World's Best Scientists 2026 revealed!
Patrick Heymans

Patrick Heymans

D-Index & Metrics

Computer Science

D-Index
47
Citations
9110
World Ranking
6481
National Ranking
69

Patrick Heymans publication distribution in Computer Science in 2026

The chart shows the distribution of publications by all Research.com ranked scientists in the field of Computer Science in 2026. The highlighted bar marks where Patrick Heymans sits on this spectrum.

32–41 publications: 7 scientists 42–51 publications: 22 scientists 52–61 publications: 82 scientists 62–71 publications: 134 scientists 72–81 publications: 249 scientists 82–91 publications: 324 scientists 92–101 publications: 421 scientists 102–111 publications: 420 scientists 112–121 publications: 497 scientists 122–131 publications: 544 scientists 132–141 publications: 555 scientists 142–151 publications: 609 scientists 152–161 publications: 559 scientists 162–171 publications: 534 scientists 172–181 publications: 556 scientists 182–191 publications: 583 scientists 192–201 publications: 519 scientists 202–211 publications: 508 scientists 212–221 publications: 490 scientists 222–231 publications: 437 scientists 232–241 publications: 423 scientists 242–251 publications: 408 scientists 252–261 publications: 377 scientists 262–271 publications: 301 scientists 272–281 publications: 335 scientists 282–291 publications: 320 scientists 292–301 publications: 293 scientists 302–311 publications: 250 scientists 312–321 publications: 238 scientists 322–331 publications: 206 scientists 332–341 publications: 209 scientists 342–351 publications: 208 scientists 352–361 publications: 162 scientists 362–371 publications: 176 scientists 372–381 publications: 127 scientists 382–391 publications: 158 scientists 392–401 publications: 128 scientists 402–411 publications: 104 scientists 412–421 publications: 94 scientists 422–431 publications: 99 scientists 432–441 publications: 83 scientists 442–451 publications: 108 scientists 452–461 publications: 73 scientists 462–471 publications: 77 scientists 472–481 publications: 69 scientists 482–491 publications: 84 scientists 492–501 publications: 62 scientists 502–511 publications: 54 scientists 512–521 publications: 57 scientists 522–531 publications: 51 scientists 532–541 publications: 51 scientists 542–551 publications: 32 scientists 552–561 publications: 38 scientists 562–571 publications: 28 scientists 572–581 publications: 43 scientists 582–591 publications: 33 scientists 592–601 publications: 41 scientists 602–611 publications: 32 scientists 612–621 publications: 28 scientists 622–631 publications: 25 scientists 632–641 publications: 27 scientists 642–651 publications: 17 scientists 652–661 publications: 20 scientists 662–671 publications: 17 scientists 672–681 publications: 15 scientists 682–691 publications: 14 scientists 692–701 publications: 21 scientists 702–711 publications: 13 scientists 712–721 publications: 12 scientists 722–731 publications: 19 scientists 732–741 publications: 14 scientists 742–751 publications: 12 scientists 752–761 publications: 10 scientists 762–771 publications: 10 scientists 772–781 publications: 11 scientists 782–791 publications: 10 scientists 792–801 publications: 11 scientists 802–811 publications: 8 scientists 812–821 publications: 8 scientists 822–831 publications: 7 scientists 832–841 publications: 11 scientists 842–851 publications: 10 scientists 852–861 publications: 5 scientists 862–871 publications: 9 scientists 872–881 publications: 4 scientists 882–891 publications: 6 scientists 892–901 publications: 3 scientists 902–911 publications: 6 scientists 912–921 publications: 3 scientists 922–931 publications: 2 scientists 932–941 publications: 2 scientists 942–951 publications: 2 scientists 952–961 publications: 3 scientists 962–971 publications: 3 scientists 972–981 publications: 3 scientists 982–990 publications: 5 scientists 991+ publications: 100 scientists
32 publications 991+

This scientist: 217 publications — 52nd percentile

52% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 991 publications or more.

