World's Best Scientists 2026 revealed!

D-Index & Metrics

Computer Science

D-Index
30
Citations
4131
World Ranking
14060
National Ranking
5576

Pieter Peers publication distribution in Computer Science in 2026

The chart shows the distribution of publications by all Research.com ranked scientists in the field of Computer Science in 2026. The highlighted bar marks where Pieter Peers sits on this spectrum.

32–41 publications: 7 scientists 42–51 publications: 22 scientists 52–61 publications: 82 scientists 62–71 publications: 134 scientists 72–81 publications: 249 scientists 82–91 publications: 324 scientists 92–101 publications: 421 scientists 102–111 publications: 420 scientists 112–121 publications: 497 scientists 122–131 publications: 544 scientists 132–141 publications: 555 scientists 142–151 publications: 609 scientists 152–161 publications: 559 scientists 162–171 publications: 534 scientists 172–181 publications: 556 scientists 182–191 publications: 583 scientists 192–201 publications: 519 scientists 202–211 publications: 508 scientists 212–221 publications: 490 scientists 222–231 publications: 437 scientists 232–241 publications: 423 scientists 242–251 publications: 408 scientists 252–261 publications: 377 scientists 262–271 publications: 301 scientists 272–281 publications: 335 scientists 282–291 publications: 320 scientists 292–301 publications: 293 scientists 302–311 publications: 250 scientists 312–321 publications: 238 scientists 322–331 publications: 206 scientists 332–341 publications: 209 scientists 342–351 publications: 208 scientists 352–361 publications: 162 scientists 362–371 publications: 176 scientists 372–381 publications: 127 scientists 382–391 publications: 158 scientists 392–401 publications: 128 scientists 402–411 publications: 104 scientists 412–421 publications: 94 scientists 422–431 publications: 99 scientists 432–441 publications: 83 scientists 442–451 publications: 108 scientists 452–461 publications: 73 scientists 462–471 publications: 77 scientists 472–481 publications: 69 scientists 482–491 publications: 84 scientists 492–501 publications: 62 scientists 502–511 publications: 54 scientists 512–521 publications: 57 scientists 522–531 publications: 51 scientists 532–541 publications: 51 scientists 542–551 publications: 32 scientists 552–561 publications: 38 scientists 562–571 publications: 28 scientists 572–581 publications: 43 scientists 582–591 publications: 33 scientists 592–601 publications: 41 scientists 602–611 publications: 32 scientists 612–621 publications: 28 scientists 622–631 publications: 25 scientists 632–641 publications: 27 scientists 642–651 publications: 17 scientists 652–661 publications: 20 scientists 662–671 publications: 17 scientists 672–681 publications: 15 scientists 682–691 publications: 14 scientists 692–701 publications: 21 scientists 702–711 publications: 13 scientists 712–721 publications: 12 scientists 722–731 publications: 19 scientists 732–741 publications: 14 scientists 742–751 publications: 12 scientists 752–761 publications: 10 scientists 762–771 publications: 10 scientists 772–781 publications: 11 scientists 782–791 publications: 10 scientists 792–801 publications: 11 scientists 802–811 publications: 8 scientists 812–821 publications: 8 scientists 822–831 publications: 7 scientists 832–841 publications: 11 scientists 842–851 publications: 10 scientists 852–861 publications: 5 scientists 862–871 publications: 9 scientists 872–881 publications: 4 scientists 882–891 publications: 6 scientists 892–901 publications: 3 scientists 902–911 publications: 6 scientists 912–921 publications: 3 scientists 922–931 publications: 2 scientists 932–941 publications: 2 scientists 942–951 publications: 2 scientists 952–961 publications: 3 scientists 962–971 publications: 3 scientists 972–981 publications: 3 scientists 982–990 publications: 5 scientists 991+ publications: 100 scientists
32 publications 991+

This scientist: 79 publications — 3rd percentile

3% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 991 publications or more.

