World's Best Scientists 2026 revealed!

D-Index & Metrics

Plant Science and Agronomy

D-Index
32
Citations
8668
World Ranking
5815
National Ranking
1402

Best Publications

  • A gene in the multidrug and toxic compound extrusion (MATE) family confers aluminum tolerance in sorghum.

    Jurandir V Magalhaes;Jiping Liu;Claudia T Guimarães;Ubiraci G P Lana

  • AtALMT1, which encodes a malate transporter, is identified as one of several genes critical for aluminum tolerance in Arabidopsis

    Owen A. Hoekenga;Lyza G. Maron;Miguel A. Piñeros;Geraldo M. A. Cançado;Geraldo M. A. Cançado

  • Aluminum-activated citrate and malate transporters from the MATE and ALMT families function independently to confer Arabidopsis aluminum tolerance.

    Jiping Liu;Jurandir V. Magalhaes;Jon Shaff;Leon V. Kochian

  • Three-Dimensional Root Phenotyping with a Novel Imaging and Software Platform

    Randy T. Clark;Robert B. MacCurdy;Janelle K. Jung;Jon E. Shaff

  • Studies of the Uptake of Nitrate in Barley : IV. Electrophysiology.

    Anthony D. M. Glass;Jon E. Shaff;Leon V. Kochian

  • Two functionally distinct members of the MATE (multi-drug and toxic compound extrusion) family of transporters potentially underlie two major aluminum tolerance QTLs in maize.

    Lyza G. Maron;Miguel A. Piñeros;Claudia T. Guimarães;Jurandir V. Magalhaes

  • Phosphorus and Aluminum Interactions in Soybean in Relation to Aluminum Tolerance. Exudation of Specific Organic Acids from Different Regions of the Intact Root System

    Hong Liao;Huiyan Wan;Jon Shaff;Xiurong Wang

  • Low pH, Aluminum, and Phosphorus Coordinately Regulate Malate Exudation through GmALMT1 to Improve Soybean Adaptation to Acid Soils

    Cuiyue Liang;Miguel A. Piñeros;Jiang Tian;Zhufang Yao

  • Development of a Novel Aluminum Tolerance Phenotyping Platform Used for Comparisons of Cereal Aluminum Tolerance and Investigations into Rice Aluminum Tolerance Mechanisms

    Adam Famoso;Randy Clark;Jon Shaff;Eric Craft

  • GEOCHEM-EZ: a chemical speciation program with greater power and flexibility

    Jon E. Shaff;Benjamin A. Schultz;Eric J. Craft;Randy T. Clark

  • High‐throughput two‐dimensional root system phenotyping platform facilitates genetic analysis of root growth and development

    Randy T. Clark;Adam N. Famoso;Keyan Zhao;Jon E. Shaff

  • Aluminum effects on calcium fluxes at the root apex of aluminum-tolerant and aluminum-sensitive wheat cultivars.

    Jianwei W. Huang;Jon E. Shaff;David L. Grunes;Leon V. Kochian

  • Identification and characterization of aluminum tolerance loci in Arabidopsis (Landsberg erecta x Columbia) by quantitative trait locus mapping. A physiologically simple but genetically complex trait.

    Owen A. Hoekenga;Jon E. Shaff;Antonio J. Monforte

  • Evidence for cotransport of nitrate and protons in maize roots : I. Effects of nitrate on the membrane potential.

    Peter R. McClure;Leon V. Kochian;Roger M. Spanswick;Jon E. Shaff

  • Characterization of AtALMT1 expression in aluminum-inducible malate release and its role for rhizotoxic stress tolerance in Arabidopsis.

    Yuriko Kobayashi;Owen A. Hoekenga;Hirotaka Itoh;Midori Nakashima

  • Early Copper-Induced Leakage of K+ from Arabidopsis Seedlings Is Mediated by Ion Channels and Coupled to Citrate Efflux

    Angus S. Murphy;William R. Eisinger;Jon E. Shaff;Leon V. Kochian

  • Aluminum resistance in maize cannot be solely explained by root organic acid exudation. A comparative physiological study

    Miguel A. Piñeros;Jon E. Shaff;Holly S. Manslank;Vera M. Carvalho Alves

  • Mechanisms of Aluminum Tolerance in Wheat: An Investigation of Genotypic Differences in Rhizosphere pH, K+, and H+ Transport, and Root-Cell Membrane Potentials

    Susan C. Miyasaka;Leon V. Kochian;Jon E. Shaff;Charles D. Foy

  • Ammonium Uptake by Rice Roots (III. Electrophysiology)

    Miao Yuan Wang;A. D. M. Glass;J. E. Shaff;L. V. Kochian

  • Development, Characterization, and Application of a Cadmium-Selective Microelectrode for the Measurement of Cadmium Fluxes in Roots of Thlaspi Species and Wheat

    Miguel A. Piñeros;Jon E. Shaff;Leon V. Kochian

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