World's Best Scientists 2026 revealed!
Aleksander Jablonski

Aleksander Jablonski

D-Index & Metrics

Chemistry

D-Index
48
Citations
8641
World Ranking
15206
National Ranking
69

Aleksander Jablonski publication distribution in Chemistry in 2026

The chart shows the distribution of publications by all Research.com ranked scientists in the field of Chemistry in 2026. The highlighted bar marks where Aleksander Jablonski sits on this spectrum.

61–80 publications: 66 scientists 81–100 publications: 302 scientists 101–120 publications: 623 scientists 121–140 publications: 918 scientists 141–160 publications: 1,218 scientists 161–180 publications: 1,350 scientists 181–200 publications: 1,344 scientists 201–220 publications: 1,281 scientists 221–240 publications: 1,216 scientists 241–260 publications: 1,100 scientists 261–280 publications: 979 scientists 281–300 publications: 939 scientists 301–320 publications: 764 scientists 321–340 publications: 643 scientists 341–360 publications: 628 scientists 361–380 publications: 522 scientists 381–400 publications: 459 scientists 401–420 publications: 397 scientists 421–440 publications: 327 scientists 441–460 publications: 270 scientists 461–480 publications: 265 scientists 481–500 publications: 252 scientists 501–520 publications: 201 scientists 521–540 publications: 185 scientists 541–560 publications: 148 scientists 561–580 publications: 148 scientists 581–600 publications: 132 scientists 601–620 publications: 114 scientists 621–640 publications: 104 scientists 641–660 publications: 91 scientists 661–680 publications: 92 scientists 681–700 publications: 73 scientists 701–720 publications: 57 scientists 721–740 publications: 54 scientists 741–760 publications: 67 scientists 761–780 publications: 45 scientists 781–800 publications: 46 scientists 801–820 publications: 39 scientists 821–840 publications: 32 scientists 841–860 publications: 36 scientists 861–880 publications: 29 scientists 881–900 publications: 26 scientists 901–920 publications: 24 scientists 921–940 publications: 14 scientists 941–960 publications: 23 scientists 961–980 publications: 28 scientists 981–1,000 publications: 15 scientists 1,001–1,020 publications: 29 scientists 1,021–1,040 publications: 12 scientists 1,041–1,060 publications: 19 scientists 1,061–1,080 publications: 12 scientists 1,081–1,100 publications: 6 scientists 1,101–1,120 publications: 8 scientists 1,121–1,140 publications: 12 scientists 1,141–1,160 publications: 5 scientists 1,161–1,180 publications: 6 scientists 1,181–1,200 publications: 14 scientists 1,201–1,220 publications: 7 scientists 1,221–1,240 publications: 2 scientists 1,241–1,260 publications: 6 scientists 1,261–1,280 publications: 4 scientists 1,281–1,294 publications: 6 scientists 1,295+ publications: 100 scientists
61 publications 1,295+

This scientist: 251 publications — 50th percentile

50% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 1,295 publications or more.

Aleksander Jablonski D-index placement in Chemistry in 2026

The chart shows the D-index (discipline H-index) distribution of Chemistry scientists ranked by Research.com in 2026. The highlighted bar marks where Aleksander Jablonski sits on this spectrum.

40–41 D-Index: 289 scientists 42–43 D-Index: 612 scientists 44–45 D-Index: 808 scientists 46–47 D-Index: 776 scientists 48–49 D-Index: 835 scientists 50–51 D-Index: 861 scientists 52–53 D-Index: 872 scientists 54–55 D-Index: 933 scientists 56–57 D-Index: 1,051 scientists 58–59 D-Index: 930 scientists 60–61 D-Index: 882 scientists 62–63 D-Index: 834 scientists 64–65 D-Index: 731 scientists 66–67 D-Index: 775 scientists 68–69 D-Index: 683 scientists 70–71 D-Index: 646 scientists 72–73 D-Index: 561 scientists 74–75 D-Index: 501 scientists 76–77 D-Index: 437 scientists 78–79 D-Index: 388 scientists 80–81 D-Index: 354 scientists 82–83 D-Index: 292 scientists 84–85 D-Index: 275 scientists 86–87 D-Index: 254 scientists 88–89 D-Index: 235 scientists 90–91 D-Index: 185 scientists 92–93 D-Index: 192 scientists 94–95 D-Index: 155 scientists 96–97 D-Index: 163 scientists 98–99 D-Index: 125 scientists 100–101 D-Index: 105 scientists 102–103 D-Index: 105 scientists 104–105 D-Index: 112 scientists 106–107 D-Index: 88 scientists 108–109 D-Index: 68 scientists 110–111 D-Index: 69 scientists 112–113 D-Index: 65 scientists 114–115 D-Index: 79 scientists 116–117 D-Index: 61 scientists 118–119 D-Index: 44 scientists 120–121 D-Index: 37 scientists 122–123 D-Index: 40 scientists 124–125 D-Index: 33 scientists 126–127 D-Index: 26 scientists 128–129 D-Index: 34 scientists 130–131 D-Index: 35 scientists 132–133 D-Index: 25 scientists 134–135 D-Index: 27 scientists 136–137 D-Index: 17 scientists 138–139 D-Index: 16 scientists 140–141 D-Index: 20 scientists 142–143 D-Index: 20 scientists 144–145 D-Index: 15 scientists 146–147 D-Index: 9 scientists 148–149 D-Index: 9 scientists 150–151 D-Index: 16 scientists 152–153 D-Index: 11 scientists 154–155 D-Index: 9 scientists 156–157 D-Index: 3 scientists 158 D-Index: 3 scientists 159+ D-Index: 98 scientists
40 D-Index 159+

This scientist: 48 D-Index — 16th percentile

16% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 159 D-Index or more.

