World's Best Scientists 2026 revealed!

D-Index & Metrics

Electronics and Electrical Engineering

D-Index
76
Citations
19903
World Ranking
652
National Ranking
102

Gui Yun Tian publication distribution in Electronics and Electrical Engineering in 2026

The chart shows the distribution of publications by all Research.com ranked scientists in the field of Electronics and Electrical Engineering in 2026. The highlighted bar marks where Gui Yun Tian sits on this spectrum.

34–53 publications: 24 scientists 54–73 publications: 52 scientists 74–93 publications: 114 scientists 94–113 publications: 203 scientists 114–133 publications: 269 scientists 134–153 publications: 355 scientists 154–173 publications: 403 scientists 174–193 publications: 445 scientists 194–213 publications: 430 scientists 214–233 publications: 431 scientists 234–253 publications: 399 scientists 254–273 publications: 366 scientists 274–293 publications: 335 scientists 294–313 publications: 300 scientists 314–333 publications: 276 scientists 334–353 publications: 250 scientists 354–373 publications: 214 scientists 374–393 publications: 187 scientists 394–413 publications: 152 scientists 414–433 publications: 169 scientists 434–453 publications: 147 scientists 454–473 publications: 111 scientists 474–493 publications: 117 scientists 494–513 publications: 103 scientists 514–533 publications: 99 scientists 534–553 publications: 92 scientists 554–573 publications: 75 scientists 574–593 publications: 58 scientists 594–613 publications: 69 scientists 614–633 publications: 50 scientists 634–653 publications: 62 scientists 654–673 publications: 54 scientists 674–693 publications: 44 scientists 694–713 publications: 37 scientists 714–733 publications: 28 scientists 734–753 publications: 26 scientists 754–773 publications: 26 scientists 774–793 publications: 19 scientists 794–813 publications: 23 scientists 814–833 publications: 20 scientists 834–853 publications: 16 scientists 854–873 publications: 20 scientists 874–893 publications: 11 scientists 894–913 publications: 11 scientists 914–933 publications: 16 scientists 934–953 publications: 13 scientists 954–973 publications: 10 scientists 974–993 publications: 11 scientists 994–1,013 publications: 9 scientists 1,014–1,033 publications: 9 scientists 1,034–1,053 publications: 10 scientists 1,054–1,064 publications: 6 scientists 1,065+ publications: 99 scientists
34 publications 1,065+

This scientist: 512 publications — 85th percentile

85% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 1,065 publications or more.

Gui Yun Tian D-index placement in Electronics and Electrical Engineering in 2026

The chart shows the D-index (discipline H-index) distribution of Electronics and Electrical Engineering scientists ranked by Research.com in 2026. The highlighted bar marks where Gui Yun Tian sits on this spectrum.

