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D-Index & Metrics

Electronics and Electrical Engineering

D-Index
40
Citations
9136
World Ranking
4413
National Ranking
128

Peter Russer publication distribution in Electronics and Electrical Engineering in 2026

The chart shows the distribution of publications by all Research.com ranked scientists in the field of Electronics and Electrical Engineering in 2026. The highlighted bar marks where Peter Russer sits on this spectrum.

34–53 publications: 24 scientists 54–73 publications: 52 scientists 74–93 publications: 114 scientists 94–113 publications: 203 scientists 114–133 publications: 269 scientists 134–153 publications: 355 scientists 154–173 publications: 403 scientists 174–193 publications: 445 scientists 194–213 publications: 430 scientists 214–233 publications: 431 scientists 234–253 publications: 399 scientists 254–273 publications: 366 scientists 274–293 publications: 335 scientists 294–313 publications: 300 scientists 314–333 publications: 276 scientists 334–353 publications: 250 scientists 354–373 publications: 214 scientists 374–393 publications: 187 scientists 394–413 publications: 152 scientists 414–433 publications: 169 scientists 434–453 publications: 147 scientists 454–473 publications: 111 scientists 474–493 publications: 117 scientists 494–513 publications: 103 scientists 514–533 publications: 99 scientists 534–553 publications: 92 scientists 554–573 publications: 75 scientists 574–593 publications: 58 scientists 594–613 publications: 69 scientists 614–633 publications: 50 scientists 634–653 publications: 62 scientists 654–673 publications: 54 scientists 674–693 publications: 44 scientists 694–713 publications: 37 scientists 714–733 publications: 28 scientists 734–753 publications: 26 scientists 754–773 publications: 26 scientists 774–793 publications: 19 scientists 794–813 publications: 23 scientists 814–833 publications: 20 scientists 834–853 publications: 16 scientists 854–873 publications: 20 scientists 874–893 publications: 11 scientists 894–913 publications: 11 scientists 914–933 publications: 16 scientists 934–953 publications: 13 scientists 954–973 publications: 10 scientists 974–993 publications: 11 scientists 994–1,013 publications: 9 scientists 1,014–1,033 publications: 9 scientists 1,034–1,053 publications: 10 scientists 1,054–1,064 publications: 6 scientists 1,065+ publications: 99 scientists
34 publications 1,065+

This scientist: 792 publications — 96th percentile

96% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 1,065 publications or more.

Peter Russer D-index placement in Electronics and Electrical Engineering in 2026

The chart shows the D-index (discipline H-index) distribution of Electronics and Electrical Engineering scientists ranked by Research.com in 2026. The highlighted bar marks where Peter Russer sits on this spectrum.

30 D-Index: 178 scientists 31 D-Index: 257 scientists 32 D-Index: 263 scientists 33 D-Index: 262 scientists 34 D-Index: 244 scientists 35 D-Index: 236 scientists 36 D-Index: 211 scientists 37 D-Index: 220 scientists 38 D-Index: 214 scientists 39 D-Index: 214 scientists 40 D-Index: 205 scientists 41 D-Index: 187 scientists 42 D-Index: 194 scientists 43 D-Index: 201 scientists 44 D-Index: 155 scientists 45 D-Index: 189 scientists 46 D-Index: 148 scientists 47 D-Index: 160 scientists 48 D-Index: 134 scientists 49 D-Index: 130 scientists 50 D-Index: 141 scientists 51 D-Index: 156 scientists 52 D-Index: 108 scientists 53 D-Index: 130 scientists 54 D-Index: 112 scientists 55 D-Index: 97 scientists 56 D-Index: 111 scientists 57 D-Index: 102 scientists 58 D-Index: 108 scientists 59 D-Index: 120 scientists 60 D-Index: 103 scientists 61 D-Index: 93 scientists 62 D-Index: 92 scientists 63 D-Index: 74 scientists 64 D-Index: 77 scientists 65 D-Index: 73 scientists 66 D-Index: 64 scientists 67 D-Index: 69 scientists 68 D-Index: 60 scientists 69 D-Index: 39 scientists 70 D-Index: 57 scientists 71 D-Index: 59 scientists 72 D-Index: 46 scientists 73 D-Index: 49 scientists 74 D-Index: 38 scientists 75 D-Index: 35 scientists 76 D-Index: 32 scientists 77 D-Index: 35 scientists 78 D-Index: 31 scientists 79 D-Index: 22 scientists 80 D-Index: 34 scientists 81 D-Index: 31 scientists 82 D-Index: 34 scientists 83 D-Index: 23 scientists 84 D-Index: 18 scientists 85 D-Index: 30 scientists 86 D-Index: 19 scientists 87 D-Index: 19 scientists 88 D-Index: 20 scientists 89 D-Index: 8 scientists 90 D-Index: 17 scientists 91 D-Index: 7 scientists 92 D-Index: 14 scientists 93 D-Index: 9 scientists 94 D-Index: 15 scientists 95 D-Index: 10 scientists 96 D-Index: 12 scientists 97 D-Index: 10 scientists 98 D-Index: 10 scientists 99 D-Index: 12 scientists 100 D-Index: 16 scientists 101 D-Index: 5 scientists 102 D-Index: 7 scientists 103 D-Index: 7 scientists 104 D-Index: 8 scientists 105 D-Index: 9 scientists 106 D-Index: 13 scientists 107 D-Index: 4 scientists 108 D-Index: 5 scientists 109 D-Index: 10 scientists 110 D-Index: 8 scientists 111+ D-Index: 96 scientists
30 D-Index 111+

This scientist: 40 D-Index — 36th percentile

36% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 111 D-Index or more.

