World's Best Scientists 2026 revealed!

D-Index & Metrics

Engineering and Technology

D-Index
45
Citations
9304
World Ranking
5403
National Ranking
1512

Research.com Recognitions

  • 1994 - Fellow of the American Statistical Association (ASA)

Overview

Raghu N. Kacker is affiliated with the National Institute of Standards and Technology in the United States. Their research primarily focuses on computer science, with specific work spanning software, artificial intelligence, statistics, probability and uncertainty, computer networks and communications, and signal processing.

The scientist has contributed extensively to topics including software testing and debugging techniques, software reliability and analysis research, scientific measurement and uncertainty evaluation, sensor technology and measurement systems, advanced malware detection techniques, software engineering research, and radiation effects in electronics.

Frequent coauthors collaborating with Kacker include D. Richard Kuhn, Yu Lei, M S Raunak, Dimitris E. Simos, and Laura Freeman.

Publications have appeared often in venues such as Computer, IEEE Reliability Magazine, Empirical Software Engineering, Mathematics in Computer Science, and Measurement Sensors.

Noteworthy papers by the scientist and collaborators include:

  • How does combinatorial testing perform in the real world: an empirical study, 2020, Empirical Software Engineering
  • Input Space Coverage Matters, 2020, Computer
  • True value, error, and measurement uncertainty: two views, 2022, Accreditation and Quality Assurance
  • An exploration of combinatorial testing-based approaches to fault localization for explainable AI, 2021, Annals of Mathematics and Artificial Intelligence
  • On quantity, value, unit, and other terms in the JCGM International Vocabulary of Metrology, 2021, Measurement Science and Technology

Raghu N. Kacker was recognized as a Fellow of the American Statistical Association in 1994.

Best Publications

  • Taguchi's parameter design: a panel discussion

    Bovas Abraham;Jock MacKay;George Box;Raghu N. Kacker

  • Uncertainties in Scaling Factors for ab Initio Vibrational Frequencies

    Karl K. Irikura;Russell D. Johnson;Raghu N. Kacker

  • IPOG: A General Strategy for T-Way Software Testing

    Yu Lei;R. Kacker;D.R. Kuhn;V. Okun

  • Performance Measures Independent of Adjustment: An Explanation and Extension of Taguchi's Signal-to-Noise Ratios

    Ramón V. León;Anne C. Shoemaker;Raghu N. Kacker

  • IPOG-IPOG-D: efficient test generation for multi-way combinatorial testing

    Yu Lei;Raghu Kacker;D. Richard Kuhn;Vadim Okun

  • Performance measures independent of adjustment

    Ramón V. León;Anne C. Shoemaker;Raghu N. Kacker

  • Introduction to Combinatorial Testing

    D. Richard Kuhn;Raghu N. Kacker;Yu Lei

  • Practical Combinatorial Testing: Beyond Pairwise

    R. Kuhn;Yu Lei;R. Kacker

  • Taguchi's Orthogonal Arrays Are Classical Designs of Experiments.

    Raghu N Kacker;Eric S Lagergren;James J Filliben

  • IPOG/IPOG‐D: efficient test generation for multi‐way combinatorial testing

    Unknown

  • Practical Combinatorial Testing

    David R. Kuhn;Raghu N. Kacker;Yu Lei

  • ACTS: A Combinatorial Test Generation Tool

    Linbin Yu;Yu Lei;Raghu N. Kacker;D. Richard Kuhn

  • Refining the In-Parameter-Order Strategy for Constructing Covering Arrays

    Michael A Forbes;Michael A Forbes;Jim Lawrence;Jim Lawrence;Yu Lei;Raghu N. Kacker

  • Combinatorial Software Testing

    R. Kuhn;R. Kacker;Yu Lei;J. Hunter

  • Evolution of modern approaches to express uncertainty in measurement

    Raghu Kacker;Klaus-Dieter Sommer;Rüdiger Kessel

  • SP 800-142. Practical Combinatorial Testing

    D. Richard Kuhn;Raghu N. Kacker;Yu Lei

  • Combinatorial Methods for Event Sequence Testing

    D. RIchard Kuhn;James M. Higdon;James F. Lawrence;Raghu N. Kacker

  • Uncertainties in scaling factors for ab initio vibrational zero-point energies

    Karl K. Irikura;Russell D. Johnson;Raghu N. Kacker;Ruediger Kessel

  • An Efficient Algorithm for Constraint Handling in Combinatorial Test Generation

    Linbin Yu;Yu Lei;Mehra Nourozborazjany;Raghu N. Kacker

  • Scaling Factors and Uncertainties for ab Initio Anharmonic Vibrational Frequencies

    Russell D. Johnson;Karl K. Irikura;Raghu N. Kacker;Ruediger Kessel

  • Combinatorial Testing of ACTS: A Case Study

    Mehra N. Borazjany;Linbin Yu;Yu Lei;Raghu Kacker

  • Combinatorial Testing: Theory and Practice

    D. Richard Kuhn;Renée C. Bryce;Feng Duan;Laleh Shikh Gholamhossein Ghandehari

  • Anharmonic Vibrational Frequency Calculations Are Not Worthwhile for Small Basis Sets.

    Ruth L. Jacobsen;Russell D. Johnson;Karl K. Irikura;Raghu N. Kacker

  • A Survey of Binary Covering Arrays

    Jim Lawrence;Raghu N. Kacker;Yu Lei;D. Richard Kuhn

  • Taguchi's Fixed-Element Arrays are Fractional Factorials

    Raghu N. Kacker;Eric S. Lagergren;James J. Filliben

  • Combinatorial Methods for Event Sequence Testing

    David R. Kuhn;James M. Higdon;James F. Lawrence;Raghu N. Kacker

  • Combinatorial Testing of ACTS: A Case Study

    Mehra N. Borazjany;Linbin Yu;Yu Lei;Raghu N. Kacker

Frequent Co-Authors

D. Richard Kuhn
D. Richard Kuhn National Institute of Standards and Technology
Yu Lei
Yu Lei The University of Texas at Arlington
Joseph JaJa
Joseph JaJa University of Maryland, College Park
Tao Xie
Tao Xie Peking University
W. Eric Wong
W. Eric Wong The University of Texas at Dallas
Ram D. Sriram
Ram D. Sriram National Institute of Standards and Technology
Kishor S. Trivedi
Kishor S. Trivedi Duke University
Changyong Cao
Changyong Cao National Oceanic and Atmospheric Administration
Kwok-Leung Tsui
Kwok-Leung Tsui Virginia Tech
Ellen D. Williams
Ellen D. Williams University of Maryland, College Park

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