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Duane S. Boning

Duane S. Boning

MIT
United States

D-Index & Metrics

Discipline name D-Index World Ranking Current World Ranking National Ranking Current National Ranking Publications Citations
Electronics and Electrical Engineering 45 3593 3449 1319 1232 256 7249

Duane S. Boning publications per year

The chart shows the history of publications by Duane S. Boning between 1985 and 2025, highlighting the no. of papers published in each year and offering an overview of the publication velocity of this scholar. Duane S. Boning published across 41 years, from 1985 to 2025, averaging 7.6 papers a year. Output peaked at 16 publications in 1998. 28 of the 310 publications appeared in the last two years.

No. of publications
5 10 15
Bar chart. Horizontal axis: year, 1985 to 2025. Vertical axis: number of publications, 0 to 16. Peak 16 publications in 1998. 1985: 1 publication 1986: 0 publications 1987: 0 publications 1988: 3 publications 1989: 0 publications 1990: 4 publications 1991: 2 publications 1992: 2 publications 1993: 4 publications 1994: 4 publications 1995: 4 publications 1996: 6 publications 1997: 15 publications 1998: 16 publications 1999: 15 publications 2000: 8 publications 2001: 10 publications 2002: 10 publications 2003: 11 publications 2004: 12 publications 2005: 12 publications 2006: 5 publications 2007: 14 publications 2008: 7 publications 2009: 7 publications 2010: 8 publications 2011: 9 publications 2012: 5 publications 2013: 7 publications 2014: 3 publications 2015: 9 publications 2016: 3 publications 2017: 3 publications 2018: 4 publications 2019: 11 publications 2020: 9 publications 2021: 9 publications 2022: 15 publications 2023: 15 publications 2024: 14 publications 2025: 14 publications
1985 2025

310 publications in total across all disciplines

View publications per year as a table
Duane S. Boning: publications per year, 1985 to 2025
Year Publications
1985 1
1986 0
1987 0
1988 3
1989 0
1990 4
1991 2
1992 2
1993 4
1994 4
1995 4
1996 6
1997 15
1998 16
1999 15
2000 8
2001 10
2002 10
2003 11
2004 12
2005 12
2006 5
2007 14
2008 7
2009 7
2010 8
2011 9
2012 5
2013 7
2014 3
2015 9
2016 3
2017 3
2018 4
2019 11
2020 9
2021 9
2022 15
2023 15
2024 14
2025 14
Total 310
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Duane S. Boning publication distribution in Electronics and Electrical Engineering in 2026

The chart shows the distribution of publications by all Research.com ranked scientists in the field of Electronics and Electrical Engineering in 2026. The highlighted bar marks where Duane S. Boning sits on this spectrum.

No. of scientists
100 200 300 400
Bar chart with 53 bars. Horizontal axis: publications, 34–53 to 1,065+. Vertical axis: number of scientists, 0 to 445. Most scientists, 445, have 174–193 publications. The last bar groups every scientist with 1,065 publications or more. The highlighted bar, 254–273 publications, is where this scientist sits. 34–53 publications: 24 scientists 54–73 publications: 52 scientists 74–93 publications: 114 scientists 94–113 publications: 203 scientists 114–133 publications: 269 scientists 134–153 publications: 355 scientists 154–173 publications: 403 scientists 174–193 publications: 445 scientists 194–213 publications: 430 scientists 214–233 publications: 431 scientists 234–253 publications: 399 scientists 254–273 publications: 366 scientists 274–293 publications: 335 scientists 294–313 publications: 300 scientists 314–333 publications: 276 scientists 334–353 publications: 250 scientists 354–373 publications: 214 scientists 374–393 publications: 187 scientists 394–413 publications: 152 scientists 414–433 publications: 169 scientists 434–453 publications: 147 scientists 454–473 publications: 111 scientists 474–493 publications: 117 scientists 494–513 publications: 103 scientists 514–533 publications: 99 scientists 534–553 publications: 92 scientists 554–573 publications: 75 scientists 574–593 publications: 58 scientists 594–613 publications: 69 scientists 614–633 publications: 50 scientists 634–653 publications: 62 scientists 654–673 publications: 54 scientists 674–693 publications: 44 scientists 694–713 publications: 37 scientists 714–733 publications: 28 scientists 734–753 publications: 26 scientists 754–773 publications: 26 scientists 774–793 publications: 19 scientists 794–813 publications: 23 scientists 814–833 publications: 20 scientists 834–853 publications: 16 scientists 854–873 publications: 20 scientists 874–893 publications: 11 scientists 894–913 publications: 11 scientists 914–933 publications: 16 scientists 934–953 publications: 13 scientists 954–973 publications: 10 scientists 974–993 publications: 11 scientists 994–1,013 publications: 9 scientists 1,014–1,033 publications: 9 scientists 1,034–1,053 publications: 10 scientists 1,054–1,064 publications: 6 scientists 1,065+ publications: 99 scientists
34–53 publications 1,065+

