The chart shows the distribution of publications by all Research.com ranked scientists in the field of Materials Science in 2026. The highlighted bar marks where Thomas R. Bieler sits on this spectrum.
This scientist: 323 publications — 65th percentile
65% of scientists in this discipline score the same or lower.
The last bar groups every scientist with 1,163 publications or more.
The chart shows the D-index (discipline H-index) distribution of Materials Science scientists ranked by Research.com in 2026. The highlighted bar marks where Thomas R. Bieler sits on this spectrum.
This scientist: 66 D-Index — 59th percentile
59% of scientists in this discipline score the same or lower.
The last bar groups every scientist with 165 D-Index or more.
Thomas R. Bieler is affiliated with Michigan State University in the United States. Their research spans multiple fields, primarily concentrated in engineering and materials science. Within these broad disciplines, Bieler's work focuses on specific subfields such as materials chemistry, mechanical engineering, mechanics of materials, aerospace engineering, and condensed matter physics.
The scientist's research topics include:
Bieler's recent publications cover detailed investigative studies on the relationships between microstructure and mechanical behavior of various metals and alloys. Notable papers include:
Frequent co-authors who collaborated on multiple works include Philip Eisenlohr, Jiawei Lu, Ryan Khawarizmi, Patrick Kwon, and J.M. Molina-Aldareguía.
The main publication venues for Bieler's research are diverse, reflecting the interdisciplinary nature of their work. These venues include:
Franz Roters;Philip Eisenlohr;Luc Hantcherli;Denny Dharmawan Tjahjanto
S.L Semiatin;T.R Bieler
T. R. Bieler;T. R. Bieler;P. Eisenlohr;F. Roters;D. Kumar
T.R. Bieler;Hairong Jiang;L.P. Lehman;T. Kirkpatrick
T. R. Bieler;P. Eisenlohr;P. Eisenlohr;Chun Zhang;H. J. Phukan
R.S. Mishra;T.R. Bieler;A.K. Mukherjee
L. Wang;Y. Yang;P. Eisenlohr;T. R. Bieler
Thomas R Bieler;S.L Semiatin
Franz Roters;Philip Eisenlohr;Thomas R. Bieler;Dierk Raabe
H. Li;D.E. Mason;T.R. Bieler;C.J. Boehlert
L. Zeng;T.R. Bieler
S. Choi;T. R. Bieler;J. P. Lucas;K. N. Subramanian
L. Wang;L. Wang;Z. Zheng;H. Phukan;P. Kenesei
L.P. Lehman;Y. Xing;T.R. Bieler;E.J. Cotts
Claudio Zambaldi;Yiyi Yang;Thomas R. Bieler;Dierk Raabe
L. Wang;P. Eisenlohr;Y. Yang;T. R. Bieler
S. L. Semiatin;T. R. Bieler
A. U. Telang;T. R. Bieler;J. P. Lucas;K. N. Subramanian
T.R. Bieler;T.R. Bieler;R. Alizadeh;M. Peña-Ortega;J. Llorca;J. Llorca
R.M. Miller;T.R. Bieler;S.L. Semiatin
A. K. Mukherjee;T. R. Bieler;A. H. Chokshi
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