30 D-Index: 178 scientists 31 D-Index: 257 scientists 32 D-Index: 263 scientists 33 D-Index: 262 scientists 34 D-Index: 244 scientists 35 D-Index: 236 scientists 36 D-Index: 211 scientists 37 D-Index: 220 scientists 38 D-Index: 214 scientists 39 D-Index: 214 scientists 40 D-Index: 205 scientists 41 D-Index: 187 scientists 42 D-Index: 194 scientists 43 D-Index: 201 scientists 44 D-Index: 155 scientists 45 D-Index: 189 scientists 46 D-Index: 148 scientists 47 D-Index: 160 scientists 48 D-Index: 134 scientists 49 D-Index: 130 scientists 50 D-Index: 141 scientists 51 D-Index: 156 scientists 52 D-Index: 108 scientists 53 D-Index: 130 scientists 54 D-Index: 112 scientists 55 D-Index: 97 scientists 56 D-Index: 111 scientists 57 D-Index: 102 scientists 58 D-Index: 108 scientists 59 D-Index: 120 scientists 60 D-Index: 103 scientists 61 D-Index: 93 scientists 62 D-Index: 92 scientists 63 D-Index: 74 scientists 64 D-Index: 77 scientists 65 D-Index: 73 scientists 66 D-Index: 64 scientists 67 D-Index: 69 scientists 68 D-Index: 60 scientists 69 D-Index: 39 scientists 70 D-Index: 57 scientists 71 D-Index: 59 scientists 72 D-Index: 46 scientists 73 D-Index: 49 scientists 74 D-Index: 38 scientists 75 D-Index: 35 scientists 76 D-Index: 32 scientists 77 D-Index: 35 scientists 78 D-Index: 31 scientists 79 D-Index: 22 scientists 80 D-Index: 34 scientists 81 D-Index: 31 scientists 82 D-Index: 34 scientists 83 D-Index: 23 scientists 84 D-Index: 18 scientists 85 D-Index: 30 scientists 86 D-Index: 19 scientists 87 D-Index: 19 scientists 88 D-Index: 20 scientists 89 D-Index: 8 scientists 90 D-Index: 17 scientists 91 D-Index: 7 scientists 92 D-Index: 14 scientists 93 D-Index: 9 scientists 94 D-Index: 15 scientists 95 D-Index: 10 scientists 96 D-Index: 12 scientists 97 D-Index: 10 scientists 98 D-Index: 10 scientists 99 D-Index: 12 scientists 100 D-Index: 16 scientists 101 D-Index: 5 scientists 102 D-Index: 7 scientists 103 D-Index: 7 scientists 104 D-Index: 8 scientists 105 D-Index: 9 scientists 106 D-Index: 13 scientists 107 D-Index: 4 scientists 108 D-Index: 5 scientists 109 D-Index: 10 scientists 110 D-Index: 8 scientists 111+ D-Index: 96 scientists
30 D-Index 111+

This scientist: 76 D-Index — 91st percentile

91% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 111 D-Index or more.

Overview

Gui Yun Tian is a researcher affiliated with Newcastle University in the United Kingdom. Their work is situated primarily within the field of engineering, with a focus on mechanical engineering and the mechanics of materials. They have significant involvement in electrical and electronic engineering, as well as computer networks and communications and ocean engineering.

The primary research topics Gui Yun Tian has contributed to include non-destructive testing techniques, ultrasonics and acoustic wave propagation, welding techniques and residual stresses, thermography and photoacoustic techniques, geophysical methods and applications, structural health monitoring techniques, and sensor technology and measurement systems.

Gui Yun Tian has authored and co-authored numerous papers, with selected recent publications including:

  • Pipeline In-Line Inspection Method, Instrumentation and Data Management, 2021, Sensors
  • An Intrusion Detection System Against DDoS Attacks in IoT Networks, 2020, 10th Annual Computing and Communication Workshop and Conference (CCWC)
  • Multi-objective-based feature selection for DDoS attack detection in IoT networks, 2020, IET Networks
  • A Deep Learning-Based Ultrasonic Pattern Recognition Method for Inspecting Girth Weld Cracking of Gas Pipeline, 2020, IEEE Sensors Journal
  • Investigation of DC Electromagnetic-Based Motion Induced Eddy Current on NDT for Crack Detection, 2021, IEEE Sensors Journal

In terms of publication venues, Gui Yun Tian frequently publishes in:

  • IEEE Sensors Journal
  • NDT & E International
  • Sensors
  • IEEE Transactions on Instrumentation and Measurement
  • Nondestructive Testing And Evaluation

Gui Yun Tian has collaborated extensively with a number of co-authors, including:

  • Bin Gao
  • Qiuping Ma
  • Changrong Yang
  • Xiaolong Lu
  • Mark Robinson

Best Publications

  • A FEATURE EXTRACTION TECHNIQUE BASED ON PRINCIPAL COMPONENT ANALYSIS FOR PULSED EDDY CURRENT NDT

    Ali Sophian;Gui Yun Tian;David Taylor;John Rudlin

  • Structural Health Monitoring Framework Based on Internet of Things: A Survey

    C. Arcadius Tokognon;Bin Gao;Gui Yun Tian;Yan Yan

  • A Review of Passive RFID Tag Antenna-Based Sensors and Systems for Structural Health Monitoring Applications

