World's Best Scientists 2026 revealed!
Du-Ming Tsai

Du-Ming Tsai

D-Index & Metrics

Computer Science

D-Index
51
Citations
7698
World Ranking
5436
National Ranking
42

Du-Ming Tsai publication distribution in Computer Science in 2026

The chart shows the distribution of publications by all Research.com ranked scientists in the field of Computer Science in 2026. The highlighted bar marks where Du-Ming Tsai sits on this spectrum.

32–41 publications: 7 scientists 42–51 publications: 22 scientists 52–61 publications: 82 scientists 62–71 publications: 134 scientists 72–81 publications: 249 scientists 82–91 publications: 324 scientists 92–101 publications: 421 scientists 102–111 publications: 420 scientists 112–121 publications: 497 scientists 122–131 publications: 544 scientists 132–141 publications: 555 scientists 142–151 publications: 609 scientists 152–161 publications: 559 scientists 162–171 publications: 534 scientists 172–181 publications: 556 scientists 182–191 publications: 583 scientists 192–201 publications: 519 scientists 202–211 publications: 508 scientists 212–221 publications: 490 scientists 222–231 publications: 437 scientists 232–241 publications: 423 scientists 242–251 publications: 408 scientists 252–261 publications: 377 scientists 262–271 publications: 301 scientists 272–281 publications: 335 scientists 282–291 publications: 320 scientists 292–301 publications: 293 scientists 302–311 publications: 250 scientists 312–321 publications: 238 scientists 322–331 publications: 206 scientists 332–341 publications: 209 scientists 342–351 publications: 208 scientists 352–361 publications: 162 scientists 362–371 publications: 176 scientists 372–381 publications: 127 scientists 382–391 publications: 158 scientists 392–401 publications: 128 scientists 402–411 publications: 104 scientists 412–421 publications: 94 scientists 422–431 publications: 99 scientists 432–441 publications: 83 scientists 442–451 publications: 108 scientists 452–461 publications: 73 scientists 462–471 publications: 77 scientists 472–481 publications: 69 scientists 482–491 publications: 84 scientists 492–501 publications: 62 scientists 502–511 publications: 54 scientists 512–521 publications: 57 scientists 522–531 publications: 51 scientists 532–541 publications: 51 scientists 542–551 publications: 32 scientists 552–561 publications: 38 scientists 562–571 publications: 28 scientists 572–581 publications: 43 scientists 582–591 publications: 33 scientists 592–601 publications: 41 scientists 602–611 publications: 32 scientists 612–621 publications: 28 scientists 622–631 publications: 25 scientists 632–641 publications: 27 scientists 642–651 publications: 17 scientists 652–661 publications: 20 scientists 662–671 publications: 17 scientists 672–681 publications: 15 scientists 682–691 publications: 14 scientists 692–701 publications: 21 scientists 702–711 publications: 13 scientists 712–721 publications: 12 scientists 722–731 publications: 19 scientists 732–741 publications: 14 scientists 742–751 publications: 12 scientists 752–761 publications: 10 scientists 762–771 publications: 10 scientists 772–781 publications: 11 scientists 782–791 publications: 10 scientists 792–801 publications: 11 scientists 802–811 publications: 8 scientists 812–821 publications: 8 scientists 822–831 publications: 7 scientists 832–841 publications: 11 scientists 842–851 publications: 10 scientists 852–861 publications: 5 scientists 862–871 publications: 9 scientists 872–881 publications: 4 scientists 882–891 publications: 6 scientists 892–901 publications: 3 scientists 902–911 publications: 6 scientists 912–921 publications: 3 scientists 922–931 publications: 2 scientists 932–941 publications: 2 scientists 942–951 publications: 2 scientists 952–961 publications: 3 scientists 962–971 publications: 3 scientists 972–981 publications: 3 scientists 982–990 publications: 5 scientists 991+ publications: 100 scientists
32 publications 991+

This scientist: 127 publications — 17th percentile

17% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 991 publications or more.

