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Materials Science

D-Index
58
Citations
14835
World Ranking
7592
National Ranking
1884

Research.com Recognitions

  • 2009 - Fellow of the Mineralogical Society of America
  • 1996 - Distinguished Scientist Award, Mineralogical Society of America
  • 1976 - Fellow of American Physical Society (APS) Citation Also approved by the Division of Condensed Matter Physics
  • 1967 - Fellow of John Simon Guggenheim Memorial Foundation

Overview

John Silcox is affiliated with Cornell University in the United States. Over the course of their academic career, Silcox has been recognized with several honors reflecting their contributions to the scientific community.

Among these distinctions are:

  • Fellow of the Mineralogical Society of America (2009)
  • Distinguished Scientist Award, Mineralogical Society of America (1996)
  • Fellow of American Physical Society (APS) (1976) with a citation approved by the Division of Condensed Matter Physics
  • Fellow of John Simon Guggenheim Memorial Foundation (1967)

These awards indicate a longstanding engagement with mineralogical sciences and condensed matter physics, highlighting areas of specialization within physical science disciplines.

The available data does not list specific research papers, coauthors, or publication venues, nor detailed fields of study or topics beyond those implied by the awards. However, the honors from the Mineralogical Society of America and the American Physical Society suggest that Silcox's work involves mineralogy and condensed matter physics.

There is no information on book publications or frequent collaborators provided.

Best Publications

  • Atomic and Electronic Structure of Graphene-Oxide

    K. Andre Mkhoyan;Alexander W. Contryman;John Silcox;Derek A. Stewart

  • Retraction: Non-blinking semiconductor nanocrystals

    Xiaoyong Wang;Xiaofan Ren;Keith Kahen;Megan A. Hahn

  • Non-blinking semiconductor nanocrystals

    Xiaoyong Wang;Xiaofan Ren;Keith Kahen;Megan A. Hahn

  • Atomic-Scale Chemical Imaging of Composition and Bonding by Aberration-Corrected Microscopy

    D. A. Muller;L. Fitting Kourkoutis;M. Murfitt;J. H. Song;J. H. Song

  • Generation of Megawatt Optical Solitons in Hollow-Core Photonic Band-Gap Fibers

    Dimitre G. Ouzounov;Faisal R. Ahmad;Faisal R. Ahmad;Dirk Müller;Dirk Müller;Natesan Venkataraman;Natesan Venkataraman

  • Optical Properties of Colloidal PbSe Nanocrystals

    Hui Du;Chialing Chen;Rishikesh Krishnan;Todd D. Krauss

  • Atomic-Scale Chemical Imaging of Composition and Bonding by Aberration-Corrected Microscopy

    Unknown

  • Simulation of annular dark field stem images using a modified multislice method

    Earl J. Kirkland;Russell F. Loane;John Silcox

  • Thermal vibrations in convergent‐beam electron diffraction

    R. F. Loane;Peirong Xu;J. Silcox

  • Synthesis and characterization of PbSe quantum dots in phosphate glass

    A. Lipovskii;E. Kolobkova;V. Petrikov;I. Kang

  • Mapping sp2 and sp3 states of carbon at sub-nanometre spatial resolution

    David A. Muller;Yujiun Tzou;Rishi Raj;John Silcox

  • Dislocation loops in quenched aluminium

    Unknown

  • Nanofabrication using a stencil mask

    Mandar M. Deshmukh;D. C. Ralph;M. Thomas;J. Silcox

  • Magnetization of Superconducting Nb-25%Zr Wire

    W. A. Fietz;M. R. Beasley;J. Silcox;W. W. Webb

  • Incoherent imaging of zone axis crystals with ADF STEM

    Russell F. Loane;Peirong Xu;John Silcox

  • Connections between the electron-energy-loss spectra, the local electronic structure, and the physical properties of a material: A study of nickel aluminum alloys

    David A. Muller;David A. Muller;David J. Singh;John Silcox

  • Orientation dependence of core edges from anisotropic materials determined by inelastic scattering of fast electrons

    R. D. Leapman;P. L. Fejes;J. Silcox

  • Visibility of Single Heavy Atoms on Thin Crystalline Silicon in Simulated Annular Dark-Field STEM Images

    Russell F. Loane;Earl J. Kirkland;John Silcox

  • Direct observations of the annealing of prismatic dislocation loops and of climb of dislocations in quenched aluminium

    Unknown

  • Study of strain fields at a-Si/c-Si interface

    Zhiheng Yu;David A. Muller;John Silcox

  • Fluorescence efficiency of individual carbon nanotubes.

    Lisa J. Carlson;Sara E. Maccagnano;Ming Zheng;John Silcox

  • Scaling behavior of YBa2Cu3O7−δ thin‐film weak links

    S. E. Russek;D. K. Lathrop;B. H. Moeckly;R. A. Buhrman

  • Annular dark-field imaging: Resolution and thickness effects

    Sean Hillyard;Russell F. Loane;John Silcox

  • Measurement of surface-plasmon dispersion in oxidized aluminum films

    R.B. Pettit;J. Silcox;R. Vincent

Frequent Co-Authors

David A. Muller
David A. Muller Cornell University
Robert A. Buhrman
Robert A. Buhrman Cornell University
Philip E. Batson
Philip E. Batson Rutgers, The State University of New Jersey
Todd D. Krauss
Todd D. Krauss University of Rochester
William J. Schaff
William J. Schaff Cornell University
David N. Seidman
David N. Seidman Northwestern University
Francis J. DiSalvo
Francis J. DiSalvo Cornell University
Alexander L. Gaeta
Alexander L. Gaeta Columbia University
N. W. Ashcroft
N. W. Ashcroft Cornell University
Lester F. Eastman
Lester F. Eastman Cornell University

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Best Scientists Citing John Silcox