Patrick Heymans D-index placement in Computer Science in 2026

The chart shows the D-index (discipline H-index) distribution of Computer Science scientists ranked by Research.com in 2026. The highlighted bar marks where Patrick Heymans sits on this spectrum.

30–31 D-Index: 879 scientists 32–33 D-Index: 983 scientists 34–35 D-Index: 918 scientists 36–37 D-Index: 990 scientists 38–39 D-Index: 968 scientists 40–41 D-Index: 907 scientists 42–43 D-Index: 821 scientists 44–45 D-Index: 763 scientists 46–47 D-Index: 689 scientists 48–49 D-Index: 543 scientists 50–51 D-Index: 543 scientists 52–53 D-Index: 518 scientists 54–55 D-Index: 500 scientists 56–57 D-Index: 458 scientists 58–59 D-Index: 400 scientists 60–61 D-Index: 337 scientists 62–63 D-Index: 308 scientists 64–65 D-Index: 292 scientists 66–67 D-Index: 249 scientists 68–69 D-Index: 213 scientists 70–71 D-Index: 192 scientists 72–73 D-Index: 189 scientists 74–75 D-Index: 165 scientists 76–77 D-Index: 139 scientists 78–79 D-Index: 119 scientists 80–81 D-Index: 121 scientists 82–83 D-Index: 113 scientists 84–85 D-Index: 88 scientists 86–87 D-Index: 87 scientists 88–89 D-Index: 75 scientists 90–91 D-Index: 69 scientists 92–93 D-Index: 57 scientists 94–95 D-Index: 46 scientists 96–97 D-Index: 38 scientists 98–99 D-Index: 34 scientists 100–101 D-Index: 36 scientists 102–103 D-Index: 27 scientists 104–105 D-Index: 37 scientists 106–107 D-Index: 18 scientists 108–109 D-Index: 31 scientists 110–111 D-Index: 19 scientists 112–113 D-Index: 16 scientists 114–115 D-Index: 12 scientists 116–117 D-Index: 20 scientists 118–119 D-Index: 15 scientists 120–121 D-Index: 5 scientists 122–123 D-Index: 20 scientists 124–125 D-Index: 8 scientists 126–127 D-Index: 5 scientists 128–129 D-Index: 7 scientists 130 D-Index: 3 scientists 131+ D-Index: 98 scientists
30 D-Index 131+

This scientist: 47 D-Index — 56th percentile

56% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 131 D-Index or more.

Overview

Patrick Heymans is affiliated with the University of Namur in Belgium and has conducted research primarily in the field of Computer Science. Their work spans several subfields including Artificial Intelligence, Safety Research, Management of Technology and Innovation, Marketing, and Computer Networks and Communications.

The main topics of their research focus on Adversarial Robustness in Machine Learning, Ethics and Social Impacts of AI, Explainable Artificial Intelligence (XAI), Product Development and Customization, Quality Function Deployment in Product Design, Service and Product Innovation, and Software System Performance and Reliability.

Patrick Heymans has contributed to a number of recent academic publications, with notable papers including:

  • "Ethical Adversaries" (2021), published in ACM SIGKDD Explorations Newsletter
  • "Ethical Adversaries: Towards Mitigating Unfairness with Adversarial Machine Learning" (2020), published in arXiv (Cornell University)
  • "VaryMinions" (2022), published in Zenodo (CERN European Organization for Nuclear Research)
  • "VaryMinions" (2021), published in Zenodo (CERN European Organization for Nuclear Research)

Their frequent collaborators include Gilles Perrouin, Paul Temple, Sophie Fortz, Xavier Devroey, and Pieter Delobelle.

Patrick Heymans often publishes in venues such as Zenodo (CERN European Organization for Nuclear Research), arXiv (Cornell University), ACM SIGKDD Explorations Newsletter, Proceedings of the ACM on Human-Computer Interaction, and Empirical Software Engineering.