Research.com Recognitions

  • 1994 - IEEE Fellow For fundamental contributions to noise analysis and low-noise optimization of linear electronic circuits with general topology.

Overview

Peter Russer is affiliated with the Technical University of Munich in Germany. Their research primarily lies at the intersection of engineering and physics, focusing on electrical and electronic engineering, atomic and molecular physics, optics, and related subfields.

The main research topics covered by their work include:

  • Quantum Information and Cryptography
  • Quantum and Electron Transport Phenomena
  • Mechanical and Optical Resonators
  • Electromagnetic Compatibility and Measurements
  • Electromagnetic Compatibility and Noise Suppression
  • Microwave and Dielectric Measurement Techniques
  • Radiation Effects in Electronics

Peter Russer has contributed to several peer-reviewed publications in notable scientific venues. Selected recent papers include:

  • "Circuit quantum electrodynamic model of dissipative-dispersive Josephson traveling-wave parametric amplifiers," published in 2023 in Physical Review A.
  • "Cyclostationary Characterization of Radiated Emissions in Digital Electronic Devices," 2020, IEEE Electromagnetic Compatibility Magazine.
  • "Circuit quantum electrodynamic model of dissipative-dispersive Josephson traveling-wave parametric amplifiers," 2022, arXiv (Cornell University).
  • "IEEE P2718 Working Group Activity: Open Source Code Development for the Characterization of Unintentional Stochastic Radiators," 2024, IEEE Electromagnetic Compatibility Magazine.

Consistent venues for publication include:

  • IEEE Electromagnetic Compatibility Magazine
  • Physical Review A
  • arXiv (Cornell University)

Collaboration is a component of their research activity. Frequent co-authors of Peter Russer are:

  • Johannes A. Russer
  • Michael Haider
  • Christian Jirauschek
  • Yongjie Yuan
  • Yury Kuznetsov

Peter Russer's academic profile includes a recognition as an IEEE Fellow, awarded in 1994 for fundamental contributions to noise analysis and low-noise optimization of linear electronic circuits with general topology.

Best Publications

  • An efficient method for computer aided noise analysis of linear amplifier networks

    H. Hillbrand;P. Russer

  • Influence of Microwave Radiation on Current‐Voltage Characteristic of Superconducting Weak Links

    P. Russer

  • Electromagnetics, Microwave Circuit, and Antenna Design for Communications Engineering

    P. Russer

  • A field theoretical derivation of TLM

    M. Krumpholz;P. Russer

  • Signal processing for wideband smart antenna array applications

    Tuan-Do-Hong;P. Russer

  • Si and SiGe millimeter-wave integrated circuits

    P. Russer

  • Minimizing the Noise Penalty Due to Mutual Coupling for a Receiving Array

    K.F. Warnick;B. Woestenburg;L. Belostotski;P. Russer

  • Full-wave modeling and automatic equivalent-circuit generation of millimeter-wave planar and multilayer structures

    T. Mangold;P. Russer

  • Low-noise fiber-optic rotation sensing

    K Böhm;P Russer;E Weidel;R Ulrich

  • High-order FDTD and auxiliary differential equation formulation of optical pulse propagation in 2-D Kerr and Raman nonlinear dispersive media

    M. Fujii;M. Tahara;I. Sakagami;W. Freude

  • Silicon High Resistivity Substrate Millimeter-Wave Technology

    J. Buechler;E. Kasper;P. Russer;K.M. Strohm

  • High Q coplanar transmission line resonator of YBa2Cu3O7−x on MgO

    A. A. Valenzuela;P. Russer

  • The time-domain electromagnetic interference measurement system

    F. Krug;P. Russer

  • Modeling of Noisy EM Field Propagation Using Correlation Information

    Johannes A. Russer;Peter Russer

  • A Real-Time Time-Domain EMI Measurement System for Full-Compliance Measurements According to CISPR 16-1-1

    S. Braun;T. Donauer;P. Russer

  • The Transmission Line Matrix Method

    Peter Russer

  • Theoretical and experimental investigation of adaptive antenna impedance matching for multiband mobile phone applications

    Libo Huang;Werner L. Schroeder;Peter Russer

  • Silicon-based millimeter-wave devices

    Johann-Friedrich Luy;Peter Russer

  • Electromagnetic Field Computation by Network Methods

    Leopold B. Felsen;Mauro Mongiardo;Peter Russer

  • A 3-D Isotropic Left-Handed Metamaterial Based on the Rotated Transmission-Line Matrix (TLM) Scheme

    M. Zedler;C. Caloz;P. Russer

Frequent Co-Authors

Paolo Lugli
Paolo Lugli Free University of Bozen-Bolzano
Robert Weigel
Robert Weigel University of Erlangen-Nuremberg
Andreas C. Cangellaris
Andreas C. Cangellaris University of Illinois at Urbana-Champaign
Wolfgang Porod
Wolfgang Porod University of Notre Dame
Roberto Sorrentino
Roberto Sorrentino RF Microtech srl
David W. P. Thomas
David W. P. Thomas University of Nottingham
Alessandra Costanzo
Alessandra Costanzo University of Bologna
Wenquan Che
Wenquan Che South China University of Technology
Christos Christopoulos
Christos Christopoulos University of Nottingham

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