2026 Du-Ming Tsai: Computer Science Researcher – H-Index, Publications & Awards

Discipline name	D-Index	World Ranking	National Ranking	Publications	Citations
Computer Science	51	5435	42	127	7698

Overview

Du-Ming Tsai is affiliated with Yuan Ze University in Taiwan. Their research primarily focuses on engineering and computer science, with notable contributions in industrial and manufacturing engineering, computer vision and pattern recognition, electrical and electronic engineering, statistics, probability and uncertainty, and control and systems engineering.

The main research topics covered by Du-Ming Tsai include:

Industrial Vision Systems and Defect Detection
Advanced Statistical Process Monitoring
Integrated Circuits and Semiconductor Failure Analysis
Image and Object Detection Techniques
Fault Detection and Control Systems
Robotics and Sensor-Based Localization
Image Processing Techniques and Applications

Du-Ming Tsai has published extensively in various academic journals. Frequent publication venues include:

IEEE Transactions on Automation Science and Engineering
IEEE Transactions on Semiconductor Manufacturing
IEEE Transactions on Components Packaging and Manufacturing Technology
Advanced Engineering Informatics
IEEE Transactions on Instrumentation and Measurement

Recent papers by Du-Ming Tsai showcase a focus on fault detection, surface defect inspection, and semiconductor manufacturing processes:

"Data-Driven Approach for Fault Detection and Diagnostic in Semiconductor Manufacturing," 2020, IEEE Transactions on Automation Science and Engineering
"Autoencoder-based anomaly detection for surface defect inspection," 2021, Advanced Engineering Informatics
"Auto-Annotated Deep Segmentation for Surface Defect Detection," 2021, IEEE Transactions on Instrumentation and Measurement
"Fault Diagnosis of Wafer Acceptance Test and Chip Probing Between Front-End-of-Line and Back-End-of-Line Processes," 2021, IEEE Transactions on Automation Science and Engineering
"Effective Variational-Autoencoder-Based Generative Models for Highly Imbalanced Fault Detection Data in Semiconductor Manufacturing," 2023, IEEE Transactions on Semiconductor Manufacturing

Collaboration is a notable aspect of Du-Ming Tsai's research activities. Frequent co-authors include Shu-Kai S. Fan, Chia-Yu Hsu, Carlos Andrés Peña Solórzano, Fei He, and Wei-Yao Chiu.

Best Publications

Independent Component Analysis-Based Background Subtraction for Indoor Surveillance

Du-Ming Tsai;Shia-Chih Lai

388
Citations
Fast normalized cross correlation for defect detection

Du-Ming Tsai;Chien-Ta Lin

371
Citations
Automated surface inspection for statistical textures

Du-Ming Tsai;Tse-Yun Huang

288
Citations
Automated surface inspection for directional textures

Du-Ming Tsai;C.-Y. Hsieh

284
Citations
A simulated annealing approach for optimization of multi-pass turning operations

M.-C. Chen;D.-M. Tsai

220
Citations
Defect Detection in Solar Modules Using ICA Basis Images

Du-Ming Tsai;Shih-Chieh Wu;Wei-Yao Chiu

219
Citations
Defect detection of solar cells in electroluminescence images using Fourier image reconstruction

Du-Ming Tsai;Shih-Chieh Wu;Wei-Chen Li

216
Citations
A fast thresholding selection procedure for multimodal and unimodal histograms

Du-Ming Tsai

215
Citations
An improved anisotropic diffusion model for detail- and edge-preserving smoothing

Shin-Min Chao;Du-Ming Tsai

213
Citations
Optimal multi-thresholding using a hybrid optimization approach

Erwie Zahara;Shu-Kai S. Fan;Du-Ming Tsai

206
Citations
Automatic defect inspection for LCDs using singular value decomposition

Chi-Jie Lu;Du-Ming Tsai

196
Citations
Automatic surface inspection using wavelet reconstruction

Du-Ming Tsai;Bo Hsiao

195
Citations
Rotation-invariant pattern matching using wavelet decomposition

Du-Ming Tsai;Cheng-Huei Chiang

178
Citations
Boundary-based corner detection using eigenvalues of covariance matrices

Du-Ming Tsai;H.-T. Hou;H.-J. Su

171
Citations
Data-Driven Approach for Fault Detection and Diagnostic in Semiconductor Manufacturing

Shu-Kai S. Fan;Chia-Yu Hsu;Du-Ming Tsai;Fei He

163
Citations
Automatic band selection for wavelet reconstruction in the application of defect detection

Du-Ming Tsai;Cheng-Huei Chiang

156
Citations
Fuzzy C-means based clustering for linearly and nonlinearly separable data

Du-Ming Tsai;Chung-Chan Lin

153
Citations
The evaluation of normalized cross correlations for defect detection

Du-Ming Tsai;Chien-Ta Lin;Jeng-Fung Chen

145
Citations
Wavelet-based defect detection in solar wafer images with inhomogeneous texture

Wei-Chen Li;Du-Ming Tsai

141
Citations
Mean Shift-Based Defect Detection in Multicrystalline Solar Wafer Surfaces

Du-Ming Tsai;Jie-Yu Luo

138
Citations
Micro-crack inspection in heterogeneously textured solar wafers using anisotropic diffusion

Du-Ming Tsai;Chih-Chieh Chang;Shin-Min Chao

118
Citations

Frequent Co-Authors

Huei-Tse Hou National Taiwan University of Science and Technology

External Links

Personal website of Du-Ming Tsai

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