The chart shows the distribution of publications by all Research.com ranked scientists in the field of Engineering and Technology in 2026. The highlighted bar marks where Thong Ngee Goh sits on this spectrum.
This scientist: 218 publications — 54th percentile
54% of scientists in this discipline score the same or lower.
The last bar groups every scientist with 804 publications or more.
The chart shows the D-index (discipline H-index) distribution of Engineering and Technology scientists ranked by Research.com in 2026. The highlighted bar marks where Thong Ngee Goh sits on this spectrum.
This scientist: 58 D-Index — 75th percentile
75% of scientists in this discipline score the same or lower.
The last bar groups every scientist with 107 D-Index or more.
His primary scientific interests are in Statistics, Control chart, Machine learning, Artificial intelligence and Quality management. His Exponential distribution, Mathematical model, Stochastic process and Autocorrelation study in the realm of Statistics interacts with subjects such as Solar energy conversion. His Control chart research includes elements of Reliability engineering, Equivalence, Statistical process control and Chart.
Thong Ngee Goh interconnects Weibull distribution and Exponentiated Weibull distribution in the investigation of issues within Reliability engineering. His Artificial neural network study in the realm of Machine learning connects with subjects such as Weighting. Thong Ngee Goh studied Quality management and Six Sigma that intersect with Knowledge management and Knowledge economy.
Thong Ngee Goh focuses on Control chart, Statistics, Statistical process control, Chart and Reliability engineering. His research investigates the connection between Control chart and topics such as Industrial engineering that intersect with issues in Operations research. His Statistics research integrates issues from np-chart, u-chart and Algorithm.
His Statistical process control study which covers Process that intersects with Quality and Design of experiments. His Chart study integrates concerns from other disciplines, such as CUSUM and Sensitivity. He has researched Weibull distribution in several fields, including Applied mathematics and Failure rate.
Thong Ngee Goh spends much of his time researching Six Sigma, Statistics, Quality management, Quality and Control chart. In general Six Sigma, his work in Design for Six Sigma is often linked to Set and Particle physics linking many areas of study. His Statistics study combines topics from a wide range of disciplines, such as Algorithm, Residual and Statistical process control, Average run length.
His Quality study incorporates themes from New product development, Knowledge management and Product. His work deals with themes such as Industrial engineering, Reliability engineering and Chart, which intersect with Control chart. He combines subjects such as Reliability and Weibull distribution with his study of Reliability engineering.
Design for Six Sigma, Six Sigma, Control chart, Management and Lean Six Sigma are his primary areas of study. His studies deal with areas such as Reliability engineering and Chart as well as Control chart. His biological study spans a wide range of topics, including Economic design, Sample, Industrial engineering and Exponential distribution.
His Chart study combines topics in areas such as Sequential probability ratio test and CUSUM. His Management research incorporates elements of Statistical thinking and Public relations. He has included themes like Statistics, Sample size determination and Statistical process control in his EWMA chart study.
Min Xie;Y. Tang;Thong Ngee Goh
S. L. Ho;M. Xie;T. N. Goh
T. N. Goh
Min Xie;Thong Ngee Goh;Priya Ranjan
Y. F. Li;M. Xie;T. N. Goh
Y. F. Li;S. H. Ng;M. Xie;T. N. Goh
L. Y. Chan;M. Xie;T.N. Goh
M. Xie;T. N. Goh;V. Kuralmani
T.N. Goh;M. Xie
X S Lu;M Xie;T N Goh;C D Lai
H. Wang;M. Xie;T. N. Goh
C. W Zhang;M Xie;J. Y Liu;T. N Goh
M. Xie;B. He;T. N. Goh
Siu Lau Ho;M. Xie;T. N. Goh
T. N. Goh
Loon Ching Tang;Thong Ngee Goh;Shao Wei Lam;Cai Wen Zhang
Y. F. Li;M. Xie;T. N. Goh
Yuya Kajikawa;Toshihiro Inoue;Thong Ngee Goh
L.C. Tang;Y.S. Sun;T.N. Goh;H.L. Ong
T.N. Goh;K.J. Tan
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