Location: Nanjing , China
Submission deadline: 6/30/2022
Conference dates: 10/25/2022 - 10/28/2022
| Discipline name | Position | Best Scientists | Publications | D-Index |
|---|---|---|---|---|
| Materials Science | 46 | 52 | 67 | 4 |
| Electronics and Electrical Engineering | 371 | 69 | 131 | 5 |
| Engineering and Technology | 226 | 19 | 28 | 3 |
This ranking provides a comprehensive list of scientific conferences specializing in the field of Engineering and Technology. Compiled by Research.com—one of the leading platforms recognized for delivering reliable data and analysis in science research globally—the list reflects a decade-long commitment to providing accurate and trusted information on scientific contributions since 2014.
The position of each conference in this ranking is determined by a unique bibliometric score specifically developed by Research.com. This score is meticulously calculated using the estimated h-index of conferences and the number of leading scientists who have participated in each conference during the preceding three years. Such an approach ensures a balanced and robust evaluation of both scientific influence and expert engagement.
Impact Score values included in this ranking were collected as of 2024-11-27. The process of developing this ranking entailed a rigorous examination of more than 2,262 conferences, selected after a careful review and detailed analysis of over 26,934 scientific documents published within the last three years. These publications represent contributions from 9,385 distinguished and widely respected scientists in Engineering and Technology, further reinforcing the depth and reliability of the assessment.
For a comprehensive understanding of the methodology used to compute the ranking scores, including specific criteria and calculation details, we invite you to visit our Methodology Page.
A key indicator for each conference is its effectiveness in reaching other researchers with the papers published at that venue.
The chart below presents the interquartile range (first quartile 25%, median 50% and third quartile 75%) of the number of citations of articles over time.
The top authors publishing at IEEE International Conference on Solid-State and Integrated Circuit Technology (based on the number of publications) are:
The overall trend for top authors publishing at this conference is outlined below. The chart shows the number of publications at each edition of the conference for top authors.
Only papers with recognized affiliations are considered
The top affiliations publishing at IEEE International Conference on Solid-State and Integrated Circuit Technology (based on the number of publications) are:
The overall trend for top affiliations publishing at this conference is outlined below. The chart shows the number of publications at each edition of the conference for top affiliations.
The publication chance index shows the ratio of articles published by the best research institutions at the conference edition to all articles published within that conference. The best research institutions were selected based on the largest number of articles published during all editions of the conference.
The chart below presents the percentage ratio of articles from top institutions (based on their ranking of total papers).Top affiliations were grouped by their rank into the following tiers: top 1-10, top 11-20, top 21-50, and top 51+. Only articles with a recognized affiliation are considered.
During the most recent 2020 edition, 11.54% of publications had an unrecognized affiliation. Out of the publications with recognized affiliations, 66.40% were posted by at least one author from the top 10 institutions publishing at the conference. Another 17.39% included authors affiliated with research institutions from the top 11-20 affiliations. Institutions from the 21-50 range included 9.88% of all publications and 6.32% were from other institutions.
A very common phenomenon observed among researchers publishing scientific articles is the intentional selection of conferences they have already attended in the past. In particular, it is worth analyzing the case when the authors participate in the same conference from year to year.
The Returning Authors Index presented below illustrates the ratio of authors who participated in both a given as well as the previous edition of the conference in relation to all participants in a given year.
The graph below shows the Returning Institution Index, illustrating the ratio of institutions that participated in both a given and the previous edition of the conference in relation to all affiliations present in a given year.
Our experience to innovation index was created to show a cross-section of the experience level of authors publishing at a conference. The index includes the authors publishing at the last edition of a conference, grouped by total number of publications throughout their academic career (P) and the total number of citations of these publications ever received (C).
The group intervals were selected empirically to best show the diversity of the authors' experiences, their labels were selected as a convenience, not as judgment. The authors were divided into the following groups:
The chart below illustrates experience levels of first authors in cases of publications with multiple authors.
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University of Electronic Science and Technology of China
Peking University
Xidian University
Peking University
University of Kentucky
Peking University
Ghent University
Fudan University
Tsinghua University
Hong Kong University of Science and Technology
Tsinghua University
East China Normal University
