Ranking & Metrics Conference Call for Papers Other Conferences in United States
80th Device Research Conference

80th Device Research Conference

Columbus , United States

Submission Deadline: Monday 28 Feb 2022

Conference Dates: Jun 26, 2022 - Jun 29, 2022

Research
Impact Score 1.80

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Ranking & Metrics Impact Score is a novel metric devised to rank conferences based on the number of contributing the best scientists in addition to the h-index estimated from the scientific papers published by the best scientists. See more details on our methodology page.

Research Impact Score: 1.80
Contributing Best Scientists: 103
H5-index:
Papers published by Best Scientists 177
Research Ranking (Electronics and Electrical Engineering) 124
Research Ranking (Materials Science) 7
Research Ranking (Physics) 18

Conference Call for Papers

• Biological Devices
• Devices for Extreme
Conditions
• Heterogeneously
Integrated Devices
• Memory Devices
• Modeling and Simulation
of Devices
• Nanoscale and Vacuum
Devices
• Optoelectronic
and Optical Devices
• Other Emerging Devices
• Power Devices
• Quantum Devices
• RF and Terahertz Devices
• Spintronic and Magnetic
Devices
• Thin-film Devices
• Wide-bandgap Devices

Overview

Top Research Topics at Device Research Conference?

  • Optoelectronics (73.37%)
  • Transistor (20.84%)
  • Electrical engineering (18.94%)

Optoelectronics, Transistor, Electrical engineering, Electronic engineering and MOSFET are the subjects of interest in the conference. Optoelectronics research discussed connects with the study of Field-effect transistor. Field-effect transistor research featured in it incorporates concerns from various other topics such as Nanowire, Nanotechnology, Graphene and Band gap.

Topics in Transistor were tackled in line with various other fields like Wide-bandgap semiconductor, Semiconductor and Quantum tunnelling. Voltage, Logic gate, CMOS, Electronic circuit and Gate dielectric studies are all carried out as a component of the study in Electrical engineering presented. The study on Electronic engineering presented in it intersects with the topics under Thin-film transistor.

Device Research Conference explores issues in MOSFET which can be linked to other research areas like Electron mobility, Dielectric, Threshold voltage, Silicon on insulator and Gate oxide. The overlapping concepts between Bipolar junction transistor and Common emitter are the key highlights of Heterojunction study. Gallium arsenide studies tackled cover an aspect of the field of Optics.

What are the most cited papers published at the conference?

  • Epitaxial Graphene Transistors on SiC Substrates (380 citations)
  • 40-W/mm Double Field-plated GaN HEMTs (257 citations)
  • Sub-10 nm imprint lithography and applications (229 citations)

Research areas of the most cited articles at Device Research Conference:

The most cited papers facilitate discussions on Optoelectronics, Electrical engineering, Transistor, MOSFET and Electronic engineering. The most cited publications focus on Optoelectronics but the discussions also offer insight into other areas such as Field-effect transistor, Gallium nitride and Voltage. The works on Transistor tackled in the published papers bring together disciplines like Wafer, Breakdown voltage and Indium phosphide.

Papers citation over time

A key indicator for each conference is its effectiveness in reaching other researchers with the papers published at that venue.

The chart below presents the interquartile range (first quartile 25%, median 50% and third quartile 75%) of the number of citations of articles over time.

Research.com

The top authors publishing at Device Research Conference (based on the number of publications) are:

  • Umesh K. Mishra (53 papers) published 3 papers at the last edition the same number as at the previous edition,
  • Debdeep Jena (46 papers) published 7 papers at the last edition, 1 more than at the previous edition,
  • Suman Datta (37 papers) published 5 papers at the last edition, 1 more than at the previous edition,
  • Mark J. W. Rodwell (37 papers) published 2 papers at the last edition the same number as at the previous edition,
  • Thomas N. Jackson (31 papers) published 2 papers at the last edition, 1 more than at the previous edition.

The overall trend for top authors publishing at this conference is outlined below. The chart shows the number of publications at each edition of the conference for top authors.

Research.com

Only papers with recognized affiliations are considered

The top affiliations publishing at Device Research Conference (based on the number of publications) are:

  • Purdue University (132 papers) published 13 papers at the last edition, 4 more than at the previous edition,
  • IBM (117 papers) published 5 papers at the last edition, 1 more than at the previous edition,
  • University of California, Santa Barbara (115 papers) published 6 papers at the last edition, 1 less than at the previous edition,
  • University of Notre Dame (94 papers) published 8 papers at the last edition, 1 more than at the previous edition,
  • University of Texas at Austin (91 papers) published 5 papers at the last edition, 2 less than at the previous edition.

The overall trend for top affiliations publishing at this conference is outlined below. The chart shows the number of publications at each edition of the conference for top affiliations.

Research.com

Publication chance based on affiliation

The publication chance index shows the ratio of articles published by the best research institutions at the conference edition to all articles published within that conference. The best research institutions were selected based on the largest number of articles published during all editions of the conference.

The chart below presents the percentage ratio of articles from top institutions (based on their ranking of total papers).Top affiliations were grouped by their rank into the following tiers: top 1-10, top 11-20, top 21-50, and top 51+. Only articles with a recognized affiliation are considered.

Research.com

During the most recent 2017 edition, 1.80% of publications had an unrecognized affiliation. Out of the publications with recognized affiliations, 44.95% were posted by at least one author from the top 10 institutions publishing at the conference. Another 15.60% included authors affiliated with research institutions from the top 11-20 affiliations. Institutions from the 21-50 range included 10.09% of all publications and 29.36% were from other institutions.

Returning Authors Index

A very common phenomenon observed among researchers publishing scientific articles is the intentional selection of conferences they have already attended in the past. In particular, it is worth analyzing the case when the authors participate in the same conference from year to year.

The Returning Authors Index presented below illustrates the ratio of authors who participated in both a given as well as the previous edition of the conference in relation to all participants in a given year.

Research.com

Returning Institution Index

The graph below shows the Returning Institution Index, illustrating the ratio of institutions that participated in both a given and the previous edition of the conference in relation to all affiliations present in a given year.

Research.com

The experience to innovation index

Our experience to innovation index was created to show a cross-section of the experience level of authors publishing at a conference. The index includes the authors publishing at the last edition of a conference, grouped by total number of publications throughout their academic career (P) and the total number of citations of these publications ever received (C).

The group intervals were selected empirically to best show the diversity of the authors' experiences, their labels were selected as a convenience, not as judgment. The authors were divided into the following groups:

  • Novice - P < 5 or C < 25 (the number of publications less than 5 or the number of citations less than 25),
  • Competent - P < 10 or C < 100 (the number of publications less than 10 or the number of citations less than 100),
  • Experienced - P < 25 or C < 625 (the number of publications less than 25 or the number of citations less than 625),
  • Master - P < 50 or C < 2500 (the number of publications less than 50 or the number of citations less than 2500),
  • Star - P ≥ 50 and C ≥ 2500 (both the number of publications greater than 50 and the number of citations greater than 2500).

Research.com

The chart below illustrates experience levels of first authors in cases of publications with multiple authors.

Research.com

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Previous Editions

79th Device Research Conference

Jun 20, 2021 - Jun 23, 2021

Online, Online

80th Device Research Conference

Jun 26, 2022 - Jun 29, 2022

Columbus , United States, United States

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