World's Best Scientists 2026 revealed!
IEEE

International Test Conference (ITC)

Location: Anaheim , United States

Submission deadline: 4/11/2022

Conference dates: 9/25/2022 - 9/30/2022

Research H-index
10

Ranking & Metrics

Discipline name Position Best Scientists Publications D-Index
Electronics and Electrical Engineering 172 30 89 9
Computer Science 385 43 95 9

Call for Papers

Topics of interest include, but not
limited to:
3D/2.5D Test
5G/6G Test
Adaptive Test in Practice
AI/Machine Learning in Test
ATE/Probe Card Design
Automotive Test
Advances in Boundary Scan
Built-In Self-Test
Data Driven Test Methods
Defect-oriented Testing
Design for Test
DFM and Test
Diagnosis
Economics of Test
End-to-End Data Analysis
End-to-End System Security
Emerging Defect Mechanisms
Field Monitoring, Test, & Debug
Hardware Security and Trust
IoT Testing
Jitter, High-Speed I/O and RF Test
Known-Good-Die Test
Memory Test and Repair
MEMS Testing
Mixed-Signal and Analog Test
New Technologies and Test
Online Test
Pre-Silicon/Post-Silicon Verification
Power Issues in Test
Protocol-aware Test
Quantum Device Testing
Reliability and Resilience
SoC/SiP/NoC Test
Silicon Debug
Simulation and Emulation
System Test (Applications)
System Test (Hardware/Software)
Test Compression
Test-to-Design Feedback
Test Escape Analysis
Test Flow Optimizations
Test Generation and Validation
Test Resource Partitioning
Test Standards
Testing High Speed Optics/Photonics
Timing Test
Yield Analysis and Optimization

Overview

This ranking presents a comprehensive evaluation of scientific conferences in the field of Computer Science, meticulously prepared by Research.com — a trusted authority providing data on scientific achievements across all major disciplines since 2014. With a longstanding reputation for delivering reliable and transparent insights, Research.com leverages its extensive experience to offer a definitive guide to the conferences that shape the landscape of Computer Science research.

Each conference’s position within the ranking is determined by a unique bibliometric score devised by Research.com. This metric incorporates the estimated h-index of conferences as well as the number of leading scientists who participated in these conferences over the past three years, reflecting both the impact and prestige of the venues. The Impact Score values in this edition were gathered as of 2024-11-27 to ensure relevance and accuracy.

The process underpinning these rankings entailed an exhaustive analysis, where more than 2,742 conferences were scrutinized. This selection was made after thorough inspection and rigorous review of over 148,739 scientific documents published in the most recent three-year period, collectively authored by 13,184 of the most prominent and respected scientists in the Computer Science community.

Readers interested in gaining deeper insight into the methodology behind the calculation of the ranking scores are encouraged to consult our Methodology Page, where each step of the process and the academic rigor applied are outlined in full detail.

Papers citation over time

A key indicator for each conference is its effectiveness in reaching other researchers with the papers published at that venue.

The chart below presents the interquartile range (first quartile 25%, median 50% and third quartile 75%) of the number of citations of articles over time.

The top authors publishing at International Test Conference (based on the number of publications) are:

  • Krishnendu Chakrabarty (7 papers) published 3 papers at the last edition, 1 more than at the previous edition,
  • Janusz Rajski (7 papers) published 1 paper at the last edition, 2 less than at the previous edition,
  • Abhijit Chatterjee (6 papers) published 2 papers at the last edition, 1 less than at the previous edition,
  • Yiorgos Makris (5 papers) published 2 papers at the last edition, 1 less than at the previous edition,
  • Nik Sumikawa (5 papers) published 1 paper at the last edition, 2 less than at the previous edition.

The overall trend for top authors publishing at this conference is outlined below. The chart shows the number of publications at each edition of the conference for top authors.

Only papers with recognized affiliations are considered

The top affiliations publishing at International Test Conference (based on the number of publications) are:

  • Kaunas University of Technology (26 papers) published 5 papers at the last edition, 6 less than at the previous edition,
  • Mentor Graphics (15 papers) published 4 papers at the last edition, 1 less than at the previous edition,
  • Texas Instruments (14 papers) published 8 papers at the last edition, 7 more than at the previous edition,
  • IBM (11 papers) published 6 papers at the last edition, 3 more than at the previous edition,
  • Georgia Institute of Technology (11 papers) published 4 papers at the last edition, 1 less than at the previous edition.

The overall trend for top affiliations publishing at this conference is outlined below. The chart shows the number of publications at each edition of the conference for top affiliations.

Publication chance based on affiliation

The publication chance index shows the ratio of articles published by the best research institutions at the conference edition to all articles published within that conference. The best research institutions were selected based on the largest number of articles published during all editions of the conference.

The chart below presents the percentage ratio of articles from top institutions (based on their ranking of total papers).Top affiliations were grouped by their rank into the following tiers: top 1-10, top 11-20, top 21-50, and top 51+. Only articles with a recognized affiliation are considered.

During the most recent 2014 edition, 5.26% of publications had an unrecognized affiliation. Out of the publications with recognized affiliations, 28.57% were posted by at least one author from the top 10 institutions publishing at the conference. Another 14.29% included authors affiliated with research institutions from the top 11-20 affiliations. Institutions from the 21-50 range included 19.05% of all publications and 38.10% were from other institutions.

Returning Authors Index

A very common phenomenon observed among researchers publishing scientific articles is the intentional selection of conferences they have already attended in the past. In particular, it is worth analyzing the case when the authors participate in the same conference from year to year.

The Returning Authors Index presented below illustrates the ratio of authors who participated in both a given as well as the previous edition of the conference in relation to all participants in a given year.

Returning Institution Index

The graph below shows the Returning Institution Index, illustrating the ratio of institutions that participated in both a given and the previous edition of the conference in relation to all affiliations present in a given year.

The experience to innovation index

Our experience to innovation index was created to show a cross-section of the experience level of authors publishing at a conference. The index includes the authors publishing at the last edition of a conference, grouped by total number of publications throughout their academic career (P) and the total number of citations of these publications ever received (C).

The group intervals were selected empirically to best show the diversity of the authors' experiences, their labels were selected as a convenience, not as judgment. The authors were divided into the following groups:

  • Novice - P < 5 or C < 25 (the number of publications less than 5 or the number of citations less than 25),
  • Competent - P < 10 or C < 100 (the number of publications less than 10 or the number of citations less than 100),
  • Experienced - P < 25 or C < 625 (the number of publications less than 25 or the number of citations less than 625),
  • Master - P < 50 or C < 2500 (the number of publications less than 50 or the number of citations less than 2500),
  • Star - P ≥ 50 and C ≥ 2500 (both the number of publications greater than 50 and the number of citations greater than 2500).

The chart below illustrates experience levels of first authors in cases of publications with multiple authors.

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