World's Best Scientists 2026 revealed!

D-Index & Metrics

Engineering and Technology

D-Index
36
Citations
5644
World Ranking
8676
National Ranking
2408

Overview

Stephen C. Minne is affiliated with True Digital Surgery in the United States. Their professional focus is clearly anchored in digital and surgical technologies, though specific details on their research topics and publications remain limited.

There are no recent papers recorded for Stephen C. Minne, nor is there information regarding frequent co-authors or publication venues, which suggests either an emerging research profile or a focus outside traditional academic publishing frameworks.

Additionally, there are no recorded book publications linked to Stephen C. Minne, indicating an emphasis on other forms of academic or professional output.

The data does not list main fields of study, subfields, or main topics of work associated with Stephen C. Minne. This absence of detailed research categorization could imply a multidisciplinary approach or work primarily within applied or industry-driven settings.

There are also no awards noted for this individual, which may reflect the current stage of their career or the nature of their contributions.

Best Publications

  • Parallel atomic force microscopy using cantilevers with integrated piezoresistive sensors and integrated piezoelectric actuators

    S. C. Minne;S. R. Manalis;C. F. Quate

  • AUTOMATED PARALLEL HIGH-SPEED ATOMIC FORCE MICROSCOPY

    S. C. Minne;G. Yaralioglu;S. R. Manalis;J. D. Adams

  • Fabrication of 0.1 μm metal oxide semiconductor field‐effect transistors with the atomic force microscope

    S. C. Minne;H. T. Soh;Ph. Flueckiger;C. F. Quate

  • High-speed tapping mode imaging with active Q control for atomic force microscopy

    T. Sulchek;R. Hsieh;J. D. Adams;G. G. Yaralioglu

  • Centimeter scale atomic force microscope imaging and lithography

    S. C. Minne;J. D. Adams;G. Yaralioglu;S. R. Manalis

  • Terabit-per-square-inch data storage with the atomic force microscope

    E. B. Cooper;S. R. Manalis;H. Fang;H. Dai

  • Near-field photolithography with a solid immersion lens

    L. P. Ghislain;V. B. Elings;K. B. Crozier;S. R. Manalis

  • Atomic force microscopy for high speed imaging using cantilevers with an integrated actuator and sensor

    S. R. Manalis;S. C. Minne;C. F. Quate

  • Interdigital cantilevers for atomic force microscopy

    S. R. Manalis;S. C. Minne;A. Atalar;C. F. Quate

  • Characterization and optimization of scan speed for tapping-mode atomic force microscopy

    T. Sulchek;G. G. Yaralioglu;C. F. Quate;S. C. Minne

  • Direct DNA sequencing with a transcription protein and a nanometer scale electrometer

    Scott R. Manalis;Stephen C. Minne;Calvin F. Quate

  • Atomic force microscope lithography using amorphous silicon as a resist and advances in parallel operation

    S. C. Minne;Ph. Flueckiger;H. T. Soh;C. F. Quate

  • In Situ Atomic Force Microscopy Study of Initial Solid Electrolyte Interphase Formation on Silicon Electrodes for Li-Ion Batteries

    Anton Tokranov;Brian W. Sheldon;Chunzeng Li;Stephen Minne

  • High-speed atomic force microscopy in liquid

    T. Sulchek;R. Hsieh;J. D. Adams;S. C. Minne

  • Mercury vapor detection with a self-sensing, resonating piezoelectric cantilever

    B. Rogers;L. Manning;M. Jones;T. Sulchek

  • Method of performing lithography using cantilever array

    Calvin F. Quate;Stephen Charles Minne

  • Independent parallel lithography using the atomic force microscope

    S. C. Minne;S. R. Manalis;Abdullah Atalar;C. F. Quate

  • Two-dimensional micromechanical bimorph arrays for detection of thermal radiation

    S. R. Manalis;S. C. Minne;C. F. Quate;G. G. Yaralioglu

  • Atomic force microscope for high speed imaging including integral actuator and sensor

    Stephen Charles Minne;Calvin F. Quate;Scott Manalis

  • Control and Optimization of the Electrochemical and Mechanical Properties of the Solid Electrolyte Interphase on Silicon Electrodes in Lithium Ion Batteries

    Anton Tokranov;Ravi Kumar;Chunzeng Li;Stephen Minne

  • Dual integrated actuators for extended range high speed atomic force microscopy

    T. Sulchek;S. C. Minne;J. D. Adams;D. A. Fletcher

Frequent Co-Authors

Calvin F. Quate
Calvin F. Quate Stanford University
Abdullah Atalar
Abdullah Atalar Bilkent University
Goksen G. Yaralioglu
Goksen G. Yaralioglu Özyeğin University
Kenneth B. Crozier
Kenneth B. Crozier University of Melbourne
Hongjie Dai
Hongjie Dai University of Hong Kong
Xingcheng Xiao
Xingcheng Xiao General Motors (United States)
Fahrettin Levent Degertekin
Fahrettin Levent Degertekin Georgia Institute of Technology
Brian W. Sheldon
Brian W. Sheldon Brown University
Thomas Thundat
Thomas Thundat University at Buffalo, State University of New York

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