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Materials Science

D-Index
43
Citations
7899
World Ranking
12276
National Ranking
2826

Overview

James M. Howe is affiliated with the University of Virginia in the United States and specializes in the fields of Materials Science and Engineering. Their research portfolio comprises 38 publications in Materials Science and 22 in Engineering, with a particular focus on subfields such as Materials Chemistry, Electrical and Electronic Engineering, Mechanical Engineering, Electronic, Optical and Magnetic Materials, and Atomic and Molecular Physics, and Optics.

The main topics of James M. Howe's work include:

  • Electronic and Structural Properties of Oxides
  • Semiconductor materials and devices
  • Thermal properties of materials
  • Ferroelectric and Piezoelectric Materials
  • Force Microscopy Techniques and Applications
  • Heat Transfer and Optimization
  • Magnetic and transport properties of perovskites and related materials

Recent publications by Howe illustrate an emphasis on thermal conductivity and materials properties in thin films and oxides. Selected papers include:

  • "High In-Plane Thermal Conductivity of Aluminum Nitride Thin Films" (2021, ACS Nano)
  • "Emergent interface vibrational structure of oxide superlattices" (2022, Nature)
  • "Observation of solid-state bidirectional thermal conductivity switching in antiferroelectric lead zirconate (PbZrO3)" (2022, Nature Communications)
  • "Impact of oxygen content on phase constitution and ferroelectric behavior of hafnium oxide thin films deposited by reactive high-power impulse magnetron sputtering" (2022, Acta Materialia)
  • "High thermal conductivity and thermal boundary conductance of homoepitaxially grown gallium nitride (GaN) thin films" (2021, Physical Review Materials)

Howe frequently publishes in venues such as:

  • Microscopy and Microanalysis
  • Acta Materialia
  • Physical Review Materials
  • Advanced Materials
  • arXiv (Cornell University)

Frequent collaborators across Howe's body of work include Eric R. Hoglund, Patrick E. Hopkins, Md Shafkat Bin Hoque, Jordan A. Hachtel, and De-Liang Bao. These collaborations have been reflected in multiple coauthored publications, with the highest number of joint works occurring with Eric R. Hoglund and Patrick E. Hopkins.

Best Publications

  • Transmission electron microscopy and diffractometry of materials

    Brent Fultz;James M. Howe

  • Interfaces in Materials: Atomic Structure, Thermodynamics and Kinetics of Solid-Vapor, Solid-Liquid and Solid-Solid Interfaces

    James M. Howe

  • Bonding, structure, and properties of metal/ceramic interfaces: Part 1 Chemical bonding, chemical reaction, and interfacial structure

    J. M. Howe

  • Atomic-Level Observation of Disclination Dipoles in Mechanically Milled, Nanocrystalline Fe

    M. Murayama;J. M. Howe;H. Hidaka;S. Takaki

  • Atomic mechanisms of precipitate plate growth

    J. M. Howe;U. Dahmen;R. Gronsky

  • Interphase boundary structures of intragranular proeutectoid α plates in a hypoeutectoid TiCr alloy

    T. Furuhara;J.M. Howe;H.I. Aaronson

  • The role of disconnections in phase transformations

    J.M. Howe;R.C. Pond;J.P. Hirth

  • Transmission Electron Microscopy and Diffractometry of Materials

    Unknown

  • Convergent-beam electron diffraction analysis of the Ω phase in an Al-4.0 Cu-0.5 Mg-0.5 Ag alloy

    A. Garg;J.M. Howe

  • Transmission Electron Microscopy and Diffractometry of Materials

    Unknown

  • Structure and deformation behavior ofT 1 precipitate plates in an Al- 2Li- 1 Cu alloy

    J. M. Howe;J. Lee;A. K. Vasudévan

  • In situ transmission-electron-microscopy investigation of melting in submicron Al-Si alloy particles under electron-beam irradiation.

    Takeshi Yokota;M. Murayama;J. M. Howe

  • High In-Plane Thermal Conductivity of Aluminum Nitride Thin Films.

    Shafkat Bin Hoque;Yee Rui Koh;Jeffrey L Braun;Abdullah Mamun

  • Crystallographic and mechanistic aspects of growth by shear and by diffusional processes

    H. I. Aaronson;T. Furuhara;J. M. Rigsbee;W. T. Reynolds

  • Transmission electron microscopy investigation of interfaces in a two-phase TiAl alloy

    G. J. Mahon;J. M. Howe

  • Atomic mechanisms of precipitate plate growth in the AlAg system—II. High-resolution transmission electron microscopy

    J.M. Howe;H.I. Aaronson;R. Gronsky

  • Atomic mechanisms of precipitate plate growth in the AlAg system—I. Conventional transmission electron microscopy

    J.M. Howe;H.I. Aaronson;R. Gronsky

  • Precipitation of the Ω phase in an Al-4.0Cu-0.5Mg alloy

    A. Garg;Y.C. Chang;J.M. Howe

  • Composition and stability of Ω phase in an Al-Cu-Mg-Ag Alloy

    Y. C. Chang;J. M. Howe

  • Emergent interface vibrational structure of oxide superlattices

    Unknown

  • High-resolution electron microscopy of γ-α2 interfaces in titanium aluminide

    S. R. Singh;J. M. Howe

  • In Situ Transmission Electron Microscopy Studies of the Solid–Liquid Interface

    James M. Howe;Hiroyasu Saka

  • Interface controlled thermal resistances of ultra-thin chalcogenide-based phase change memory devices.

    Kiumars Aryana;John T. Gaskins;Joyeeta Nag;Derek A. Stewart

Frequent Co-Authors

Brent Fultz
Brent Fultz California Institute of Technology
Mitsuhiro Murayama
Mitsuhiro Murayama Virginia Tech
Patrick E. Hopkins
Patrick E. Hopkins University of Virginia
Hub I Aaronson
Hub I Aaronson Carnegie Mellon University
Tadashi Furuhara
Tadashi Furuhara Tohoku University
Ronald Gronsky
Ronald Gronsky University of California, Berkeley
Setsuo Takaki
Setsuo Takaki Kyushu University
Eric A. Stach
Eric A. Stach University of Pennsylvania
Vijay K. Vasudevan
Vijay K. Vasudevan Google (United States)
Sokrates T. Pantelides
Sokrates T. Pantelides Vanderbilt University

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