2013 - Fellow of Alfred P. Sloan Foundation
His primary areas of investigation include Artificial intelligence, Computer vision, Machine learning, Image and Object. His research combines Pattern recognition and Artificial intelligence. His studies examine the connections between Computer vision and genetics, as well as such issues in Perspective, with regards to Image processing.
His Machine learning research is multidisciplinary, incorporating perspectives in Method, Feature extraction and Pascal. His Image research incorporates themes from Visualization, Segmentation and Knowledge extraction. His Object research is multidisciplinary, relying on both Computer graphics and Statistical model.
Artificial intelligence, Computer vision, Pattern recognition, Image and Object are his primary areas of study. His Artificial intelligence study often links to related topics such as Machine learning. His Computer vision research incorporates elements of Perspective and Inference.
His work on Support vector machine as part of general Pattern recognition research is often related to Set, thus linking different fields of science. His Image study combines topics in areas such as Enhanced Data Rates for GSM Evolution, Geometry, Surface and Computer graphics. His Object research includes elements of Visual reasoning and Representation.
His scientific interests lie mostly in Artificial intelligence, Image, Pattern recognition, Computer vision and Type. His Artificial intelligence research is multidisciplinary, incorporating elements of Machine learning and Natural language processing. He has researched Image in several fields, including State and Computer graphics.
His Pattern recognition research includes themes of Real image and Task. Derek Hoiem works mostly in the field of Object, limiting it down to concerns involving Surface and, occasionally, Robustness. The concepts of his Classifier study are interwoven with issues in Contextual image classification and Inference.
Derek Hoiem mainly focuses on Artificial intelligence, Pattern recognition, Task analysis, Knowledge transfer and Artificial neural network. His work on Object, Word and Mutual information as part of general Artificial intelligence study is frequently linked to Code and Construct, bridging the gap between disciplines. The study of Object is intertwined with the study of Pattern recognition in a number of ways.
Bayesian inference, Machine learning, Inference, Classifier and Training set are fields of study that overlap with his Task analysis research. His Knowledge transfer research includes a combination of various areas of study, such as Normalization, Real image, Normalization and Divergence.
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Indoor segmentation and support inference from RGBD images
Nathan Silberman;Derek Hoiem;Pushmeet Kohli;Rob Fergus.
european conference on computer vision (2012)
Describing objects by their attributes
Ali Farhadi;Ian Endres;Derek Hoiem;David Forsyth.
computer vision and pattern recognition (2009)
Learning without Forgetting
Zhizhong Li;Derek Hoiem.
IEEE Transactions on Pattern Analysis and Machine Intelligence (2018)
Putting Objects in Perspective
D. Hoiem;A.A. Efros;M. Hebert.
computer vision and pattern recognition (2006)
Geometric context from a single image
D. Hoiem;A.A. Efros;M. Hebert.
international conference on computer vision (2005)
Recovering Surface Layout from an Image
Derek Hoiem;Alexei A. Efros;Martial Hebert.
International Journal of Computer Vision (2007)
Automatic photo pop-up
Derek Hoiem;Alexei A. Efros;Martial Hebert.
international conference on computer graphics and interactive techniques (2005)
An empirical study of context in object detection
Santosh K Divvala;Derek Hoiem;James H Hays;Alexei A Efros.
computer vision and pattern recognition (2009)
Category independent object proposals
Ian Endres;Derek Hoiem.
european conference on computer vision (2010)
Recovering the spatial layout of cluttered rooms
Varsha Hedau;Derek Hoiem;David Forsyth.
international conference on computer vision (2009)
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