Stephen C. Minne focuses on Cantilever, Non-contact atomic force microscopy, Optoelectronics, Actuator and Bandwidth. Stephen C. Minne performs integrative Cantilever and Atomic force acoustic microscopy research in his work. His work in Optoelectronics covers topics such as Nanotechnology which are related to areas like Conductive atomic force microscopy.
His Actuator study integrates concerns from other disciplines, such as Step response, Piezoresistive effect and Integrated circuit. Stephen C. Minne has included themes like Piezoelectricity, Amplifier and Deflection in his Piezoresistive effect study. His study in Bandwidth is interdisciplinary in nature, drawing from both Transfer function, Feedback loop and Transient response.
His primary areas of study are Cantilever, Optoelectronics, Optics, Non-contact atomic force microscopy and Actuator. His Cantilever study combines topics in areas such as Piezoelectricity, Piezoresistive effect, Scanning probe microscopy and Deflection. His work deals with themes such as Etching, Substrate and Nanotechnology, which intersect with Optoelectronics.
Stephen C. Minne focuses mostly in the field of Non-contact atomic force microscopy, narrowing it down to topics relating to Tapping and, in certain cases, Amplitude. His studies in Actuator integrate themes in fields like Feedback loop and Bandwidth. His Conductive atomic force microscopy research incorporates elements of Electrostatic force microscope and Kelvin probe force microscope.
Stephen C. Minne mainly investigates Cantilever, Optoelectronics, Silicon, Nanotechnology and Actuator. His Cantilever study incorporates themes from Piezoelectricity and Non-contact atomic force microscopy. Stephen C. Minne combines subjects such as Self sensing and Amplitude with his study of Piezoelectricity.
Stephen C. Minne merges Non-contact atomic force microscopy with Atomic force acoustic microscopy in his study. The various areas that he examines in his Silicon study include Electrolyte and Passivation. Stephen C. Minne has researched Actuator in several fields, including Microscope, Piezoresistive effect, Scanning probe microscopy and Bandwidth.
Cantilever, In situ atomic force microscopy, Interphase, Analytical chemistry and Electrolyte are his primary areas of study. His Cantilever research includes themes of Actuator, Bandwidth, Step response, Feedback loop and Transient response. His In situ atomic force microscopy research is multidisciplinary, relying on both Passivation and Silicon.
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Parallel atomic force microscopy using cantilevers with integrated piezoresistive sensors and integrated piezoelectric actuators
S. C. Minne;S. R. Manalis;C. F. Quate.
Applied Physics Letters (1995)
AUTOMATED PARALLEL HIGH-SPEED ATOMIC FORCE MICROSCOPY
S. C. Minne;G. Yaralioglu;S. R. Manalis;J. D. Adams.
Applied Physics Letters (1998)
Fabrication of 0.1 μm metal oxide semiconductor field‐effect transistors with the atomic force microscope
S. C. Minne;H. T. Soh;Ph. Flueckiger;C. F. Quate.
Applied Physics Letters (1995)
Centimeter scale atomic force microscope imaging and lithography
S. C. Minne;J. D. Adams;G. Yaralioglu;S. R. Manalis.
Applied Physics Letters (1998)
High-speed tapping mode imaging with active Q control for atomic force microscopy
T. Sulchek;R. Hsieh;J. D. Adams;G. G. Yaralioglu.
Applied Physics Letters (2000)
Terabit-per-square-inch data storage with the atomic force microscope
E. B. Cooper;S. R. Manalis;H. Fang;H. Dai.
Applied Physics Letters (1999)
Near-field photolithography with a solid immersion lens
L. P. Ghislain;V. B. Elings;K. B. Crozier;S. R. Manalis.
Applied Physics Letters (1999)
Atomic force microscopy for high speed imaging using cantilevers with an integrated actuator and sensor
S. R. Manalis;S. C. Minne;C. F. Quate.
Applied Physics Letters (1996)
Interdigital cantilevers for atomic force microscopy
S. R. Manalis;S. C. Minne;A. Atalar;C. F. Quate.
Applied Physics Letters (1996)
Characterization and optimization of scan speed for tapping-mode atomic force microscopy
T. Sulchek;G. G. Yaralioglu;C. F. Quate;S. C. Minne.
Review of Scientific Instruments (2002)
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