Du-Ming Tsai D-index placement in Computer Science in 2026

The chart shows the D-index (discipline H-index) distribution of Computer Science scientists ranked by Research.com in 2026. The highlighted bar marks where Du-Ming Tsai sits on this spectrum.

30–31 D-Index: 879 scientists 32–33 D-Index: 983 scientists 34–35 D-Index: 918 scientists 36–37 D-Index: 990 scientists 38–39 D-Index: 968 scientists 40–41 D-Index: 907 scientists 42–43 D-Index: 821 scientists 44–45 D-Index: 763 scientists 46–47 D-Index: 689 scientists 48–49 D-Index: 543 scientists 50–51 D-Index: 543 scientists 52–53 D-Index: 518 scientists 54–55 D-Index: 500 scientists 56–57 D-Index: 458 scientists 58–59 D-Index: 400 scientists 60–61 D-Index: 337 scientists 62–63 D-Index: 308 scientists 64–65 D-Index: 292 scientists 66–67 D-Index: 249 scientists 68–69 D-Index: 213 scientists 70–71 D-Index: 192 scientists 72–73 D-Index: 189 scientists 74–75 D-Index: 165 scientists 76–77 D-Index: 139 scientists 78–79 D-Index: 119 scientists 80–81 D-Index: 121 scientists 82–83 D-Index: 113 scientists 84–85 D-Index: 88 scientists 86–87 D-Index: 87 scientists 88–89 D-Index: 75 scientists 90–91 D-Index: 69 scientists 92–93 D-Index: 57 scientists 94–95 D-Index: 46 scientists 96–97 D-Index: 38 scientists 98–99 D-Index: 34 scientists 100–101 D-Index: 36 scientists 102–103 D-Index: 27 scientists 104–105 D-Index: 37 scientists 106–107 D-Index: 18 scientists 108–109 D-Index: 31 scientists 110–111 D-Index: 19 scientists 112–113 D-Index: 16 scientists 114–115 D-Index: 12 scientists 116–117 D-Index: 20 scientists 118–119 D-Index: 15 scientists 120–121 D-Index: 5 scientists 122–123 D-Index: 20 scientists 124–125 D-Index: 8 scientists 126–127 D-Index: 5 scientists 128–129 D-Index: 7 scientists 130 D-Index: 3 scientists 131+ D-Index: 98 scientists
30 D-Index 131+

This scientist: 51 D-Index — 63rd percentile

63% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 131 D-Index or more.

Overview

Du-Ming Tsai is affiliated with Yuan Ze University in Taiwan. Their research primarily focuses on engineering and computer science, with notable contributions in industrial and manufacturing engineering, computer vision and pattern recognition, electrical and electronic engineering, statistics, probability and uncertainty, and control and systems engineering.

The main research topics covered by Du-Ming Tsai include:

  • Industrial Vision Systems and Defect Detection
  • Advanced Statistical Process Monitoring
  • Integrated Circuits and Semiconductor Failure Analysis
  • Image and Object Detection Techniques
  • Fault Detection and Control Systems
  • Robotics and Sensor-Based Localization
  • Image Processing Techniques and Applications

Du-Ming Tsai has published extensively in various academic journals. Frequent publication venues include:

  • IEEE Transactions on Automation Science and Engineering
  • IEEE Transactions on Semiconductor Manufacturing
  • IEEE Transactions on Components Packaging and Manufacturing Technology
  • Advanced Engineering Informatics
  • IEEE Transactions on Instrumentation and Measurement

Recent papers by Du-Ming Tsai showcase a focus on fault detection, surface defect inspection, and semiconductor manufacturing processes:

