Siegfried Hofmann

Overview

Best Publications

• Quantitative depth profiling in surface analysis: A review

  S. Hofmann

  388
  Citations

• Thermodynamics and structural aspects of grain boundary segregation

  Pavel Lejček;Siegfried Hofmann

  346
  Citations

• Preferential sputtering of oxides: A comparison of model predictions with experimental data

  J.B. Malherbe;S. Hofmann;J.M. Sanz

  307
  Citations

• Auger- and X-Ray Photoelectron Spectroscopy in Materials Science

  Siegfried Hofmann

  265
  Citations

• Probing depth of soft x‐ray absorption spectroscopy measured in total‐electron‐yield mode

  M. Abbate;J. B. Goedkoop;F. M. F. de Groot;M. Grioni

  249
  Citations

• Atomic mixing, surface roughness and information depth in high‐resolution AES depth profiling of a GaAs/AlAs superlattice structure

  Siegfried Hofmann

  238
  Citations

• Morphology and properties of sputtered (Ti,Al)N layers on high speed steel substrates as a function of deposition temperature and sputtering atmosphere

  Hermann A. Jehn;Siegfried Hofmann;Vera‐Ellen Rückborn;Wolf‐Dieter Münz

  231
  Citations

• Sputter depth profile analysis of interfaces

  Unknown

  210
  Citations

• The contribution of characteristic energy losses in the core-level X-ray photoelectron spectroscopy peaks of TiN and (Ti, Al)N studied by electron energy loss spectroscopy and X-ray photoelectron spectroscopy

  I. leR. Strydom;S. Hofmann

  183
  Citations

• Surface and interface characterization of heat- treated (Ti, Al)N coatings on high speed steel substrates☆

  Hermann A. Jehn;Siegfried Hofmann;Wolf-Dieter Münz

  150
  Citations

• Depth resolution and surface roughness effects in sputter profiling of NiCr multilayer sandwich samples using Auger electron spectroscopy

  S. Hofmann;J. Erlewein;A. Zalar

  141
  Citations

• Solute segregation and classification of [100] tilt grain boundaries in α-iron: consequences for grain boundary engineering

  Pavel Lejček;Siegfried Hofmann;Václav Paidar

  140
  Citations

• Practical surface analysis: state of the art and recent developments in AES, XPS, ISS and SIMS

  Siegfried Hofmann

  133
  Citations

• High temperature oxidation behaviour of (Ti1−xCrx)N coatings

  Y. Otani;S. Hofmann

  126
  Citations

• Selective oxidation and chemical state of Al and Ti in (Ti, Al)n coatings

  Siegfried Hofmann;Hermann A. Jehn

  117
  Citations

• Formation and diffusion properties of oxide films on metals and on nitride coatings studied with Auger electron spectroscopy and X-ray photoelectron spectroscopy

  S Hofmann

  114
  Citations

• Solute segregation at grain boundaries

  Siegfried Hofmann;Pavel Leiĉek

  112
  Citations

• Auger electron spectroscopy depth profiling of Ni/Cr multilayers by sputtering with N2+ ions

  S. Hofmann;A. Zalar

  108
  Citations

• Auger electron spectroscopy and X-ray photoelectron spectroscopy studies of the oxidation of polycrystalline tantalum and niobium at room temperature and low oxygen pressures

  J.M Sanz;S Hofmann

  106
  Citations

• Factor analysis and superposition of Auger electron spectra applied to room temperature oxidation of Ni and NiCr21Fe12

  S. Hofmann;J. Steffen

  105
  Citations

• Characterization of nitride coatings by Auger electron spectroscopy and x‐ray photoelectron spectroscopy

  Unknown

  105
  Citations

• Approaching the limits of high resolution depth profiling

  S. Hofmann

  102
  Citations

• Thermodynamics of Grain Boundary Segregation and Applications to Anisotropy, Compensation Effect and Prediction

  Pavel Lejček;Siegfried Hofmann

  102
  Citations