World's Best Scientists 2026 revealed!

D-Index & Metrics

Engineering and Technology

D-Index
51
Citations
9928
World Ranking
3859
National Ranking
775

Way Kuo publication distribution in Engineering and Technology in 2026

The chart shows the distribution of publications by all Research.com ranked scientists in the field of Engineering and Technology in 2026. The highlighted bar marks where Way Kuo sits on this spectrum.

38–47 publications: 20 scientists 48–57 publications: 35 scientists 58–67 publications: 96 scientists 68–77 publications: 134 scientists 78–87 publications: 190 scientists 88–97 publications: 259 scientists 98–107 publications: 283 scientists 108–117 publications: 369 scientists 118–127 publications: 341 scientists 128–137 publications: 386 scientists 138–147 publications: 372 scientists 148–157 publications: 457 scientists 158–167 publications: 415 scientists 168–177 publications: 407 scientists 178–187 publications: 421 scientists 188–197 publications: 378 scientists 198–207 publications: 403 scientists 208–217 publications: 317 scientists 218–227 publications: 346 scientists 228–237 publications: 321 scientists 238–247 publications: 260 scientists 248–257 publications: 280 scientists 258–267 publications: 240 scientists 268–277 publications: 214 scientists 278–287 publications: 242 scientists 288–297 publications: 203 scientists 298–307 publications: 166 scientists 308–317 publications: 154 scientists 318–327 publications: 175 scientists 328–337 publications: 159 scientists 338–347 publications: 99 scientists 348–357 publications: 131 scientists 358–367 publications: 106 scientists 368–377 publications: 117 scientists 378–387 publications: 97 scientists 388–397 publications: 108 scientists 398–407 publications: 82 scientists 408–417 publications: 71 scientists 418–427 publications: 64 scientists 428–437 publications: 55 scientists 438–447 publications: 54 scientists 448–457 publications: 59 scientists 458–467 publications: 47 scientists 468–477 publications: 40 scientists 478–487 publications: 30 scientists 488–497 publications: 29 scientists 498–507 publications: 38 scientists 508–517 publications: 40 scientists 518–527 publications: 32 scientists 528–537 publications: 23 scientists 538–547 publications: 28 scientists 548–557 publications: 23 scientists 558–567 publications: 19 scientists 568–577 publications: 16 scientists 578–587 publications: 17 scientists 588–597 publications: 18 scientists 598–607 publications: 22 scientists 608–617 publications: 15 scientists 618–627 publications: 9 scientists 628–637 publications: 11 scientists 638–647 publications: 21 scientists 648–657 publications: 12 scientists 658–667 publications: 9 scientists 668–677 publications: 11 scientists 678–687 publications: 9 scientists 688–697 publications: 6 scientists 698–707 publications: 14 scientists 708–717 publications: 7 scientists 718–727 publications: 8 scientists 728–737 publications: 10 scientists 738–747 publications: 9 scientists 748–757 publications: 5 scientists 758–767 publications: 5 scientists 768–777 publications: 11 scientists 778–787 publications: 7 scientists 788–797 publications: 2 scientists 798–803 publications: 4 scientists 804+ publications: 100 scientists
38 publications 804+

This scientist: 237 publications — 61st percentile

61% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 804 publications or more.

Way Kuo D-index placement in Engineering and Technology in 2026

The chart shows the D-index (discipline H-index) distribution of Engineering and Technology scientists ranked by Research.com in 2026. The highlighted bar marks where Way Kuo sits on this spectrum.