  • "Data-Driven Approach for Fault Detection and Diagnostic in Semiconductor Manufacturing," 2020, IEEE Transactions on Automation Science and Engineering
  • "Autoencoder-based anomaly detection for surface defect inspection," 2021, Advanced Engineering Informatics
  • "Auto-Annotated Deep Segmentation for Surface Defect Detection," 2021, IEEE Transactions on Instrumentation and Measurement
  • "Fault Diagnosis of Wafer Acceptance Test and Chip Probing Between Front-End-of-Line and Back-End-of-Line Processes," 2021, IEEE Transactions on Automation Science and Engineering
  • "Effective Variational-Autoencoder-Based Generative Models for Highly Imbalanced Fault Detection Data in Semiconductor Manufacturing," 2023, IEEE Transactions on Semiconductor Manufacturing

Collaboration is a notable aspect of Du-Ming Tsai's research activities. Frequent co-authors include Shu-Kai S. Fan, Chia-Yu Hsu, Carlos Andrés Peña Solórzano, Fei He, and Wei-Yao Chiu.

Best Publications

  • Independent Component Analysis-Based Background Subtraction for Indoor Surveillance

    Du-Ming Tsai;Shia-Chih Lai

  • Fast normalized cross correlation for defect detection

    Du-Ming Tsai;Chien-Ta Lin

  • Automated surface inspection for statistical textures

    Du-Ming Tsai;Tse-Yun Huang

  • Automated surface inspection for directional textures

    Du-Ming Tsai;C.-Y. Hsieh

  • A simulated annealing approach for optimization of multi-pass turning operations

    M.-C. Chen;D.-M. Tsai

  • Defect Detection in Solar Modules Using ICA Basis Images

    Du-Ming Tsai;Shih-Chieh Wu;Wei-Yao Chiu

  • Defect detection of solar cells in electroluminescence images using Fourier image reconstruction

    Du-Ming Tsai;Shih-Chieh Wu;Wei-Chen Li

  • A fast thresholding selection procedure for multimodal and unimodal histograms

    Du-Ming Tsai

  • An improved anisotropic diffusion model for detail- and edge-preserving smoothing

    Shin-Min Chao;Du-Ming Tsai

  • Optimal multi-thresholding using a hybrid optimization approach

    Erwie Zahara;Shu-Kai S. Fan;Du-Ming Tsai

  • Automatic defect inspection for LCDs using singular value decomposition

    Chi-Jie Lu;Du-Ming Tsai

  • Automatic surface inspection using wavelet reconstruction

    Du-Ming Tsai;Bo Hsiao

  • Rotation-invariant pattern matching using wavelet decomposition

    Du-Ming Tsai;Cheng-Huei Chiang

  • Boundary-based corner detection using eigenvalues of covariance matrices

    Du-Ming Tsai;H.-T. Hou;H.-J. Su

  • Data-Driven Approach for Fault Detection and Diagnostic in Semiconductor Manufacturing

    Shu-Kai S. Fan;Chia-Yu Hsu;Du-Ming Tsai;Fei He

  • Automatic band selection for wavelet reconstruction in the application of defect detection

    Du-Ming Tsai;Cheng-Huei Chiang

  • Fuzzy C-means based clustering for linearly and nonlinearly separable data

    Du-Ming Tsai;Chung-Chan Lin

  • The evaluation of normalized cross correlations for defect detection

    Du-Ming Tsai;Chien-Ta Lin;Jeng-Fung Chen

  • Wavelet-based defect detection in solar wafer images with inhomogeneous texture

    Wei-Chen Li;Du-Ming Tsai

  • Mean Shift-Based Defect Detection in Multicrystalline Solar Wafer Surfaces

    Du-Ming Tsai;Jie-Yu Luo

  • Micro-crack inspection in heterogeneously textured solar wafers using anisotropic diffusion

    Du-Ming Tsai;Chih-Chieh Chang;Shin-Min Chao

Frequent Co-Authors

Huei-Tse Hou
Huei-Tse Hou National Taiwan University of Science and Technology

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