Microelectronics Journal

Top Research Topics at Microelectronics Journal?

The journal investigates areas of study like Electronic engineering, Electrical engineering, Optoelectronics, CMOS and Voltage. The journal holds forums on Electronic engineering that merges themes from other disciplines such as Power (physics), Electronic circuit, Integrated circuit, Transistor and Amplifier. The journal tackles issues in Electrical engineering, particularly in the topics of MOSFET, Low voltage, Transconductance and Capacitor.

The journal connects the study in Optoelectronics with the closely related area of Optics.

• Electronic engineering (34.52%)
• Electrical engineering (23.46%)
• Optoelectronics (18.00%)

What are the most cited papers published in the journal?

• Fabrication and performance of MEMS-based piezoelectric power generator for vibration energy harvesting (401 citations)
• Review of CMOS image sensors (400 citations)
• A MEMS-based piezoelectric power generator array for vibration energy harvesting (384 citations)

Research areas of the most cited articles at Microelectronics Journal:

The most cited articles primarily focus on research topics in Electronic engineering, Electrical engineering, Optoelectronics, CMOS and Optics. The journal papers address concerns in Electronic engineering which are intertwined with other disciplines, such as Electronic circuit, Integrated circuit, Current conveyor and Transistor, Voltage. While Optoelectronics is the focus of the most cited publications, it also provides insights into the studies of Breakdown voltage and Nanotechnology.

What topics the last edition of the journal is best known for?

• Quantum mechanics
• Electron
• Optics

The previous edition focused in particular on these issues:

The journal primarily focuses on research topics in Electronic engineering, CMOS, Voltage, Optoelectronics and Power (physics). The main emphasis of the journal is the subject of Electronic engineering, focusing on Bandwidth (signal processing). Issues in CMOS were discussed, taking into consideration concepts from other disciplines like Voltage-controlled oscillator, Comparator, Linearity, Resistor and Transistor.

Microelectronics Journal explores studies in Voltage as part of the wider topic of Electrical engineering. Microelectronics Journal holds forums on Optoelectronics that merges themes from other disciplines such as Threshold voltage, Capacitance and Field-effect transistor. Topics in Power (physics) were tackled in line with various other fields like Energy (signal processing) and Inductor.

The most cited articles from the last journal are:

• Integrated multi-band RF transceiver design for multi-standard applications using 130 nm CMOS technology (5 citations)
• Negative drain-induced barrier lowering and negative differential resistance effects in negative-capacitance transistors (4 citations)
• RF & linearity distortion sensitivity analysis of DMG-DG-Ge pocket TFET with hetero dielectric (4 citations)

Papers citation over time

A key indicator for each journal is its effectiveness in reaching other researchers with the papers published at that venue.

The chart below presents the interquartile range (first quartile 25%, median 50% and third quartile 75%) of the number of citations of articles over time.

Top authors and change over time

The top authors publishing in Microelectronics Journal (based on the number of publications) are:

• Zhangming Zhu (47 papers) published 4 papers at the last edition, 1 more than at the previous edition,
• Mohamed Henini (45 papers) absent at the last edition,
• Yintang Yang (31 papers) absent at the last edition,
• Muhammad Taher Abuelma'atti (24 papers) absent at the last edition,
• Andrzej Napieralski (22 papers) absent at the last edition.

The overall trend for top authors publishing in this journal is outlined below. The chart shows the number of publications at each edition of the journal for top authors.

Top affiliations and change over time

Only papers with recognized affiliations are considered

The top affiliations publishing in Microelectronics Journal (based on the number of publications) are:

• Chinese Academy of Sciences (92 papers) published 7 papers at the last edition, 4 more than at the previous edition,
• Xidian University (86 papers) published 9 papers at the last edition, 5 more than at the previous edition,
• Centre national de la recherche scientifique (63 papers) absent at the last edition,
• Cairo University (61 papers) published 2 papers at the last edition, 1 less than at the previous edition,
• Spanish National Research Council (60 papers) absent at the last edition.

The overall trend for top affiliations publishing in this journal is outlined below. The chart shows the number of publications at each edition of the journal for top affiliations.

Publication chance based on affiliation

The publication chance index shows the ratio of articles published by the best research institutions in the journal edition to all articles published within that journal. The best research institutions were selected based on the largest number of articles published during all editions of the journal.

The chart below presents the percentage ratio of articles from top institutions (based on their ranking of total papers).Top affiliations were grouped by their rank into the following tiers: top 1-10, top 11-20, top 21-50, and top 51+. Only articles with a recognized affiliation are considered.

During the most recent 2021 edition, 8.26% of publications had an unrecognized affiliation. Out of the publications with recognized affiliations, 13.51% were posted by at least one author from the top 10 institutions publishing in the journal. Another 4.05% included authors affiliated with research institutions from the top 11-20 affiliations. Institutions from the 21-50 range included 12.16% of all publications and 70.27% were from other institutions.

Returning Authors Index

A very common phenomenon observed among researchers publishing scientific articles is the intentional selection of journals they have already attended in the past. In particular, it is worth analyzing the case when the authors participate in the same journal from year to year.

The Returning Authors Index presented below illustrates the ratio of authors who participated in both a given as well as the previous edition of the journal in relation to all participants in a given year.

Returning Institution Index

The graph below shows the Returning Institution Index, illustrating the ratio of institutions that participated in both a given and the previous edition of the conference in relation to all affiliations present in a given year.

The experience to innovation index

Our experience to innovation index was created to show a cross-section of the experience level of authors publishing in a journal. The index includes the authors publishing at the last edition of a journal, grouped by total number of publications throughout their academic career (P) and the total number of citations of these publications ever received (C).

The group intervals were selected empirically to best show the diversity of the authors' experiences, their labels were selected as a convenience, not as judgment. The authors were divided into the following groups:

• Novice - P < 5 or C < 25 (the number of publications less than 5 or the number of citations less than 25),
• Competent - P < 10 or C < 100 (the number of publications less than 10 or the number of citations less than 100),
• Experienced - P < 25 or C < 625 (the number of publications less than 25 or the number of citations less than 625),
• Master - P < 50 or C < 2500 (the number of publications less than 50 or the number of citations less than 2500),
• Star - P ≥ 50 and C ≥ 2500 (both the number of publications greater than 50 and the number of citations greater than 2500).

The chart below illustrates experience levels of first authors in cases of publications with multiple authors.