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Yossi Rosenwaks

Yossi Rosenwaks

D-Index & Metrics

Materials Science

D-Index
49
Citations
8731
World Ranking
10546
National Ranking
48

Overview

Yossi Rosenwaks is affiliated with Tel Aviv University in Israel and has contributed extensively to research in engineering and materials science. Their main fields of study include engineering with a focus on electrical and electronic engineering and biomedical engineering, as well as materials science encompassing materials chemistry.

Their research concentrates on several subfields, notably:

  • Electrical and Electronic Engineering
  • Biomedical Engineering
  • Materials Chemistry
  • Bioengineering
  • Atomic and Molecular Physics, and Optics

Key topics of their work cover:

  • Gas Sensing Nanomaterials and Sensors
  • Nanowire Synthesis and Applications
  • Analytical Chemistry and Sensors
  • Advancements in Semiconductor Devices and Circuit Design
  • Advanced Chemical Sensor Technologies
  • Fullerene Chemistry and Applications
  • Semiconductor materials and devices

Recent publications include:

  • Schottky Barrier Height and Image Force Lowering in Monolayer MoS2 Field Effect Transistors, 2020, Nanomaterials
  • Recent Advances in Silicon FET Devices for Gas and Volatile Organic Compound Sensing, 2021, Chemosensors
  • Gap state distribution and Fermi level pinning in monolayer to multilayer MoS2 field effect transistors, 2020, Nanoscale
  • Fullerene (C60) functionalized TiO2 nanotubes for conductometric sensing of formaldehyde, 2022, Sensors and Actuators B Chemical
  • Ultrasensitive hydrogen detection by electrostatically formed silicon nanowire decorated by palladium nanoparticles, 2021, Sensors and Actuators B Chemical

Frequent coauthors of Rosenwaks include Anwesha Mukherjee, Idan Shem Tov, A. Hazra, Ronen Dagan, and Zoe Mutsafi.

Their publications often appear in venues such as:

  • Sensors and Actuators B Chemical
  • Journal of Physics D Applied Physics
  • SSRN Electronic Journal
  • Nanomaterials
  • Chemosensors

Best Publications

  • Why Lead Methylammonium tri-IODIDE perovskite-based solar cells requires a mesoporous electron transporting scaffold (but not necessarily a hole conductor)

    Eran Edri;Saar Kirmayer;Alex Henning;Sabyasachi Mukhopadhyay

  • Why Lead Methylammonium Tri-Iodide Perovskite-Based Solar Cells Require a Mesoporous Electron Transporting Scaffold (but Not Necessarily a Hole Conductor)

    Eran Edri;Saar Kirmayer;Alex Henning;Sabyasachi Mukhopadhyay

  • Hot-carrier cooling in GaAs: Quantum wells versus bulk.

    Y Rosenwaks;MC Hanna;DH Levi;DM Szmyd

  • Kelvin probe force microscopy of semiconductor surface defects

    Y. Rosenwaks;R. Shikler;Th. Glatzel;S. Sadewasser

  • Direct determination of the hole density of states in undoped and doped amorphous organic films with high lateral resolution.

    O. Tal;Y. Rosenwaks;Y. Preezant;N. Tessler

  • Molecular Control over Semiconductor Surface Electronic Properties: Dicarboxylic Acids on CdTe, CdSe, GaAs, and InP

    R. Cohen;L. Kronik;A. Shanzer;David Cahen

  • Submicron ferroelectric domain structures tailored by high-voltage scanning probe microscopy

    G. Rosenman;P. Urenski;A. Agronin;Y. Rosenwaks

  • Yellow luminescence and related deep levels in unintentionally doped GaN films

    I. Shalish;L. Kronik;G. Segal;Y. Rosenwaks

  • Ferroelectric domain breakdown

    Michel Molotskii;Alex Agronin;Pavel Urenski;Maria Shvebelman

  • Measurement of active dopant distribution and diffusion in individual silicon nanowires.

    Elad Koren;Noel Berkovitch;Yossi Rosenwaks

  • Fabrication of a Photoelectronic Device by Direct Chemical Binding of the Photosynthetic Reaction Center Protein to Metal Surfaces

    Ludmila Frolov;Yossi Rosenwaks;Chanoch Carmeli;Itai Carmeli

  • The electronic structure of metal oxide/organo metal halide perovskite junctions in perovskite based solar cells.

    Alex Dymshits;Alex Henning;Gideon Segev;Yossi Rosenwaks

  • Dynamics of ferroelectric domain growth in the field of atomic force microscope

    A. Agronin;M. Molotskii;Y. Rosenwaks;G. Rosenman

  • Reconstruction of electrostatic force microscopy images

    E. Strassburg;A. Boag;Y. Rosenwaks

  • Nonuniform doping distribution along silicon nanowires measured by Kelvin probe force microscopy and scanning photocurrent microscopy

    E. Koren;Y. Rosenwaks;J. E. Allen;E. R. Hemesath

  • Obtaining Uniform Dopant Distributions in VLS-Grown Si Nanowires

    E. Koren;J. K. Hyun;U. Givan;E. R. Hemesath

  • Potential imaging of operating light-emitting devices using Kelvin force microscopy

    R. Shikler;T. Meoded;N. Fried;Y. Rosenwaks

  • Fermi level pinning by gap states in organic semiconductors.

    S. Yogev;R. Matsubara;M. Nakamura;U. Zschieschang

  • Kelvin probe force microscopy on III–V semiconductors: the effect of surface defects on the local work function

    Th. Glatzel;S. Sadewasser;R. Shikler;Y. Rosenwaks

  • Ferroelectric domain inversion: The role of humidity

    D. Dahan;M. Molotskii;G. Rosenman;Y. Rosenwaks

  • Resolution of Kelvin probe force microscopy in ultrahigh vacuum: comparison of experiment and simulation

    S. Sadewasser;Th. Glatzel;R. Shikler;Y. Rosenwaks

Frequent Co-Authors

Gil Rosenman
Gil Rosenman Tel Aviv University
Lincoln J. Lauhon
Lincoln J. Lauhon Northwestern University
Abraham Kribus
Abraham Kribus Tel Aviv University
Amir Boag
Amir Boag Tel Aviv University
Dan Huppert
Dan Huppert Tel Aviv University
Arthur J. Nozik
Arthur J. Nozik University of Colorado Boulder
Sascha Sadewasser
Sascha Sadewasser International Iberian Nanotechnology Laboratory
David Cahen
David Cahen Weizmann Institute of Science
Antoine Kahn
Antoine Kahn Princeton University
Nir Tessler
Nir Tessler Technion – Israel Institute of Technology

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