This scientist: 256 publications — 46th percentile

46% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 1,065 publications or more.

View publications distribution as a table
Number of Electronics and Electrical Engineering scientists by publication count, Research.com 2026 ranking edition. Based on 6,875 ranked scientists.
Publications Scientists This scientist
34–53 24
54–73 52
74–93 114
94–113 203
114–133 269
134–153 355
154–173 403
174–193 445
194–213 430
214–233 431
234–253 399
254–273 366 256
274–293 335
294–313 300
314–333 276
334–353 250
354–373 214
374–393 187
394–413 152
414–433 169
434–453 147
454–473 111
474–493 117
494–513 103
514–533 99
534–553 92
554–573 75
574–593 58
594–613 69
614–633 50
634–653 62
654–673 54
674–693 44
694–713 37
714–733 28
734–753 26
754–773 26
774–793 19
794–813 23
814–833 20
834–853 16
854–873 20
874–893 11
894–913 11
914–933 16
934–953 13
954–973 10
974–993 11
994–1,013 9
1,014–1,033 9
1,034–1,053 10
1,054–1,064 6
1,065+ 99
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Duane S. Boning D-index placement in Electronics and Electrical Engineering in 2026

The chart shows the D-index (discipline H-index) distribution of Electronics and Electrical Engineering scientists ranked by Research.com in 2026. The highlighted bar marks where Duane S. Boning sits on this spectrum.

No. of scientists
50 100 150 200 250
Bar chart with 82 bars. Horizontal axis: D-Index, 30 to 111+. Vertical axis: number of scientists, 0 to 263. Most scientists, 263, have 32 D-Index. The last bar groups every scientist with 111 D-Index or more. The highlighted bar, 45 D-Index, is where this scientist sits. 30 D-Index: 178 scientists 31 D-Index: 257 scientists 32 D-Index: 263 scientists 33 D-Index: 262 scientists 34 D-Index: 244 scientists 35 D-Index: 236 scientists 36 D-Index: 211 scientists 37 D-Index: 220 scientists 38 D-Index: 214 scientists 39 D-Index: 214 scientists 40 D-Index: 205 scientists 41 D-Index: 187 scientists 42 D-Index: 194 scientists 43 D-Index: 201 scientists 44 D-Index: 155 scientists 45 D-Index: 189 scientists 46 D-Index: 148 scientists 47 D-Index: 160 scientists 48 D-Index: 134 scientists 49 D-Index: 130 scientists 50 D-Index: 141 scientists 51 D-Index: 156 scientists 52 D-Index: 108 scientists 53 D-Index: 130 scientists 54 D-Index: 112 scientists 55 D-Index: 97 scientists 56 D-Index: 111 scientists 57 D-Index: 102 scientists 58 D-Index: 108 scientists 59 D-Index: 120 scientists 60 D-Index: 103 scientists 61 D-Index: 93 scientists 62 D-Index: 92 scientists 63 D-Index: 74 scientists 64 D-Index: 77 scientists 65 D-Index: 73 scientists 66 D-Index: 64 scientists 67 D-Index: 69 scientists 68 D-Index: 60 scientists 69 D-Index: 39 scientists 70 D-Index: 57 scientists 71 D-Index: 59 scientists 72 D-Index: 46 scientists 73 D-Index: 49 scientists 74 D-Index: 38 scientists 75 D-Index: 35 scientists 76 D-Index: 32 scientists 77 D-Index: 35 scientists 78 D-Index: 31 scientists 79 D-Index: 22 scientists 80 D-Index: 34 scientists 81 D-Index: 31 scientists 82 D-Index: 34 scientists 83 D-Index: 23 scientists 84 D-Index: 18 scientists 85 D-Index: 30 scientists 86 D-Index: 19 scientists 87 D-Index: 19 scientists 88 D-Index: 20 scientists 89 D-Index: 8 scientists 90 D-Index: 17 scientists 91 D-Index: 7 scientists 92 D-Index: 14 scientists 93 D-Index: 9 scientists 94 D-Index: 15 scientists 95 D-Index: 10 scientists 96 D-Index: 12 scientists 97 D-Index: 10 scientists 98 D-Index: 10 scientists 99 D-Index: 12 scientists 100 D-Index: 16 scientists 101 D-Index: 5 scientists 102 D-Index: 7 scientists 103 D-Index: 7 scientists 104 D-Index: 8 scientists 105 D-Index: 9 scientists 106 D-Index: 13 scientists 107 D-Index: 4 scientists 108 D-Index: 5 scientists 109 D-Index: 10 scientists 110 D-Index: 8 scientists 111+ D-Index: 96 scientists
30 D-Index 111+

