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Francesc Pérez-Murano

Francesc Pérez-Murano

D-Index & Metrics

Electronics and Electrical Engineering

D-Index
36
Citations
6142
World Ranking
5313
National Ranking
96

Overview

Francesc Pérez-Murano is affiliated with the Spanish National Research Council in Spain. Their research contributions span prominently in the fields of Engineering and Materials Science, with significant focus on Electrical and Electronic Engineering, Biomedical Engineering, and Materials Chemistry among other specialized areas.

Their subfields of study include:

  • Electrical and Electronic Engineering
  • Biomedical Engineering
  • Materials Chemistry
  • Atomic and Molecular Physics, and Optics
  • Surfaces, Coatings and Films

Main topics of their research activity cover:

  • Block Copolymer Self-Assembly
  • Nanowire Synthesis and Applications
  • Semiconductor materials and devices
  • Nanofabrication and Lithography Techniques
  • Advancements in Semiconductor Devices and Circuit Design
  • Ion-surface interactions and analysis
  • Electron and X-Ray Spectroscopy Techniques

Among recent publications authored or coauthored by Francesc Pérez-Murano are:

  • "Roadmap for focused ion beam technologies", 2023, Applied Physics Reviews
  • "Directed Self-Assembly of Block Copolymers for the Fabrication of Functional Devices", 2020, Polymers
  • "Uncapped Gold Nanoparticles for the Metallization of Organic Monolayers", 2021, Advanced Materials Interfaces
  • "Thermal Imaging of Block Copolymers with Sub-10 nm Resolution", 2021, ACS Nano
  • "Multi-Frequency Resonance Behaviour of a Si Fractal NEMS Resonator", 2020, Nanomaterials

They frequently collaborate with several researchers, including:

  • Marta Fernández-Regúlez
  • Joan Bausells
  • Jordi Llobet
  • E. Amat
  • A. del Moral

Francesc Pérez-Murano regularly publishes in these venues:

  • Nanomaterials
  • Semiconductor Science and Technology
  • ACS Nano
  • ACS Applied Materials & Interfaces
  • Micro and Nano Engineering

Best Publications

  • Increasing the elastic modulus of graphene by controlled defect creation

    Guillermo López-Polín;Cristina Gómez-Navarro;Vincenzo Parente;Francisco Guinea

  • Local oxidation of silicon surfaces by dynamic force microscopy: Nanofabrication and water bridge formation

    Ricardo Garcı́a;Montserrat Calleja;Francesc Pérez-Murano

  • Mechanical detection of carbon nanotube resonator vibrations.

    D. Garcia-Sanchez;A. San Paulo;M. J. Esplandiu;F. Perez-Murano

  • Electromechanical model of a resonating nano-cantilever-based sensor for high-resolution and high-sensitivity mass detection

    G. Abadal;Zachary James Davis;Bjarne Helbo;X. Borrise

  • STM-Induced Hydrogen Desorption via a Hole Resonance

    Kurt Stokbro;C. Thirstrup;M. Sakurai;Ulrich Quaade

  • Dynamic range enhancement of nonlinear nanomechanical resonant cantilevers for highly sensitive NEMS gas/mass sensor applications

    N Kacem;J Arcamone;F Perez-Murano;S Hentz

  • Ultrasensitive mass sensor fully integrated with complementary metal-oxide-semiconductor circuitry

    Esko Sebastian Forsén;G. Abadal;S. Ghatnekar-Nilsson;J. Teva

  • Predictive model for scanned probe oxidation kinetics

    John A. Dagata;F Perez-murano;G Abadal;K Morimoto

  • Anisotropic growth of long isolated graphene ribbons on the C face of graphite-capped 6H-SiC

    Nicolas Camara;Jean-Roch Huntzinger;Gemma Rius;Antoine Tiberj

  • Nanometer‐scale oxidation of Si(100) surfaces by tapping mode atomic force microscopy

    F. Pérez‐Murano;G. Abadal;N. Barniol;X. Aymerich

  • Current, charge, and capacitance during scanning probe oxidation of silicon. I. Maximum charge density and lateral diffusion

    J. A. Dagata;F. Perez-Murano;C. Martin;H. Kuramochi

  • AFM lithography of aluminum for fabrication of nanomechanical systems

    Zachary James Davis;G. Abadal;Ole Hansen;X. Borisé

  • Voltage modulation scanned probe oxidation

    Francesc Pérez-Murano;Karen Birkelund;Kiyoshi Morimoto;John A. Dagata

  • Nanolithography on thin layers of PMMA using atomic force microscopy

    Cristina Martín;Gemma Rius;Xavier Borrisé;Francesc Pérez-Murano

  • Design, fabrication, and characterization of a submicroelectromechanical resonator with monolithically integrated CMOS readout circuit

    J. Verd;G. Abadal;J. Teva;M.V. Gaudo

  • Nanometre-scale Oxidation of Silicon Surfaces by Dynamic Force Microscopy: Reproducibility, Kinetics and Nanofabrication

    M Calleja;J Anguita;R Garcia;K Birkelund

  • Integrated CMOS-MEMS with on-chip readout electronics for high-frequency applications

    J. Verd;A. Uranga;J. Teva;J.L. Lopez

  • Full-wafer fabrication by nanostencil lithography of micro/nanomechanical mass sensors monolithically integrated with CMOS.

    J Arcamone;M A F van den Boogaart;F Serra-Graells;J Fraxedas

  • Monolithic mass sensor fabricated using a conventional technology with attogram resolution in air conditions

    J. Verd;A. Uranga;G. Abadal;J. Teva

  • Modification of HF‐treated silicon (100) surfaces by scanning tunneling microscopy in air under imaging conditions

    N. Barniol;F. Pérez‐Murano;X. Aymerich

  • Evaporation of femtoliter sessile droplets monitored with nanomechanical mass sensors.

    Julien Arcamone;Erik Dujardin;Gemma Rius;Francesc Pérez-Murano

  • Density variations in scanned probe oxidation

    K Morimoto;Francesc Pérez-Murano;J.A Dagata

Frequent Co-Authors

Anja Boisen
Anja Boisen Technical University of Denmark
Jürgen Brugger
Jürgen Brugger École Polytechnique Fédérale de Lausanne
Ole Hansen
Ole Hansen Technical University of Denmark
Tiberio A. Ezquerra
Tiberio A. Ezquerra Spanish National Research Council
Lars Montelius
Lars Montelius Lund University
Erik Dujardin
Erik Dujardin Centre d’Élaboration de Matériaux et d’Etudes Structurales
Alexandra Boltasseva
Alexandra Boltasseva Purdue University West Lafayette
Xavier Batlle
Xavier Batlle University of Barcelona
Jordi Arbiol
Jordi Arbiol Catalan Institute of Nanoscience and Nanotechnology
Adrian Bachtold
Adrian Bachtold ICFO – The Institute of Photonic Sciences

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