2016 - Monie A. Ferst Award, Sigma Xi
2006 - IEEE Medal of Honor For pioneering contributions to microelectronics, including low power, biomedical, physical limits and on-chip interconnect networks.”
1999 - Semiconductor Industry Association University Researcher Award
1992 - Fellow of the American Academy of Arts and Sciences
1989 - IEEE Donald O. Pederson Award in Solid-State Circuits "For contributions to solid-state circuits and solid-state circuit technology."
1967 - Fellow of the American Association for the Advancement of Science (AAAS)
In his study, James D. Meindl carries out multidisciplinary Management and Public relations research. James D. Meindl merges Public relations with Management in his research. His study connects Organizational commitment and Social psychology. Organizational commitment is closely attributed to Social psychology in his work. Romance is closely attributed to Psychoanalysis in his study. His research on Psychoanalysis often connects related topics like Romance. His Law study frequently links to adjacent areas such as Terrorism. The study of Terrorism is intertwined with the study of Law in a number of ways. He merges many fields, such as Organizational behavior and Organizational culture, in his writings.
James D. Meindl integrates many fields, such as Social psychology and Social science, in his works. James D. Meindl brings together Social science and Social psychology to produce work in his papers. James D. Meindl integrates Law with Public relations in his study. James D. Meindl conducts interdisciplinary study in the fields of Public relations and Law through his research. In his research, James D. Meindl performs multidisciplinary study on Management and Organizational behavior. He performs multidisciplinary study in Organizational behavior and Management in his work. James D. Meindl undertakes multidisciplinary investigations into Charisma and Charismatic authority in his work. He incorporates Charismatic authority and Charisma in his research. James D. Meindl combines Neuroscience and Perception in his studies.
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Impact of die-to-die and within-die parameter fluctuations on the maximum clock frequency distribution for gigascale integration
K.A. Bowman;S.G. Duvall;J.D. Meindl.
IEEE Journal of Solid-state Circuits (2002)
The impact of intrinsic device fluctuations on CMOS SRAM cell stability
A.J. Bhavnagarwala;Xinghai Tang;J.D. Meindl.
IEEE Journal of Solid-state Circuits (2001)
Interconnect limits on gigascale integration (GSI) in the 21st century
J.A. Davis;R. Venkatesan;A. Kaloyeros;M. Beylansky.
Proceedings of the IEEE (2001)
Ion-implanted complementary MOS transistors in low-voltage circuits
R.M. Swanson;J.D. Meindl.
international solid-state circuits conference (1972)
Optimal interconnection circuits for VLSI
H.B. Bakoglu;J.D. Meindl.
IEEE Transactions on Electron Devices (1985)
Breakdown current density of graphene nanoribbons
Raghunath Murali;Yinxiao Yang;Kevin Brenner;Thomas Beck.
Applied Physics Letters (2009)
Limits on Silicon Nanoelectronics for Terascale Integration
James D. Meindl;Qiang Chen;Jeffrey A. Davis.
Science (2001)
A stochastic wire-length distribution for gigascale integration (GSI). I. Derivation and validation
J.A. Davis;V.K. De;J.D. Meindl.
IEEE Transactions on Electron Devices (1998)
Breakdown Current Density of Graphene Nano Ribbons
Raghunath Murali;Yinxiao Yang;Kevin Brenner;Thomas Beck.
arXiv: Mesoscale and Nanoscale Physics (2009)
Performance comparison between carbon nanotube and copper interconnects for gigascale integration (GSI)
A. Naeemi;R. Sarvari;J.D. Meindl.
IEEE Electron Device Letters (2005)
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