 leading scientists specializing in Electronics and Electrical Engineering. Each step of the selection and evaluation process reflects a high standard of scholarly integrity and analytical complexity undertaken by domain experts.

To ensure full transparency and further bolster the credibility of this ranking, detailed information on the methodologies applied to compute the ranking scores is available for review on our Methodology Page.

Papers citation over time

A key indicator for each conference is its effectiveness in reaching other researchers with the papers published at that venue.

The chart below presents the interquartile range (first quartile 25%, median 50% and third quartile 75%) of the number of citations of articles over time.

The top authors publishing at Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (based on the number of publications) are:

  • Sorin Cristoloveanu (37 papers) published 1 paper at the last edition, 3 less than at the previous edition,
  • Joao Antonio Martino (30 papers) published 3 papers at the last edition, 3 less than at the previous edition,
  • Francisco Gamiz (25 papers) published 1 paper at the last edition the same number as at the previous edition,
  • Eddy Simoen (24 papers) published 4 papers at the last edition, 1 more than at the previous edition,
  • Gerard Ghibaudo (22 papers) published 2 papers at the last edition, 1 less than at the previous edition.

The overall trend for top authors publishing at this conference is outlined below. The chart shows the number of publications at each edition of the conference for top authors.

Only papers with recognized affiliations are considered

The top affiliations publishing at Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (based on the number of publications) are:

  • University of Grenoble (62 papers) published 6 papers at the last edition, 2 less than at the previous edition,
  • STMicroelectronics (48 papers) published 6 papers at the last edition, 2 more than at the previous edition,
  • Katholieke Universiteit Leuven (34 papers) published 4 papers at the last edition, 1 less than at the previous edition,
  • University of São Paulo (33 papers) published 4 papers at the last edition, 2 less than at the previous edition,
  • University of Granada (27 papers) published 1 paper at the last edition, 1 less than at the previous edition.

The overall trend for top affiliations publishing at this conference is outlined below. The chart shows the number of publications at each edition of the conference for top affiliations.

Publication chance based on affiliation

The publication chance index shows the ratio of articles published by the best research institutions at the conference edition to all articles published within that conference. The best research institutions were selected based on the largest number of articles published during all editions of the conference.

The chart below presents the percentage ratio of articles from top institutions (based on their ranking of total papers).Top affiliations were grouped by their rank into the following tiers: top 1-10, top 11-20, top 21-50, and top 51+. Only articles with a recognized affiliation are considered.

During the most recent 2021 edition, 7.69% of publications had an unrecognized affiliation. Out of the publications with recognized affiliations, 58.33% were posted by at least one author from the top 10 institutions publishing at the conference. Another 22.92% included authors affiliated with research institutions from the top 11-20 affiliations. Institutions from the 21-50 range included 8.33% of all publications and 10.42% were from other institutions.

Returning Authors Index

A very common phenomenon observed among researchers publishing scientific articles is the intentional selection of conferences they have already attended in the past. In particular, it is worth analyzing the case when the authors participate in the same conference from year to year.

The Returning Authors Index presented below illustrates the ratio of authors who participated in both a given as well as the previous edition of the conference in relation to all participants in a given year.

Returning Institution Index

The graph below shows the Returning Institution Index, illustrating the ratio of institutions that participated in both a given and the previous edition of the conference in relation to all affiliations present in a given year.

The experience to innovation index

Our experience to innovation index was created to show a cross-section of the experience level of authors publishing at a conference. The index includes the authors publishing at the last edition of a conference, grouped by total number of publications throughout their academic career (P) and the total number of citations of these publications ever received (C).

The group intervals were selected empirically to best show the diversity of the authors' experiences, their labels were selected as a convenience, not as judgment. The authors were divided into the following groups:

  • Novice - P < 5 or C < 25 (the number of publications less than 5 or the number of citations less than 25),
  • Competent - P < 10 or C < 100 (the number of publications less than 10 or the number of citations less than 100),
  • Experienced - P < 25 or C < 625 (the number of publications less than 25 or the number of citations less than 625),
  • Master - P < 50 or C < 2500 (the number of publications less than 50 or the number of citations less than 2500),
  • Star - P ≥ 50 and C ≥ 2500 (both the number of publications greater than 50 and the number of citations greater than 2500).

The chart below illustrates experience levels of first authors in cases of publications with multiple authors.

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Best Scientists who published in this Conference