Helmut Dosch

Helmut Dosch publication distribution in Materials Science in 2026

The chart shows the distribution of publications by all Research.com ranked scientists in the field of Materials Science in 2026. The highlighted bar marks where Helmut Dosch sits on this spectrum.

Helmut Dosch D-index placement in Materials Science in 2026

The chart shows the D-index (discipline H-index) distribution of Materials Science scientists ranked by Research.com in 2026. The highlighted bar marks where Helmut Dosch sits on this spectrum.

Overview

Best Publications

• Molecular layering of fluorinated ionic liquids at a charged sapphire (0001) surface.

  Markus Mezger;Heiko Schröder;Harald G. Reichert;Sebastian M. Schramm

  735
  Citations

• Critical Phenomena at Surfaces and Interfaces: Evanescent X-Ray and Neutron Scattering

  Helmut Dosch;Terrence J. Jach

  495
  Citations

• Observation of five-fold local symmetry in liquid lead.

  H. Reichert;O. Klein;H. Dosch;H. Dosch;M. Denk

  390
  Citations

• High-resolution in situ x-ray study of the hydrophobic gap at the water-octadecyl-trichlorosilane interface

  Markus Mezger;Harald Reichert;Sebastian Schöder;John Okasinski

  348
  Citations

• Organic n-Channel Transistors Based on Core-Cyanated Perylene Carboxylic Diimide Derivatives

  R. Thomas Weitz;Konstantin Amsharov;Ute Zschieschang;Esther Barrena Villas

  312
  Citations

• X-ray cross correlation analysis uncovers hidden local symmetries in disordered matter

  Peter Wochner;Christian Gutt;Tina Autenrieth;Thomas Demmer

  298
  Citations

• Initial corrosion observed on the atomic scale

  F. U. Renner;A. Stierle;H. Dosch;H. Dosch;D. M. Kolb

  288
  Citations

• Kinetic hindrance during the initial oxidation of Pd(100) at ambient pressures

  E. Lundgren;J. Gustafson;A. Mikkelsen;J.N. Andersen

  277
  Citations

• Shape Changes of Supported Rh Nanoparticles During Oxidation and Reduction Cycles

  P. Nolte;A. Stierle;N. Y. Jin-Phillipp;N. Kasper

  268
  Citations

• Interfacial melting of ice in contact with SiO(2).

  S. Engemann;H. Reichert;H. Dosch;H. Dosch;J. Bilgram

  253
  Citations

• Rapid roughening in thin film growth of an organic semiconductor (diindenoperylene).

  A.C. Dürr;F. Schreiber;K. A. Ritley;V. Kruppa

  235
  Citations

• Depth-Controlled Grazing-Incidence Diffraction of Synchrotron X Radiation

  H. Dosch;B. W. Batterman;D. C. Wack

  230
  Citations

• Glancing-angle X-ray scattering studies of the premelting of ice surfaces

  H. Dosch;A. Lied;J.H. Bilgram

  228
  Citations

• Evanescent absorption in kinematic surface Bragg diffraction.

  H. Dosch

  215
  Citations

• X-ray Diffraction Study of the Ultrathin Al2O3 Layer on NiAl(110)

  A. Stierle;F. Renner;R. Streitel;H. Dosch;H. Dosch

  209
  Citations

• Morphology and Thermal Stability of Metal Contacts on Crystalline Organic Thin Films

  Arndt C. DüRR;Frank Schreiber;Marion Kelsch;Heinz D. Carstanjen

  188
  Citations

• High structural order in thin films of the organic semiconductor diindenoperylene

  A. C. Dürr;F. Schreiber;M. Münch;N. Karl

  186
  Citations

• Structure of Ag(111)-p(4x4)-O: No silver oxide

  M Schmid;A Reicho;A Stierle;I Costina

  178
  Citations

• Layering of [BMIM]+-based ionic liquids at a charged sapphire interface.

  Markus Mezger;Sebastian Schramm;Heiko Schröder;Harald Reichert

  168
  Citations

• Interplay between morphology, structure, and electronic properties at diindenoperylene-gold interfaces

  A. C. Dürr;N. Koch;M. Kelsch;A. Rühm

  168
  Citations