30 D-Index: 59 scientists 31 D-Index: 114 scientists 32 D-Index: 128 scientists 33 D-Index: 189 scientists 34 D-Index: 200 scientists 35 D-Index: 262 scientists 36 D-Index: 311 scientists 37 D-Index: 312 scientists 38 D-Index: 350 scientists 39 D-Index: 385 scientists 40 D-Index: 349 scientists 41 D-Index: 362 scientists 42 D-Index: 425 scientists 43 D-Index: 380 scientists 44 D-Index: 310 scientists 45 D-Index: 341 scientists 46 D-Index: 301 scientists 47 D-Index: 306 scientists 48 D-Index: 271 scientists 49 D-Index: 246 scientists 50 D-Index: 210 scientists 51 D-Index: 253 scientists 52 D-Index: 213 scientists 53 D-Index: 221 scientists 54 D-Index: 195 scientists 55 D-Index: 186 scientists 56 D-Index: 170 scientists 57 D-Index: 167 scientists 58 D-Index: 166 scientists 59 D-Index: 144 scientists 60 D-Index: 152 scientists 61 D-Index: 141 scientists 62 D-Index: 138 scientists 63 D-Index: 131 scientists 64 D-Index: 118 scientists 65 D-Index: 114 scientists 66 D-Index: 119 scientists 67 D-Index: 94 scientists 68 D-Index: 87 scientists 69 D-Index: 77 scientists 70 D-Index: 89 scientists 71 D-Index: 69 scientists 72 D-Index: 54 scientists 73 D-Index: 46 scientists 74 D-Index: 55 scientists 75 D-Index: 54 scientists 76 D-Index: 49 scientists 77 D-Index: 53 scientists 78 D-Index: 46 scientists 79 D-Index: 28 scientists 80 D-Index: 39 scientists 81 D-Index: 36 scientists 82 D-Index: 24 scientists 83 D-Index: 26 scientists 84 D-Index: 36 scientists 85 D-Index: 18 scientists 86 D-Index: 24 scientists 87 D-Index: 19 scientists 88 D-Index: 26 scientists 89 D-Index: 27 scientists 90 D-Index: 23 scientists 91 D-Index: 15 scientists 92 D-Index: 12 scientists 93 D-Index: 9 scientists 94 D-Index: 15 scientists 95 D-Index: 10 scientists 96 D-Index: 13 scientists 97 D-Index: 13 scientists 98 D-Index: 9 scientists 99 D-Index: 7 scientists 100 D-Index: 7 scientists 101 D-Index: 8 scientists 102 D-Index: 7 scientists 103 D-Index: 7 scientists 104 D-Index: 9 scientists 105 D-Index: 6 scientists 106 D-Index: 9 scientists 107+ D-Index: 99 scientists
30 D-Index 107+

This scientist: 51 D-Index — 62nd percentile

62% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 107 D-Index or more.

Research.com Recognitions

  • 2007 - Fellow of the American Statistical Association (ASA)
  • 2000 - Member of the National Academy of Engineering For contributions to reliability design for microelectronics products and systems.

Overview

Way Kuo is affiliated with the City University of Hong Kong in China. Their research primarily focuses on engineering, mathematics, and decision sciences, with a significant emphasis on safety, risk, reliability, and quality.

Their publication record includes a variety of topics such as reliability and maintenance optimization, probabilistic and robust engineering design, risk and safety analysis, statistical distribution estimation and applications, software reliability and analysis research, analytic number theory research, and advanced multi-objective optimization algorithms.

Way Kuo has authored several notable papers, including:

  • In situ design of advanced titanium alloy with concentration modulations by additive manufacturing (2021) in Science
  • Chemically complex intermetallic alloys: A new frontier for innovative structural materials (2021) in Materials Today
  • An Overview of Adaptive-Surrogate-Model-Assisted Methods for Reliability-Based Design Optimization (2022) in IEEE Transactions on Reliability
  • Guest Editorial: Crisis Management-From Nuclear Accidents to Outbreaks of COVID-19 and Infectious Diseases (2020) in IEEE Transactions on Reliability
  • Bayesian support vector machine for optimal reliability design of modular systems (2022) in Reliability Engineering & System Safety

Frequent collaborators in their research include Chunyan Ling, Jingzhe Lei, Han-Lin Li, Shu-Cherng Fang, and Min Xie.

