Charles A. Miller spends much of his time researching Integrated circuit, Electrical engineering, Signal, Frequency response and Electronic engineering. His Computer hardware research extends to Integrated circuit, which is thematically connected. His study on Interfacing is often connected to FLEX as part of broader study in Computer hardware.
Charles A. Miller works in the field of Electrical engineering, namely Terminal. Signal is closely attributed to Probe card in his study. His Frequency response study combines topics in areas such as Inductance, Electrical impedance, Impedance matching, Electrical conductor and Interconnection.
His primary areas of investigation include Electrical engineering, Integrated circuit, Electronic engineering, Signal and Computer hardware. Charles A. Miller combines subjects such as Electrical impedance, Wafer, Interconnection and Reading with his study of Integrated circuit. His work is dedicated to discovering how Interconnection, Electrical conductor are connected with Conductor and other disciplines.
His research in Electronic engineering focuses on subjects like Frequency response, which are connected to Inductance, Behavioral modeling and Engineering design process. His studies in Signal integrate themes in fields like Probe card, Transmission line and Interfacing. His studies deal with areas such as Mechanical engineering, Coolant and Embedded system as well as Computer hardware.
Charles A. Miller mainly focuses on Probe card, Optoelectronics, Electrical engineering, Computer hardware and Electronics. Charles A. Miller connects Probe card with Calibration in his study. His work in the fields of Wafer overlaps with other areas such as Interface.
He interconnects Device under test, Node and Printed circuit board in the investigation of issues within Computer hardware. His research investigates the link between Electronics and topics such as Signal reflection that cross with problems in Resistor. His Resistor study integrates concerns from other disciplines, such as Interconnection, Contact pad and Integrated circuit.
This overview was generated by a machine learning system which analysed the scientist’s body of work. If you have any feedback, you can contact us here.
Apparatus for reducing power supply noise in an integrated circuit
Benjamin N. Eldridge;Charles A. Miller.
Method for fabricating an IC interconnect system including an in-street integrated circuit wafer via
Charles A. Miller.
Interface apparatus and semiconductor wafer
Miller Charles A.
Method of incorporating interconnect systems into an integrated circuit process flow
Charles A. Miller;John M. Long.
Efficient parallel testing of semiconductor devices using a known good device to generate expected responses
Charles A. Miller;Richard S. Roy.
Simultaneous test for integrated circuit device, using inter-dut comparison and intra-dut comarison
Charles A Miller;Richard S Roy;ミラー，チャールズ，エイ;ロイ，リチャード，エス.
Probe card assembly for high-bandwidth passive integrated circuit tester
Miller A Charles;エイ ミラー チャールズ.
High performance probe system
Charles A. Miller.
Filterstrukturen für Schnittstellen zwischen integrierten Schaltungen
Charles Miller A.
Intelligent probe card architecture
Charles A. Miller;Matthew E. Chraft;Roy J. Henson.
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