    Jun Zhang;Gui Yun Tian;Gui Yun Tian;Adi M J Marindra;Ali Imam Sunny

  • Deep Learning Models for Cyber Security in IoT Networks

    Monika Roopak;Gui Yun Tian;Jonathon Chambers

  • Pulsed Eddy Current Non-destructive Testing and Evaluation: A Review

    Ali Sophian;Gui Yun Tian;Gui Yun Tian;Mengbao Fan

  • DEFECT CLASSIFICATION USING A NEW FEATURE FOR PULSED EDDY CURRENT SENSORS

    Gui Yun Tian;Ali Sophian

  • Residual magnetic field sensing for stress measurement

    John W. Wilson;Gui Yun Tian;Simon Barrans

  • A review of optical NDT technologies.

    Yong-Kai Zhu;Gui Yun Tian;Rong-Sheng Lu;Hong-Hong Zhang

  • Reduction of lift-off effects for pulsed eddy current NDT

    Gui Yun Tian;Ali Sophian

  • Illuminant and device invariant colour using histogram equalisation

    Graham D. Finlayson;Steven D. Hordley;Gerald Schaefer;Gui Yun Tian

  • Surface Crack Detection for Carbon Fiber Reinforced Plastic (CFRP) Materials Using Pulsed Eddy Current Thermography

    Liang Cheng;Gui Yun Tian

  • Electromagnetic and Eddy Current NDT: A Review

    GY Tian;A Sophian;D Taylor;J Rudlin

  • Steel Corrosion Characterization Using Pulsed Eddy Current Systems

    Yunze He;Guiyun Tian;Hong Zhang;M. Alamin

  • Multiple sensors on pulsed eddy-current detection for 3-D subsurface crack assessment

    G.Y. Tian;A. Sophian;D. Taylor;J. Rudlin

  • Design of a pulsed eddy current sensor for detection of defects in aircraft lap-joints

    Ali Sophian;Gui Yun Tian;David Taylor;John Rudlin

  • Experiment and simulation study of 3D magnetic field sensing for magnetic flux leakage defect characterisation

    Yong Li;John Wilson;Gui Yun Tian

  • Chipless RFID Sensor Tag for Metal Crack Detection and Characterization

    Adi Mahmud Jaya Marindra;Gui Yun Tian

  • Numerical simulation on magnetic flux leakage evaluation at high speed

    Yong Li;Gui Yun Tian;Steve Ward

  • The research of inhomogeneity in eddy current sensors

    G.Y. Tian;Z.X. Zhao;R.W. Baines

  • State Detection of Bond Wires in IGBT Modules Using Eddy Current Pulsed Thermography

    Kongjing Li;Gui Yun Tian;Liang Cheng;Aijun Yin

  • Feature extraction and selection for defect classification of pulsed eddy current NDT

    Tianlu Chen;Tianlu Chen;Gui Yun Tian;Ali Sophian;Pei Wen Que

  • Multiple sensors on pulsed eddy current detection for 3D subsurface crack assessment

    GY Tian;A Sophian;D Taylor;J Rudlin

Frequent Co-Authors

Wai Lok Woo
Wai Lok Woo Northumbria University
Yunze He
Yunze He Hunan University
Steve Dixon
Steve Dixon University of Warwick
Darryl P Almond
Darryl P Almond University of Bath
Graham D. Finlayson
Graham D. Finlayson University of East Anglia
Wenping Cao
Wenping Cao Anhui University
Zhiguo Ding
Zhiguo Ding Nanyang Technological University
Kanapathippillai Cumanan
Kanapathippillai Cumanan University of York
Yihua Hu
Yihua Hu University of York
Philip J. Withers
Philip J. Withers University of Manchester

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