Way Kuo's work is regularly published in several academic venues, most notably:

  • IEEE Transactions on Reliability
  • Advances in Pure Mathematics
  • Reliability Engineering & System Safety
  • Quality and Reliability Engineering International
  • Proceedings of the Institution of Mechanical Engineers Part O Journal of Risk and Reliability

Their contributions to reliability design and engineering have been recognized through honors such as being named a Fellow of the American Statistical Association in 2007 and election as a Member of the National Academy of Engineering in 2000, particularly for contributions to reliability design for microelectronics products and systems.

Best Publications

  • Optimal Reliability Modeling: Principles and Applications

    Way Kuo;Ming J. Zuo

  • An annotated overview of system-reliability optimization

    W. Kuo;V.R. Prasad

  • Recent Advances in Optimal Reliability Allocation

    Way Kuo;Rui Wan

  • Optimal Reliability Design: Fundamentals and Applications

    Way Kuo;V. Rajendra Prasad;Tillman, Frank, A.;C. L. Hwang

  • Optimization Techniques for System Reliability with RedundancyߞA Review

    Frank A. Tillman;Ching-Lai Hwang;Way Kuo

  • Importance Measures in Reliability, Risk, and Optimization: Principles and Applications

    Way Kuo;Xiaoyan Zhu

  • Determining Component Reliability and Redundancy for Optimum System Reliability

    Frank A. Tillman;Ching-Lai Hwang;Way Kuo

  • Degradation models and implied lifetime distributions

    Suk Joo Bae;Way Kuo;Paul H. Kvam

  • Some Recent Advances on Importance Measures in Reliability

    Way Kuo;Xiaoyan Zhu

  • A consecutive-k-out-of-n:G system: the mirror image of a consecutive-k-out-of-n:F system

    W. Kuo;W. Zhang;M. Zuo

  • Facing the headaches of early failures: A state-of-the-art review of burn-in decisions

    Way Kuo;Yue Kuo

  • An overview of manufacturing yield and reliability modeling for semiconductor products

    Way Kuo;Taeho Kim

  • Reliability redundancy allocation: An improved realization for nonconvex nonlinear programming problems

    Chunghun Ha;Way Kuo

  • Reliability optimization of coherent systems

    V.R. Prasad;W. Kuo

  • Detection of Spatial Defect Patterns Generated in Semiconductor Fabrication Processes

    Tao Yuan;Way Kuo;Suk Joo Bae

  • A condition-based maintenance policy for degrading systems with age- and state-dependent operating cost

    Bin Liu;Shaomin Wu;Min Xie;Way Kuo

  • Reliability Optimization with the Lagrange-Multiplier and Branch-and-Bound Technique

    Way Kuo;Hsin-Hui Lin;Zhongkai Xu;Weixing Zhang

  • Optimization limits in improving system reliability

    Z. Xu;W. Kuo;H.-H. Lin

  • A value-based preventive maintenance policy for multi-component system with continuously degrading components

    Bin Liu;Zhengguo Xu;Min Xie;Way Kuo

  • Detection and classification of defect patterns on semiconductor wafers

    Chih Hsuan Wang;Way Kuo;Halima Bensmail

  • Design and performance analysis of consecutive-k-out-of-n structure

    Mingjian Zuo;Way Kuo

Frequent Co-Authors

Min Xie
Min Xie City University of Hong Kong
Ming J. Zuo
Ming J. Zuo University of Alberta
Frank K. Hwang
Frank K. Hwang National Yang Ming Chiao Tung University
Lirong Cui
Lirong Cui Beijing Institute of Technology
Shu-Cherng Fang
Shu-Cherng Fang North Carolina State University
Mitsuo Gen
Mitsuo Gen Tokyo University of Science
Hairong Qi
Hairong Qi University of Tennessee at Knoxville
Shaomin Wu
Shaomin Wu University of Kent
Hong-Zhong Huang
Hong-Zhong Huang University of Electronic Science and Technology of China

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