Pieter Peers D-index placement in Computer Science in 2026

The chart shows the D-index (discipline H-index) distribution of Computer Science scientists ranked by Research.com in 2026. The highlighted bar marks where Pieter Peers sits on this spectrum.

30–31 D-Index: 879 scientists 32–33 D-Index: 983 scientists 34–35 D-Index: 918 scientists 36–37 D-Index: 990 scientists 38–39 D-Index: 968 scientists 40–41 D-Index: 907 scientists 42–43 D-Index: 821 scientists 44–45 D-Index: 763 scientists 46–47 D-Index: 689 scientists 48–49 D-Index: 543 scientists 50–51 D-Index: 543 scientists 52–53 D-Index: 518 scientists 54–55 D-Index: 500 scientists 56–57 D-Index: 458 scientists 58–59 D-Index: 400 scientists 60–61 D-Index: 337 scientists 62–63 D-Index: 308 scientists 64–65 D-Index: 292 scientists 66–67 D-Index: 249 scientists 68–69 D-Index: 213 scientists 70–71 D-Index: 192 scientists 72–73 D-Index: 189 scientists 74–75 D-Index: 165 scientists 76–77 D-Index: 139 scientists 78–79 D-Index: 119 scientists 80–81 D-Index: 121 scientists 82–83 D-Index: 113 scientists 84–85 D-Index: 88 scientists 86–87 D-Index: 87 scientists 88–89 D-Index: 75 scientists 90–91 D-Index: 69 scientists 92–93 D-Index: 57 scientists 94–95 D-Index: 46 scientists 96–97 D-Index: 38 scientists 98–99 D-Index: 34 scientists 100–101 D-Index: 36 scientists 102–103 D-Index: 27 scientists 104–105 D-Index: 37 scientists 106–107 D-Index: 18 scientists 108–109 D-Index: 31 scientists 110–111 D-Index: 19 scientists 112–113 D-Index: 16 scientists 114–115 D-Index: 12 scientists 116–117 D-Index: 20 scientists 118–119 D-Index: 15 scientists 120–121 D-Index: 5 scientists 122–123 D-Index: 20 scientists 124–125 D-Index: 8 scientists 126–127 D-Index: 5 scientists 128–129 D-Index: 7 scientists 130 D-Index: 3 scientists 131+ D-Index: 98 scientists
30 D-Index 131+

This scientist: 30 D-Index — 3rd percentile

3% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 131 D-Index or more.

Overview

Pieter Peers is affiliated with William & Mary in the United States and has contributed to the field of computer science with a focus on computer vision, computer graphics, and related interdisciplinary areas. Their research output spans a range of topics including advanced vision and imaging, computer graphics and visualization techniques, and image enhancement methodologies.

The scientist's recent publications include the following works:

  • "Glass Segmentation using Intensity and Spectral Polarization Cues," 2022, 2022 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR)
  • "Deferred neural lighting," 2020, ACM Transactions on Graphics
  • "An Adaptive BRDF Fitting Metric," 2020, Computer Graphics Forum
  • "Deep Reflectance Scanning: Recovering Spatially-varying Material Appearance from a Flash-lit Video Sequence," 2021, Computer Graphics Forum
  • "Deep Separation of Direct and Global Components from a Single Photograph under Structured Lighting," 2020, Computer Graphics Forum

The major publication venues that feature Pieter Peers' work are:

  • arXiv (Cornell University)
  • Computer Graphics Forum
  • ACM Transactions on Graphics
  • 2022 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR)
  • IEEE Transactions on Visualization and Computer Graphics

The scientist frequently collaborates with several co-authors, including:

  • Bo Dong
  • Felix Heide
  • Xiaopeng Wei
  • Xin Yang
  • Yue Dong

Pieter Peers' publication record reflects an interdisciplinary approach within computer science, with noticeable contributions in the following subfields:

  • Computer Vision and Pattern Recognition
  • Computer Graphics and Computer-Aided Design
  • Cognitive Neuroscience
  • Industrial and Manufacturing Engineering
  • Atomic and Molecular Physics, and Optics

