D-Index & Metrics Best Publications

D-Index & Metrics D-index (Discipline H-index) only includes papers and citation values for an examined discipline in contrast to General H-index which accounts for publications across all disciplines.

Discipline name D-index D-index (Discipline H-index) only includes papers and citation values for an examined discipline in contrast to General H-index which accounts for publications across all disciplines. Citations Publications World Ranking National Ranking
Engineering and Technology D-index 35 Citations 5,373 50 World Ranking 5290 National Ranking 1680

Overview

What is he best known for?

The fields of study he is best known for:

  • Optics
  • Semiconductor
  • Optoelectronics

Stephen C. Minne focuses on Cantilever, Non-contact atomic force microscopy, Optoelectronics, Actuator and Bandwidth. Stephen C. Minne performs integrative Cantilever and Atomic force acoustic microscopy research in his work. His work in Optoelectronics covers topics such as Nanotechnology which are related to areas like Conductive atomic force microscopy.

His Actuator study integrates concerns from other disciplines, such as Step response, Piezoresistive effect and Integrated circuit. Stephen C. Minne has included themes like Piezoelectricity, Amplifier and Deflection in his Piezoresistive effect study. His study in Bandwidth is interdisciplinary in nature, drawing from both Transfer function, Feedback loop and Transient response.

His most cited work include:

  • Parallel atomic force microscopy using cantilevers with integrated piezoresistive sensors and integrated piezoelectric actuators (393 citations)
  • AUTOMATED PARALLEL HIGH-SPEED ATOMIC FORCE MICROSCOPY (223 citations)
  • High-speed tapping mode imaging with active Q control for atomic force microscopy (198 citations)

What are the main themes of his work throughout his whole career to date?

His primary areas of study are Cantilever, Optoelectronics, Optics, Non-contact atomic force microscopy and Actuator. His Cantilever study combines topics in areas such as Piezoelectricity, Piezoresistive effect, Scanning probe microscopy and Deflection. His work deals with themes such as Etching, Substrate and Nanotechnology, which intersect with Optoelectronics.

Stephen C. Minne focuses mostly in the field of Non-contact atomic force microscopy, narrowing it down to topics relating to Tapping and, in certain cases, Amplitude. His studies in Actuator integrate themes in fields like Feedback loop and Bandwidth. His Conductive atomic force microscopy research incorporates elements of Electrostatic force microscope and Kelvin probe force microscope.

He most often published in these fields:

  • Cantilever (65.52%)
  • Optoelectronics (50.00%)
  • Optics (34.48%)

What were the highlights of his more recent work (between 2001-2016)?

  • Cantilever (65.52%)
  • Optoelectronics (50.00%)
  • Silicon (24.14%)

In recent papers he was focusing on the following fields of study:

Stephen C. Minne mainly investigates Cantilever, Optoelectronics, Silicon, Nanotechnology and Actuator. His Cantilever study incorporates themes from Piezoelectricity and Non-contact atomic force microscopy. Stephen C. Minne combines subjects such as Self sensing and Amplitude with his study of Piezoelectricity.

Stephen C. Minne merges Non-contact atomic force microscopy with Atomic force acoustic microscopy in his study. The various areas that he examines in his Silicon study include Electrolyte and Passivation. Stephen C. Minne has researched Actuator in several fields, including Microscope, Piezoresistive effect, Scanning probe microscopy and Bandwidth.

Between 2001 and 2016, his most popular works were:

  • Characterization and optimization of scan speed for tapping-mode atomic force microscopy (119 citations)
  • Mercury vapor detection with a self-sensing, resonating piezoelectric cantilever (84 citations)
  • In Situ Atomic Force Microscopy Study of Initial Solid Electrolyte Interphase Formation on Silicon Electrodes for Li-Ion Batteries (75 citations)

In his most recent research, the most cited papers focused on:

  • Optics
  • Semiconductor
  • Laser

Cantilever, In situ atomic force microscopy, Interphase, Analytical chemistry and Electrolyte are his primary areas of study. His Cantilever research includes themes of Actuator, Bandwidth, Step response, Feedback loop and Transient response. His In situ atomic force microscopy research is multidisciplinary, relying on both Passivation and Silicon.

This overview was generated by a machine learning system which analysed the scientist’s body of work. If you have any feedback, you can contact us here.

Best Publications

Parallel atomic force microscopy using cantilevers with integrated piezoresistive sensors and integrated piezoelectric actuators

S. C. Minne;S. R. Manalis;C. F. Quate.
Applied Physics Letters (1995)

609 Citations

AUTOMATED PARALLEL HIGH-SPEED ATOMIC FORCE MICROSCOPY

S. C. Minne;G. Yaralioglu;S. R. Manalis;J. D. Adams.
Applied Physics Letters (1998)

326 Citations

Fabrication of 0.1 μm metal oxide semiconductor field‐effect transistors with the atomic force microscope

S. C. Minne;H. T. Soh;Ph. Flueckiger;C. F. Quate.
Applied Physics Letters (1995)

290 Citations

Centimeter scale atomic force microscope imaging and lithography

S. C. Minne;J. D. Adams;G. Yaralioglu;S. R. Manalis.
Applied Physics Letters (1998)

280 Citations

High-speed tapping mode imaging with active Q control for atomic force microscopy

T. Sulchek;R. Hsieh;J. D. Adams;G. G. Yaralioglu.
Applied Physics Letters (2000)

275 Citations

Terabit-per-square-inch data storage with the atomic force microscope

E. B. Cooper;S. R. Manalis;H. Fang;H. Dai.
Applied Physics Letters (1999)

258 Citations

Near-field photolithography with a solid immersion lens

L. P. Ghislain;V. B. Elings;K. B. Crozier;S. R. Manalis.
Applied Physics Letters (1999)

222 Citations

Atomic force microscopy for high speed imaging using cantilevers with an integrated actuator and sensor

S. R. Manalis;S. C. Minne;C. F. Quate.
Applied Physics Letters (1996)

202 Citations

Interdigital cantilevers for atomic force microscopy

S. R. Manalis;S. C. Minne;A. Atalar;C. F. Quate.
Applied Physics Letters (1996)

189 Citations

Characterization and optimization of scan speed for tapping-mode atomic force microscopy

T. Sulchek;G. G. Yaralioglu;C. F. Quate;S. C. Minne.
Review of Scientific Instruments (2002)

176 Citations

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