2026 John Silcox: Materials Science Researcher – H-Index, Publications & Awards

Discipline name	D-Index	World Ranking	Current World Ranking	National Ranking	Current National Ranking	Publications	Citations
Materials Science	58	7590	7338	1882	1743	241	14835

Discipline name

D-Index

World Ranking

Current World Ranking

National Ranking

Current National Ranking

Publications

Citations

Materials Science

7590

7338

1882

1743

241

14835

John Silcox publication distribution in Materials Science in 2026

The chart shows the distribution of publications by all Research.com ranked scientists in the field of Materials Science in 2026. The highlighted bar marks where John Silcox sits on this spectrum.

50 publications 1,163+

This scientist: 241 publications — 44th percentile

44% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 1,163 publications or more.

John Silcox D-index placement in Materials Science in 2026

The chart shows the D-index (discipline H-index) distribution of Materials Science scientists ranked by Research.com in 2026. The highlighted bar marks where John Silcox sits on this spectrum.

40 D-Index 165+

This scientist: 58 D-Index — 41st percentile

41% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 165 D-Index or more.

Research.com Recognitions

2009 - Fellow of the Mineralogical Society of America
1996 - Distinguished Scientist Award, Mineralogical Society of America
1976 - Fellow of American Physical Society (APS) Citation Also approved by the Division of Condensed Matter Physics
1967 - Fellow of John Simon Guggenheim Memorial Foundation

Overview

John Silcox is affiliated with Cornell University in the United States. Over the course of their academic career, Silcox has been recognized with several honors reflecting their contributions to the scientific community.

Among these distinctions are:

Fellow of the Mineralogical Society of America (2009)
Distinguished Scientist Award, Mineralogical Society of America (1996)
Fellow of American Physical Society (APS) (1976) with a citation approved by the Division of Condensed Matter Physics
Fellow of John Simon Guggenheim Memorial Foundation (1967)

These awards indicate a longstanding engagement with mineralogical sciences and condensed matter physics, highlighting areas of specialization within physical science disciplines.

The available data does not list specific research papers, coauthors, or publication venues, nor detailed fields of study or topics beyond those implied by the awards. However, the honors from the Mineralogical Society of America and the American Physical Society suggest that Silcox's work involves mineralogy and condensed matter physics.

There is no information on book publications or frequent collaborators provided.

Best Publications

Atomic and Electronic Structure of Graphene-Oxide

K. Andre Mkhoyan;Alexander W. Contryman;John Silcox;Derek A. Stewart

1384
Citations
Retraction: Non-blinking semiconductor nanocrystals

Xiaoyong Wang;Xiaofan Ren;Keith Kahen;Megan A. Hahn

796
Citations
Non-blinking semiconductor nanocrystals

Xiaoyong Wang;Xiaofan Ren;Keith Kahen;Megan A. Hahn

783
Citations
Atomic-Scale Chemical Imaging of Composition and Bonding by Aberration-Corrected Microscopy

D. A. Muller;L. Fitting Kourkoutis;M. Murfitt;J. H. Song;J. H. Song

760
Citations
Generation of Megawatt Optical Solitons in Hollow-Core Photonic Band-Gap Fibers

Dimitre G. Ouzounov;Faisal R. Ahmad;Faisal R. Ahmad;Dirk Müller;Dirk Müller;Natesan Venkataraman;Natesan Venkataraman

671
Citations
Optical Properties of Colloidal PbSe Nanocrystals

Hui Du;Chialing Chen;Rishikesh Krishnan;Todd D. Krauss

616
Citations
Atomic-Scale Chemical Imaging of Composition and Bonding by Aberration-Corrected Microscopy

Unknown

466
Citations
Simulation of annular dark field stem images using a modified multislice method

Earl J. Kirkland;Russell F. Loane;John Silcox

425
Citations
Thermal vibrations in convergent‐beam electron diffraction

R. F. Loane;Peirong Xu;J. Silcox

378
Citations
Synthesis and characterization of PbSe quantum dots in phosphate glass

A. Lipovskii;E. Kolobkova;V. Petrikov;I. Kang

323
Citations
Mapping sp2 and sp3 states of carbon at sub-nanometre spatial resolution

David A. Muller;Yujiun Tzou;Rishi Raj;John Silcox

313
Citations
Dislocation loops in quenched aluminium

Unknown

313
Citations
Nanofabrication using a stencil mask

Mandar M. Deshmukh;D. C. Ralph;M. Thomas;J. Silcox

269
Citations
Magnetization of Superconducting Nb-25%Zr Wire

W. A. Fietz;M. R. Beasley;J. Silcox;W. W. Webb

260
Citations
Incoherent imaging of zone axis crystals with ADF STEM

Russell F. Loane;Peirong Xu;John Silcox

255
Citations
Connections between the electron-energy-loss spectra, the local electronic structure, and the physical properties of a material: A study of nickel aluminum alloys

David A. Muller;David A. Muller;David J. Singh;John Silcox

248
Citations
Orientation dependence of core edges from anisotropic materials determined by inelastic scattering of fast electrons

R. D. Leapman;P. L. Fejes;J. Silcox

229
Citations
Visibility of Single Heavy Atoms on Thin Crystalline Silicon in Simulated Annular Dark-Field STEM Images

Russell F. Loane;Earl J. Kirkland;John Silcox

229
Citations
Direct observations of the annealing of prismatic dislocation loops and of climb of dislocations in quenched aluminium

Unknown

220
Citations
Study of strain fields at a-Si/c-Si interface

Zhiheng Yu;David A. Muller;John Silcox

197
Citations
Fluorescence efficiency of individual carbon nanotubes.

Lisa J. Carlson;Sara E. Maccagnano;Ming Zheng;John Silcox

173
Citations
Scaling behavior of YBa2Cu3O7−δ thin‐film weak links

S. E. Russek;D. K. Lathrop;B. H. Moeckly;R. A. Buhrman

173
Citations
Annular dark-field imaging: Resolution and thickness effects

Sean Hillyard;Russell F. Loane;John Silcox

167
Citations
Measurement of surface-plasmon dispersion in oxidized aluminum films

R.B. Pettit;J. Silcox;R. Vincent

154
Citations