The chart shows the distribution of publications by all Research.com ranked scientists in the field of Engineering and Technology in 2026. The highlighted bar marks where Ronald M. Gilgenbach sits on this spectrum.
This scientist: 720 publications — 98th percentile
98% of scientists in this discipline score the same or lower.
The last bar groups every scientist with 804 publications or more.
The chart shows the D-index (discipline H-index) distribution of Engineering and Technology scientists ranked by Research.com in 2026. The highlighted bar marks where Ronald M. Gilgenbach sits on this spectrum.
This scientist: 40 D-Index — 27th percentile
27% of scientists in this discipline score the same or lower.
The last bar groups every scientist with 107 D-Index or more.
Ronald M. Gilgenbach is affiliated with the University of Michigan-Ann Arbor in the United States. Their research spans multiple disciplines within engineering and physics, with a focus on vacuum electronics and plasma science.
The main fields of study for Ronald M. Gilgenbach include:
Subfields of interest cover:
Key topics in their research work are:
Their frequent coauthors include:
Publications are often featured in journals and conferences such as:
Some recent papers by Ronald M. Gilgenbach include:
Ronald M. Gilgenbach has received recognition including:
R. A. Kishek;Y. Y. Lau;L. K. Ang;A. Valfells
S. Bhattacharjee;J.H. Booske;C.L. Kory;D.W. van der Weide
J. W. Luginsland;Y. Y. Lau;R. M. Gilgenbach
A. A. Kim;M. G. Mazarakis;V. A. Sinebryukhov;B. M. Kovalchuk
R. M. Gilgenbach;M. E. Read;K. E. Hackett;R. Lucey
Lay-Kee Ang;Y.Y. Lau;R.A. Kishek;R.M. Gilgenbach
Herman Bosman;Y. Y. Lau;R. M. Gilgenbach
Michael G Mazarakis;William E Fowler;K L LeChien;Finis W Long
Nicholas M. Jordan;Y. Y. Lau;David M. French;R. M. Gilgenbach
A. Valfells;L. K. Ang;Y. Y. Lau;R. M. Gilgenbach
Ronald M. Gilgenbach;Peter L. G. Ventzek
R M Gilgenbach;R F Lucey;K E Hackett;K E Burrell
M. C. Jones;V. B. Neculaes;Y. Y. Lau;R. M. Gilgenbach
Y. Y. Lau;J. C. Zier;I. M. Rittersdorf;M. R. Weis
Jeffrey A. Sell;David M. Heffelfinger;Peter L. G. Ventzek;Ronald M. Gilgenbach
R. D. McBride;W. A. Stygar;M. E. Cuneo;D. B. Sinars
C. L. Enloe;Ronald M. Gilgenbach;J. S. Meachum
L. K. Ang;Y. Y. Lau;R. M. Gilgenbach;H. L. Spindler
Peng Zhang;Y. Y. Lau;Matthew Franzi;R. M. Gilgenbach
Thomas A. Spencer;Ronald M. Gilgenbach;Jin J. Choi
V. B. Neculaes;R. M. Gilgenbach;Y. Y. Lau
Peter L. G. Ventzek;Ronald M. Gilgenbach;Jeffrey A. Sell;David M. Heffelfinger
Y.Y. Lau;R.A. Kishek;L.K. Ang;R.M. Gilgenbach
David M. French;Nicholas M. Jordan;Y.Y. Lau;R.M. Gilgenbach
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