Overview

Aleksander Jablonski is affiliated with the Polish Academy of Sciences in Poland and has contributed extensively to the fields of Materials Science, Physics and Astronomy, and Engineering. Their research spans several subfields including Surfaces, Coatings and Films, Radiation, Electrical and Electronic Engineering, Atomic and Molecular Physics, and Materials Chemistry.

The scientist's main research topics include Electron and X-Ray Spectroscopy Techniques, X-ray Spectroscopy and Fluorescence Analysis, Advancements in Photolithography Techniques, Semiconductor materials and devices, Atomic and Molecular Physics, 2D Materials and Applications, as well as MXene and MAX Phase Materials.

Frequent publication venues for their work include:

  • Computer Physics Communications
  • Journal of Surface Analysis
  • Journal of Physical and Chemical Reference Data
  • Surface and Interface Analysis
  • Materials

Some of the notable recent papers authored or co-authored by Aleksander Jablonski are:

  • Effective Attenuation Lengths for Different Quantitative Applications of X-ray Photoelectron Spectroscopy, 2020, Journal of Physical and Chemical Reference Data
  • Calculations of electron inelastic mean free paths (IMFPs). XIV. Calculated IMFPs for LiF and Si 3 N 4 and development of an improved predictive IMFP formula, 2023, Surface and Interface Analysis
  • Analytical formalism for calculations of parameters needed for quantitative analysis by X-ray photoelectron spectroscopy, 2021, Computer Physics Communications

Other relevant contributions include participation in publications focused on related materials and surface characterization techniques, as well as work documented in Computer Physics Communications and Materials journals.

Aleksander Jablonski has collaborated with several frequent co-authors across multiple publications, including:

  • C. J. Powell
  • F. Salvat
  • Shigeo Tanuma
  • M. Krawczyk

Best Publications

  • Evaluation of Calculated and Measured Electron Inelastic Mean Free Paths Near Solid Surfaces

    Cedric J. Powell;Aleksander Jablonski

  • Comparison of Electron Elastic-Scattering Cross Sections Calculated from Two Commonly Used Atomic Potentials

    Aleksander Jablonski;Francesc Salvat;Cedric J. Powell

  • Efficiency of Anti-Stokes Fluorescence in Dyes

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  • The electron attenuation length revisited

    A. Jablonski;C.J. Powell

  • Progress in quantitative surface analysis by X-ray photoelectron spectroscopy: Current status and perspectives

    Cedric J. Powell;Aleksander Jablonski

  • Surface Sensitivity of Auger-Electron Spectroscopy and X-ray Photoelectron Spectroscopy

    Cedric J. Powell;Aleksander Jablonski;I S. Tilinin;S Tanuma

  • Relationships between electron inelastic mean free paths, effective attenuation lengths, and mean escape depths

    Aleksander Jablonski;Cedric J. Powell

  • Elastic scattering and quantification in AES and XPS

    Aleksander Jablonski

  • Cross Sections for Inner-Shell Ionization by Electron Impact

    Xavier Llovet;Cedric J. Powell;Francesc Salvat;Aleksander Jablonski

  • ALD grown zinc oxide with controllable electrical properties

    E Guziewicz;M Godlewski;L Wachnicki;T A Krajewski

  • Comparison of electron attenuation lengths and escape depths with inelastic mean free paths

    A. Jablonski;H. Ebel

  • The surface composition of the gold-palladium binary alloy system

    A. Jabloński;S.H. Overbury;G.A. Somorjai

  • Electron effective attenuation lengths for applications in Auger electron spectroscopy and x-ray photoelectron spectroscopy

    Cedric J. Powell;Aleksander Jablonski

  • Practical expressions for the mean escape depth, the information depth, and the effective attenuation length in Auger-electron spectroscopy and x-ray photoelectron spectroscopy

    A. Jablonski;C. J. Powell

  • NIST data resources for surface analysis by X-ray photoelectron spectroscopy and Auger electron spectroscopy

    Cedric J. Powell;Aleksander Jablonski;A Naumkin;A Kraut-Vass

  • Formalism and parameters for quantitative surface analysis by Auger electron spectroscopy and x-ray photoelectron spectroscopy

    A. Jablonski;C. J. Powell

  • Experimental determination of the inelastic mean free path of electrons in solids

    B. Lesiak;A. Jablonski;Z. Prussak;P. Mrozek

  • Quantitative surface analysis by Auger and x-ray photoelectron spectroscopy

    I.S. Tilinin;A. Jablonski;W.S.M. Werner

  • Information depth and the mean escape depth in Auger electron spectroscopy and x-ray photoelectron spectroscopy

    Aleksander Jablonski;Cedric J. Powell

  • The inelastic mean free path of electrons in some semiconductor compounds and metals

    A. Jablonski;P. Mrozek;G. Gergely;M. Menhyárd

  • Evaluation of electron inelastic mean free paths for selected elements and compounds

    Cedric J. Powell;Aleksander Jablonski

Frequent Co-Authors

Cedric J. Powell
Cedric J. Powell National Institute of Standards and Technology
Janusz W. Sobczak
Janusz W. Sobczak Polish Academy of Sciences
Wojciech Lisowski
Wojciech Lisowski Institute of Physical Chemistry
Klaus Wandelt
Klaus Wandelt University of Bonn
Tomasz Dietl
Tomasz Dietl Tohoku University
Michal Bockowski
Michal Bockowski Polish Academy of Sciences
J.W. Niemantsverdriet
J.W. Niemantsverdriet Syngaschem (Netherlands)
Izabella Grzegory
Izabella Grzegory Polish Academy of Sciences
Tadeusz Suski
Tadeusz Suski Polish Academy of Sciences
Jaroslav Stejskal
Jaroslav Stejskal Czech Academy of Sciences

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