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Duane S. Boning

Duane S. Boning

D-Index & Metrics

Electronics and Electrical Engineering

D-Index
45
Citations
7249
World Ranking
3593
National Ranking
1318

Research.com Recognitions

  • 2005 - IEEE Fellow For contributions to modeling and control in semiconductor manufacturing.

Overview

Duane S. Boning is affiliated with MIT in the United States and has a research portfolio spanning engineering and computer science with a focus on electrical and electronic engineering as well as artificial intelligence. Their work crosses several subfields including biomedical engineering, statistics, probability and uncertainty, and signal processing.

The primary topics addressed in their research include:

  • Photonic and Optical Devices
  • Optical Network Technologies
  • Neural Networks and Reservoir Computing
  • Anomaly Detection Techniques and Applications
  • Semiconductor Lasers and Optical Devices
  • Adversarial Robustness in Machine Learning
  • Machine Learning and Data Classification

Boning's collaborations involve frequent coauthors such as Zhengqi Gao, Zhengxing Zhang, Fan-Keng Sun, Uttara Chakraborty, and Wim Bogaerts.

The main publication venues for their work include:

  • arXiv (Cornell University)
  • IEEE Transactions on Semiconductor Manufacturing
  • Journal of Lightwave Technology
  • Optics Express
  • Conference on Lasers and Electro-Optics

Notable recent papers include:

  • Robust Deep Reinforcement Learning against Adversarial Perturbations on State Observations, 2020, arXiv (Cornell University)
  • Robust Reinforcement Learning on State Observations with Learned Optimal Adversary, 2021, arXiv (Cornell University)
  • Variational Quantum Pulse Learning, 2022, 2022 IEEE International Conference on Quantum Computing and Engineering (QCE)
  • One Class Process Anomaly Detection Using Kernel Density Estimation Methods, 2022, IEEE Transactions on Semiconductor Manufacturing

Duane S. Boning was awarded the IEEE Fellow in 2005 for contributions to modeling and control in semiconductor manufacturing.

Best Publications

  • Towards Fast Computation of Certified Robustness for ReLU Networks

    Tsui-Wei Weng;Huan Zhang;Hongge Chen;Zhao Song

  • Analysis and decomposition of spatial variation in integrated circuit processes and devices

    B.E. Stine;D.S. Boning;J.E. Chung

  • Design for Manufacturability and Statistical Design: A Constructive Approach

    Michael Orshansky;Sani Nassif;Duane Boning

  • A self-tuning EWMA controller utilizing artificial neural network function approximation techniques

    T.H. Smith;D.S. Boning

  • The physical and electrical effects of metal-fill patterning practices for oxide chemical-mechanical polishing processes

    B.E. Stine;D.S. Boning;J.E. Chung;L. Camilletti

  • Run by run control of chemical-mechanical polishing

    D. Boning;W. Moyne;T. Smith;J. Moyne

  • Towards Stable and Efficient Training of Verifiably Robust Neural Networks

    Huan Zhang;Hongge Chen;Chaowei Xiao;Sven Gowal

  • Characterization and modeling of oxide chemical-mechanical polishing using planarization length and pattern density concepts

    D.O. Ouma;D.S. Boning;J.E. Chung;W.G. Easter

  • Rapid characterization and modeling of pattern-dependent variation in chemical-mechanical polishing

    B.E. Stine;D.O. Ouma;R.R. Divecha;D.S. Boning

  • A methodology for modeling the effects of systematic within-die interconnect and device variation on circuit performance

    Vikas Mehrotra;Shiou Lin Sam;Duane Boning;Anantha Chandrakasan

  • Robust Deep Reinforcement Learning against Adversarial Perturbations on State Observations

    Huan Zhang;Hongge Chen;Chaowei Xiao;Bo Li

  • DOE/Opt: a system for design of experiments, response surface modeling, and optimization using process and device simulation

    D.S. Boning;P.K. Mozumder

  • An integrated characterization and modeling methodology for CMP dielectric planarization

    D. Ouma;D. Boning;J. Chung;G. Shin

  • The Limitations of Adversarial Training and the Blind-Spot Attack

    Huan Zhang;Hongge Chen;Zhao Song;Duane S. Boning

  • Technology scaling impact of variation on clock skew and interconnect delay

    V. Mehrotra;D. Boning

  • Run by run advanced process control of metal sputter deposition

    T.H. Smith;D.S. Boning;J. Stefani;S.W. Butler

  • Simultaneous Fault Detection and Classification for Semiconductor Manufacturing Tools

    Brian E. Goodlin;Duane S. Boning;Herbert H. Sawin;Barry M. Wise

  • Low open-area endpoint detection using a PCA-based T/sup 2/ statistic and Q statistic on optical emission spectroscopy measurements

    D.A. White;B.E. Goodlin;A.E. Gower;D.S. Boning

  • Spatial characterization of wafer state using principal component analysis of optical emission spectra in plasma etch

    D.A. White;D. Boning;S.W. Butler;G.G. Barna

  • Modeling the effects of manufacturing variation on high-speed microprocessor interconnect performance

    Unknown

  • Robust Decision Trees Against Adversarial Examples.

    Hongge Chen;Huan Zhang;Duane S. Boning;Cho-Jui Hsieh

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