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IEEE

International Workshop on Integrated Nonlinear Microwave and Millimetre-wave Circuits (INMMIC)

Location: Cardiff , United Kingdom

Submission deadline: 1/12/2022

Conference dates: 4/21/2022 - 4/22/2022

Research H-index
3

Ranking & Metrics

Discipline name Position Best Scientists Publications D-Index
Electronics and Electrical Engineering 609 17 31 3

Call for Papers

The International Workshop on Integrated Nonlinear Microwave and Millimetre-wave Circuits (INMMiC) is a forum for promoting, discussing and developing ideas in the field of nonlinear microwave and millimetre-wave circuits and systems. INMMiC was originally launched in Duisburg, Germany, in 1990, and it assumed the present form in Rome, Italy, in 2004. Subsequently INMMiC has been held at different venues around Europe: 2006 in Aveiro, Portugal, 2008 in Málaga, Spain, 2010 in Göteborg, Sweden, 2011 in Vienna, Austria, 2012 in Dublin, Ireland, 2014 in Leuven, Belgium, 2015 in Taormina, Italy, and 2017 in Graz, Austria, and 2018 in Brive-La-Gaillarde, France.

INMMiC 2020 was held virtually in Cardiff, UK, featuring a two-day archival series of oral presentations with distinguished invited talks. The technical talks will be combined with virtual rooms where the audience engaged with the authors to spark fruitful conversation

Overview

The ranking presented on this page showcases leading scientific conferences within the field of Electronics and Electrical Engineering. Developed by Research.com, one of the foremost platforms dedicated to science research across all major disciplines, this ranking builds upon a foundation of trusted and comprehensive data on scientific contributions since 2014, including extensive coverage of Electronics and Electrical Engineering.

The methodology behind this ranking draws upon a unique bibliometric score developed exclusively by Research.com. This score is calculated using a combination of two primary factors: the estimated h-index and the number of leading scientists who have participated in each conference over the previous three years. By integrating these objective metrics, the ranking accurately reflects the scientific impact and prominence of each conference in the academic community.

For the latest edition, Impact Score values were compiled as of 2024-11-27, providing an up-to-date representation of the current landscape in Electronics and Electrical Engineering conferences. The ranking was established through a meticulous process involving the examination of more than 2,204 conferences, selected following a rigorous inspection of 95,378 scientific documents published during the past three years. This comprehensive analysis was further reinforced by input from 6,160 leading and highly respected scientists actively engaged in research within the field.

The complexity and depth of the evaluation process underscore the professionalism and accuracy behind the rankings, ensuring that the listed conferences represent the most significant venues for advancing research in Electronics and Electrical Engineering. For further information regarding the methodological approach employed in generating these rankings, detailed explanations can be found on our Methodology Page.

Papers citation over time

A key indicator for each conference is its effectiveness in reaching other researchers with the papers published at that venue.

The chart below presents the interquartile range (first quartile 25%, median 50% and third quartile 75%) of the number of citations of articles over time.

The top authors publishing at Workshop on Integrated Nonlinear Microwave and Millimetre-wave Circuits (based on the number of publications) are:

  • Ernesto Limiti (23 papers) published 3 papers at the last edition, 1 more than at the previous edition,
  • Dominique Schreurs (20 papers) absent at the last edition,
  • Paolo Colantonio (18 papers) published 3 papers at the last edition,
  • Rocco Giofre (18 papers) published 3 papers at the last edition, 1 more than at the previous edition,
  • Giorgio Vannini (17 papers) published 1 paper at the last edition, 1 less than at the previous edition.

The overall trend for top authors publishing at this conference is outlined below. The chart shows the number of publications at each edition of the conference for top authors.

Only papers with recognized affiliations are considered

The top affiliations publishing at Workshop on Integrated Nonlinear Microwave and Millimetre-wave Circuits (based on the number of publications) are:

  • Katholieke Universiteit Leuven (21 papers) absent at the last edition,
  • Chalmers University of Technology (19 papers) published 2 papers at the last edition, 1 more than at the previous edition,
  • University of Ferrara (17 papers) published 1 paper at the last edition, 1 less than at the previous edition,
  • University of Rome Tor Vergata (17 papers) published 3 papers at the last edition the same number as at the previous edition,
  • University of Aveiro (16 papers) published 1 paper at the last edition the same number as at the previous edition.

The overall trend for top affiliations publishing at this conference is outlined below. The chart shows the number of publications at each edition of the conference for top affiliations.

Publication chance based on affiliation

The publication chance index shows the ratio of articles published by the best research institutions at the conference edition to all articles published within that conference. The best research institutions were selected based on the largest number of articles published during all editions of the conference.

The chart below presents the percentage ratio of articles from top institutions (based on their ranking of total papers).Top affiliations were grouped by their rank into the following tiers: top 1-10, top 11-20, top 21-50, and top 51+. Only articles with a recognized affiliation are considered.

During the most recent 2020 edition, 7.14% of publications had an unrecognized affiliation. Out of the publications with recognized affiliations, 69.23% were posted by at least one author from the top 10 institutions publishing at the conference. Another 15.38% included authors affiliated with research institutions from the top 11-20 affiliations. Institutions from the 21-50 range included 11.54% of all publications and 3.85% were from other institutions.

Returning Authors Index

A very common phenomenon observed among researchers publishing scientific articles is the intentional selection of conferences they have already attended in the past. In particular, it is worth analyzing the case when the authors participate in the same conference from year to year.

The Returning Authors Index presented below illustrates the ratio of authors who participated in both a given as well as the previous edition of the conference in relation to all participants in a given year.

Returning Institution Index

The graph below shows the Returning Institution Index, illustrating the ratio of institutions that participated in both a given and the previous edition of the conference in relation to all affiliations present in a given year.

The experience to innovation index

Our experience to innovation index was created to show a cross-section of the experience level of authors publishing at a conference. The index includes the authors publishing at the last edition of a conference, grouped by total number of publications throughout their academic career (P) and the total number of citations of these publications ever received (C).

The group intervals were selected empirically to best show the diversity of the authors' experiences, their labels were selected as a convenience, not as judgment. The authors were divided into the following groups:

  • Novice - P < 5 or C < 25 (the number of publications less than 5 or the number of citations less than 25),
  • Competent - P < 10 or C < 100 (the number of publications less than 10 or the number of citations less than 100),
  • Experienced - P < 25 or C < 625 (the number of publications less than 25 or the number of citations less than 625),
  • Master - P < 50 or C < 2500 (the number of publications less than 50 or the number of citations less than 2500),
  • Star - P ≥ 50 and C ≥ 2500 (both the number of publications greater than 50 and the number of citations greater than 2500).

The chart below illustrates experience levels of first authors in cases of publications with multiple authors.

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