The research topics covered by their work include:

  • Computer Graphics and Visualization Techniques
  • Advanced Vision and Imaging
  • Image Enhancement Techniques
  • Advanced Image and Video Retrieval Techniques
  • Face Recognition and Analysis
  • Industrial Vision Systems and Defect Detection
  • Color Science and Applications

Best Publications

  • Rapid acquisition of specular and diffuse normal maps from polarized spherical gradient illumination

    Wan-Chun Ma;Tim Hawkins;Pieter Peers;Charles-Felix Chabert

  • Dynamic shape capture using multi-view photometric stereo

    Daniel Vlasic;Pieter Peers;Ilya Baran;Paul Debevec

  • Relighting with 4D incident light fields

    Vincent Masselus;Pieter Peers;Philip Dutré;Yves D. Willems

  • Compressive light transport sensing

    Pieter Peers;Dhruv K. Mahajan;Bruce Lamond;Abhijeet Ghosh

  • Fabricating microgeometry for custom surface reflectance

    Tim Weyrich;Pieter Peers;Wojciech Matusik;Szymon Rusinkiewicz

  • Facial performance synthesis using deformation-driven polynomial displacement maps

    Wan-Chun Ma;Andrew Jones;Jen-Yuan Chiang;Tim Hawkins

  • Modeling surface appearance from a single photograph using self-augmented convolutional neural networks

    Xiao Li;Yue Dong;Pieter Peers;Xin Tong

  • Deep inverse rendering for high-resolution SVBRDF estimation from an arbitrary number of images

    Duan Gao;Xiao Li;Yue Dong;Pieter Peers

  • Practical modeling and acquisition of layered facial reflectance

    Abhijeet Ghosh;Tim Hawkins;Pieter Peers;Sune Frederiksen

  • SubEdit: a representation for editing measured heterogeneous subsurface scattering

    Ying Song;Xin Tong;Fabio Pellacini;Pieter Peers

  • Temporally coherent completion of dynamic shapes

    Hao Li;Linjie Luo;Daniel Vlasic;Pieter Peers

  • Estimating specular roughness and anisotropy from second order spherical gradient illumination

    Abhijeet Ghosh;Tongbo Chen;Pieter Peers;Cyrus A. Wilson

  • A compact factored representation of heterogeneous subsurface scattering

    Pieter Peers;Karl vom Berge;Wojciech Matusik;Ravi Ramamoorthi

  • Wavelet environment matting

    Pieter Peers;Philip Dutré

  • Appearance-from-motion: recovering spatially varying surface reflectance under unknown lighting

    Yue Dong;Guojun Chen;Pieter Peers;Jiawan Zhang

  • Content-adaptive image downscaling

    Johannes Kopf;Ariel Shamir;Pieter Peers

  • Circularly polarized spherical illumination reflectometry

    Abhijeet Ghosh;Tongbo Chen;Pieter Peers;Cyrus A. Wilson

  • Post-production facial performance relighting using reflectance transfer

    Pieter Peers;Naoki Tamura;Wojciech Matusik;Paul Debevec

  • Mobile Surface Reflectometry

    J. Riviere;P. Peers;A. Ghosh

  • Illumination sphere with intelligent led lighting units in scalable daisy chain with interchangeable filters

    Paul E. Debevec;Xueming Yu;Mark Bolas;Graham Fyffe

Frequent Co-Authors

Paul Debevec
Paul Debevec Google (United States)
Xin Tong
Xin Tong Microsoft Research Asia (China)
Philip Dutré
Philip Dutré KU Leuven
Szymon Rusinkiewicz
Szymon Rusinkiewicz Princeton University
Jovan Popović
Jovan Popović Adobe Systems (United States)
Ravi Ramamoorthi
Ravi Ramamoorthi University of California, San Diego
Mark Bolas
Mark Bolas Microsoft (United States)
Westley Weimer
Westley Weimer University of Michigan–Ann Arbor
Wojciech Jarosz
Wojciech Jarosz Dartmouth College

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