This scientist: 45 D-Index — 50th percentile

50% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 111 D-Index or more.

View D-Index distribution as a table
Number of Electronics and Electrical Engineering scientists by D-index, Research.com 2026 ranking edition. Based on 6,875 ranked scientists.
D-Index Scientists This scientist
30 178
31 257
32 263
33 262
34 244
35 236
36 211
37 220
38 214
39 214
40 205
41 187
42 194
43 201
44 155
45 189 45
46 148
47 160
48 134
49 130
50 141
51 156
52 108
53 130
54 112
55 97
56 111
57 102
58 108
59 120
60 103
61 93
62 92
63 74
64 77
65 73
66 64
67 69
68 60
69 39
70 57
71 59
72 46
73 49
74 38
75 35
76 32
77 35
78 31
79 22
80 34
81 31
82 34
83 23
84 18
85 30
86 19
87 19
88 20
89 8
90 17
91 7
92 14
93 9
94 15
95 10
96 12
97 10
98 10
99 12
100 16
101 5
102 7
103 7
104 8
105 9
106 13
107 4
108 5
109 10
110 8
111+ 96
Download as CSV

Research.com Recognitions

  • 2005 - IEEE Fellow For contributions to modeling and control in semiconductor manufacturing.

Overview

Duane S. Boning is affiliated with MIT in the United States and has a research portfolio spanning engineering and computer science with a focus on electrical and electronic engineering as well as artificial intelligence. Their work crosses several subfields including biomedical engineering, statistics, probability and uncertainty, and signal processing.

The primary topics addressed in their research include:

  • Photonic and Optical Devices
  • Optical Network Technologies
  • Neural Networks and Reservoir Computing
  • Anomaly Detection Techniques and Applications
  • Semiconductor Lasers and Optical Devices
  • Adversarial Robustness in Machine Learning
  • Machine Learning and Data Classification

Boning's collaborations involve frequent coauthors such as Zhengqi Gao, Zhengxing Zhang, Fan-Keng Sun, Uttara Chakraborty, and Wim Bogaerts.

The main publication venues for their work include:

  • arXiv (Cornell University)
  • IEEE Transactions on Semiconductor Manufacturing
  • Journal of Lightwave Technology
  • Optics Express
  • Conference on Lasers and Electro-Optics

Notable recent papers include:

  • Robust Deep Reinforcement Learning against Adversarial Perturbations on State Observations, 2020, arXiv (Cornell University)
  • Robust Reinforcement Learning on State Observations with Learned Optimal Adversary, 2021, arXiv (Cornell University)
  • Variational Quantum Pulse Learning, 2022, 2022 IEEE International Conference on Quantum Computing and Engineering (QCE)
  • One Class Process Anomaly Detection Using Kernel Density Estimation Methods, 2022, IEEE Transactions on Semiconductor Manufacturing

Duane S. Boning was awarded the IEEE Fellow in 2005 for contributions to modeling and control in semiconductor manufacturing.