Best Publications

  • Feature Diagrams: A Survey and a Formal Semantics

    P.-Y. Schobbens;P. Heymans;J.-C. Trigaux

  • Generic semantics of feature diagrams

    Pierre-Yves Schobbens;Patrick Heymans;Jean-Christophe Trigaux;Yves Bontemps

  • Model checking lots of systems: efficient verification of temporal properties in software product lines

    Andreas Classen;Patrick Heymans;Pierre-Yves Schobbens;Axel Legay

  • A proposal for a scenario classification framework

    C. Rolland;C. Ben Achour;C. Cauvet;J. Ralyté

  • Disambiguating the Documentation of Variability in Software Product Lines: A Separation of Concerns, Formalization and Automated Analysis

    A. Metzger;P. Heymans;K. Pohl;P.-Y. Schobbens

  • Featured Transition Systems: Foundations for Verifying Variability-Intensive Systems and Their Application to LTL Model Checking

    A. Classen;M. Cordy;Pierre-Yves Schobbens;P. Heymans

  • Symbolic model checking of software product lines

    Andreas Classen;Patrick Heymans;Pierre-Yves Schobbens;Axel Legay

  • A text-based approach to feature modelling: Syntax and semantics of TVL

    Andreas Classen;Quentin Boucher;Patrick Heymans

  • Bypassing the Combinatorial Explosion: Using Similarity to Generate and Prioritize T-Wise Test Configurations for Software Product Lines

    Christopher Henard;Mike Papadakis;Gilles Perrouin;Jacques Klein

  • What's in a feature: a requirements engineering perspective

    Andreas Classen;Patrick Heymans;Pierre-Yves Schobbens

  • Analysing the cognitive effectiveness of the BPMN 2.0 visual notation

    Nicolas Genon;Patrick Heymans;Daniel Amyot

  • A Systematic Approach to Define the Domain of Information System Security Risk Management

    Éric Dubois;Patrick Heymans;Nicolas Mayer;Raimundas Matulevičius

  • On extracting feature models from product descriptions

    Mathieu Acher;Anthony Cleve;Gilles Perrouin;Patrick Heymans

  • Visual syntax does matter: improving the cognitive effectiveness of the i * visual notation

    Daniel L. Moody;Patrick Heymans;Raimundas Raimundas Matulevičius

  • Feature model extraction from large collections of informal product descriptions

    Jean-Marc Davril;Edouard Delfosse;Negar Hariri;Mathieu Acher

  • Model checking software product lines with SNIP

    Andreas Classen;Maxime Cordy;Patrick Heymans;Patrick Heymans;Axel Legay;Axel Legay

  • Improving the Effectiveness of Visual Representations in Requirements Engineering: An Evaluation of i* Visual Syntax

    Daniel Laurence Moody;Patrick Heymans;Raimundas Matulevicius

  • Beyond boolean product-line model checking: dealing with feature attributes and multi-features

    Maxime Cordy;Pierre-Yves Schobbens;Patrick Heymans;Axel Legay

  • Visual notation design 2.0: Towards user comprehensible requirements engineering notations

    Patrice Caire;Nicolas Genon;Patrick Heymans;Daniel L. Moody

  • Proceedings of the 2015 10th Joint Meeting on Foundations of Software Engineering

    Elisabetta Di Nitto;Mark Harman;Patrick Heymans

  • Semantics of FODA Feature Diagrams

    J Bosch;T Mannisto;Yves Bontemps;Patrick Heymans

Frequent Co-Authors

Axel Legay
Axel Legay Université Catholique de Louvain
Krzysztof Czarnecki
Krzysztof Czarnecki University of Waterloo
Mike Papadakis
Mike Papadakis University of Luxembourg
Klaus Pohl
Klaus Pohl University of Duisburg-Essen
Daniel Amyot
Daniel Amyot University of Ottawa
Benoit Baudry
Benoit Baudry University of Montreal
Jean-François Raskin
Jean-François Raskin Université Libre de Bruxelles
Yves Le Traon
Yves Le Traon University of Luxembourg
Neil Maiden
Neil Maiden City, University of London
Hervé Panetto
Hervé Panetto University of Lorraine

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