Location: Pont-à-Mousson , France
Conference dates: 7/11/2022 - 7/13/2022
| Discipline name | Position | Best Scientists | Publications | D-Index |
|---|---|---|---|---|
| Materials Science | 200 | 4 | 5 | 1 |
| Electronics and Electrical Engineering | 905 | 5 | 6 | 1 |
This ranking presents a comprehensive evaluation of scientific conferences within the field of Electronics and Electrical Engineering. Developed by Research.com, recognized as one of the leading websites for science research across all major disciplines, it has been providing trusted data on scientific contributions since 2014. The ranking aims to offer researchers, academics, and professionals a transparent measure of academic excellence and impact among conferences in this domain.
The position of each conference in this ranking is determined by a unique bibliometric score, meticulously constructed by Research.com. This exclusive score is derived from a combination of the estimated h-index and the number of leading scientists who have contributed to the conference in the three most recent years. The dataset underpinning the ranking is robust: more than 2,204 conferences were reviewed after a comprehensive selection process, which included the detailed examination of over 95,378 scientific documents published in the last three years by 6,160 leading and widely respected scientists in Electronics and Electrical Engineering.
All Impact Score values featured in this ranking were collected as of 2024-11-27, ensuring the most up-to-date and relevant data are reflected. The rigorous approach and depth of analysis applied by subject matter experts guarantee an accurate and credible assessment of scientific impact and leadership within the field.
For further details regarding the methodology behind the computation of ranking scores and the selection procedure, please refer to our Methodology Page.
A key indicator for each conference is its effectiveness in reaching other researchers with the papers published at that venue.
The chart below presents the interquartile range (first quartile 25%, median 50% and third quartile 75%) of the number of citations of articles over time.
The top authors publishing at Symposium on Design, Test, Integration and Packaging of MEMS/MOEMS (based on the number of publications) are:
The overall trend for top authors publishing at this conference is outlined below. The chart shows the number of publications at each edition of the conference for top authors.
Only papers with recognized affiliations are considered
The top affiliations publishing at Symposium on Design, Test, Integration and Packaging of MEMS/MOEMS (based on the number of publications) are:
The overall trend for top affiliations publishing at this conference is outlined below. The chart shows the number of publications at each edition of the conference for top affiliations.
The publication chance index shows the ratio of articles published by the best research institutions at the conference edition to all articles published within that conference. The best research institutions were selected based on the largest number of articles published during all editions of the conference.
The chart below presents the percentage ratio of articles from top institutions (based on their ranking of total papers).Top affiliations were grouped by their rank into the following tiers: top 1-10, top 11-20, top 21-50, and top 51+. Only articles with a recognized affiliation are considered.
During the most recent 2017 edition, 5.17% of publications had an unrecognized affiliation. Out of the publications with recognized affiliations, 43.64% were posted by at least one author from the top 10 institutions publishing at the conference. Another 10.91% included authors affiliated with research institutions from the top 11-20 affiliations. Institutions from the 21-50 range included 29.09% of all publications and 16.36% were from other institutions.
A very common phenomenon observed among researchers publishing scientific articles is the intentional selection of conferences they have already attended in the past. In particular, it is worth analyzing the case when the authors participate in the same conference from year to year.
The Returning Authors Index presented below illustrates the ratio of authors who participated in both a given as well as the previous edition of the conference in relation to all participants in a given year.
The graph below shows the Returning Institution Index, illustrating the ratio of institutions that participated in both a given and the previous edition of the conference in relation to all affiliations present in a given year.
Our experience to innovation index was created to show a cross-section of the experience level of authors publishing at a conference. The index includes the authors publishing at the last edition of a conference, grouped by total number of publications throughout their academic career (P) and the total number of citations of these publications ever received (C).
The group intervals were selected empirically to best show the diversity of the authors' experiences, their labels were selected as a convenience, not as judgment. The authors were divided into the following groups:
The chart below illustrates experience levels of first authors in cases of publications with multiple authors.
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