Best Publications

  • Towards Fast Computation of Certified Robustness for ReLU Networks

    Tsui-Wei Weng;Huan Zhang;Hongge Chen;Zhao Song

  • Analysis and decomposition of spatial variation in integrated circuit processes and devices

    B.E. Stine;D.S. Boning;J.E. Chung

  • Design for Manufacturability and Statistical Design: A Constructive Approach

    Michael Orshansky;Sani Nassif;Duane Boning

  • A self-tuning EWMA controller utilizing artificial neural network function approximation techniques

    T.H. Smith;D.S. Boning

  • The physical and electrical effects of metal-fill patterning practices for oxide chemical-mechanical polishing processes

    B.E. Stine;D.S. Boning;J.E. Chung;L. Camilletti

  • Run by run control of chemical-mechanical polishing

    D. Boning;W. Moyne;T. Smith;J. Moyne

  • Towards Stable and Efficient Training of Verifiably Robust Neural Networks

    Huan Zhang;Hongge Chen;Chaowei Xiao;Sven Gowal

  • Characterization and modeling of oxide chemical-mechanical polishing using planarization length and pattern density concepts

    D.O. Ouma;D.S. Boning;J.E. Chung;W.G. Easter

  • Rapid characterization and modeling of pattern-dependent variation in chemical-mechanical polishing

    B.E. Stine;D.O. Ouma;R.R. Divecha;D.S. Boning

  • A methodology for modeling the effects of systematic within-die interconnect and device variation on circuit performance

    Vikas Mehrotra;Shiou Lin Sam;Duane Boning;Anantha Chandrakasan

  • Robust Deep Reinforcement Learning against Adversarial Perturbations on State Observations

    Huan Zhang;Hongge Chen;Chaowei Xiao;Bo Li

  • DOE/Opt: a system for design of experiments, response surface modeling, and optimization using process and device simulation

    D.S. Boning;P.K. Mozumder

  • An integrated characterization and modeling methodology for CMP dielectric planarization

    D. Ouma;D. Boning;J. Chung;G. Shin

  • The Limitations of Adversarial Training and the Blind-Spot Attack

    Huan Zhang;Hongge Chen;Zhao Song;Duane S. Boning

  • Technology scaling impact of variation on clock skew and interconnect delay

    V. Mehrotra;D. Boning

  • Run by run advanced process control of metal sputter deposition

    T.H. Smith;D.S. Boning;J. Stefani;S.W. Butler

  • Simultaneous Fault Detection and Classification for Semiconductor Manufacturing Tools

    Brian E. Goodlin;Duane S. Boning;Herbert H. Sawin;Barry M. Wise

  • Low open-area endpoint detection using a PCA-based T/sup 2/ statistic and Q statistic on optical emission spectroscopy measurements

    D.A. White;B.E. Goodlin;A.E. Gower;D.S. Boning

  • Spatial characterization of wafer state using principal component analysis of optical emission spectra in plasma etch

    D.A. White;D. Boning;S.W. Butler;G.G. Barna

  • Modeling the effects of manufacturing variation on high-speed microprocessor interconnect performance

    Unknown

  • Robust Decision Trees Against Adversarial Examples.

    Hongge Chen;Huan Zhang;Duane S. Boning;Cho-Jui Hsieh

Frequent Co-Authors

Cho-Jui Hsieh
Cho-Jui Hsieh University of California, Los Angeles
Huan Zhang
Huan Zhang University of California, Los Angeles
Dimitri A. Antoniadis
Dimitri A. Antoniadis MIT
Anantha P. Chandrakasan
Anantha P. Chandrakasan MIT
Luca Daniel
Luca Daniel MIT
Yee Cheong Lam
Yee Cheong Lam Nanyang Technological University
Hae-Seung Lee
Hae-Seung Lee MIT
Rob A. Rutenbar
Rob A. Rutenbar University of Pittsburgh
Zhao Song
Zhao Song Adobe Systems (United States)
Inderjit S. Dhillon
Inderjit S. Dhillon Google (United States)

External Links

Personal website of Duane S. Boning Google Scholar page

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Publications: 27

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Publications: 22

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Publications: 21

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Publications: 13

Martin Vechev

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Publications: 13

Alexander Zelikovsky

Alexander Zelikovsky

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Publications: 13

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Publications: 11

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Publications: 11

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Publications: 11

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