The chart shows the distribution of publications by all Research.com ranked scientists in the field of Computer Science in 2026. The highlighted bar marks where Jonathan H. Connell sits on this spectrum.
This scientist: 165 publications — 33rd percentile
33% of scientists in this discipline score the same or lower.
The last bar groups every scientist with 991 publications or more.
The chart shows the D-index (discipline H-index) distribution of Computer Science scientists ranked by Research.com in 2026. The highlighted bar marks where Jonathan H. Connell sits on this spectrum.
This scientist: 55 D-Index — 71st percentile
71% of scientists in this discipline score the same or lower.
The last bar groups every scientist with 131 D-Index or more.
Jonathan H. Connell is affiliated with IBM in the United States. Their professional work and research are primarily situated within this organization, representing a strong connection to the technological and industrial sector.
In 2013, Jonathan H. Connell was recognized as an IEEE Fellow. This distinction was awarded for contributions to security and privacy in biometrics, indicating a focus on enhancing the safety and confidentiality of biometric systems within their research scope.
There is limited public information available regarding Jonathan H. Connell's recent papers, coauthors, publication venues, book publications, or specific fields and subfields of study. No records exist for recent publications or frequent collaborators, nor is there data on main topics or specialized research areas beyond the award citation context.
The emphasis on biometrics security and privacy suggests involvement with topics such as identity verification, data protection, and secure authentication methods. However, explicit publication lists or detailed research portfolios are not provided.
Jonathan H. Connell's professional profile appears to be centered on applied research and advancements related to biometric technologies within IBM, contributing to interdisciplinary approaches in security systems.
N. K. Ratha;J. H. Connell;R. M. Bolle
N.K. Ratha;S. Chikkerur;J.H. Connell;R.M. Bolle
Ruud M. Bolle;Jonathan H. Connell;Sharath Pankanti;Nalini K. Ratha
Sridhar Mahadevan;Jonathan Connell
Nalini K. Ratha;Jonathan H. Connell;Ruud M. Bolle
Ruud M. Bolle;Jonathan H. Connell;Nalini K. Ratha
J.H. Connell
A. Hampapur;L. Brown;J. Connell;A. Ekin
A. Senior;S. Pankanti;A. Hampapur;L. Brown
Bolle Rudolf M;Connell Jonathan H;Hampapur Arun;Andrew W
J H Connell;M Brady
Jonathan H. Connell;Sridhar Mahadevan
Jinyu Zuo;N.K. Ratha;J.H. Connell
Rakesh Mohan;Jonathan Hudson Connell;Rudolf Maarten Bolle
N. Ratha;J. Connell;R.M. Bolle;S. Chikkerur
R.M. Bolle;J.H. Connell;S. Pankanti;N.K. Ratha
Rodney A. Brooks;Jonathan H. Connell
Jonathan Connell
A. Hampapur;L. Brown;J. Connell;S. Pankanti
Rudolf Maarten Bolle;Jonathan Hudson Connell;Norman Haas;Rakesh Mohan
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