World's Best Scientists 2026 revealed!

D-Index & Metrics

Computer Science

D-Index
61
Citations
48957
World Ranking
2976
National Ranking
1456

Research.com Recognitions

  • 2012 - IEEE Fellow For contributions to mean-shift and robust techniques in computer vision

Overview

Peter Meer is a researcher affiliated with Rutgers, The State University of New Jersey in the United States. Their work primarily concentrates in the field of Computer Science, with a focus on several specialized subfields including Artificial Intelligence, Computer Vision and Pattern Recognition, and Geology.

The main topics covered in their research include:

  • Image and Object Detection Techniques
  • 3D Surveying and Cultural Heritage
  • Optical Measurement and Interference Techniques
  • Anomaly Detection Techniques and Applications
  • Adversarial Robustness in Machine Learning
  • Neural Networks and Applications

Peter Meer has contributed to several recent papers, among which are:

  • "A New Approach to Robust Estimation of Parametric Structures" (2020), published in IEEE Transactions on Pattern Analysis and Machine Intelligence
  • "Are Deep Neural Networks 'Robust'?" (2020), published in arXiv (Cornell University)

Their frequent co-authors include Yang Xiang and Jonathan Meer.

Peter Meer's publications have appeared in notable venues such as:

  • IEEE Transactions on Pattern Analysis and Machine Intelligence
  • arXiv (Cornell University)

Among their professional distinctions is the IEEE Fellow award received in 2012, granted for contributions to mean-shift and robust techniques in computer vision.

Best Publications

  • Mean shift: a robust approach toward feature space analysis

    D. Comaniciu;P. Meer

  • Kernel-based object tracking

    D. Comaniciu;V. Ramesh;P. Meer

  • Real-time tracking of non-rigid objects using mean shift

    D. Comaniciu;V. Ramesh;P. Meer

  • Region Covariance : A Fast Descriptor for Detection and Classification

    Oncel Tuzel;Fatih Porikli;Peter Meer

  • Mean shift analysis and applications

    D. Comaniciu;P. Meer

  • Pedestrian Detection via Classification on Riemannian Manifolds

    O. Tuzel;F. Porikli;P. Meer

  • Robust analysis of feature spaces: color image segmentation

    D. Comaniciu;P. Meer

  • Robust regression methods for computer vision: a review

    Peter Meer;Doron Mintz;Azriel Rosenfeld;Dong Yoon Kim

  • Covariance Tracking using Model Update Based on Lie Algebra

    F. Porikli;O. Tuzel;P. Meer

  • The variable bandwidth mean shift and data-driven scale selection

    D. Comaniciu;V. Ramesh;P. Meer

  • Human Detection via Classification on Riemannian Manifolds

    O. Tuzel;F. Porikli;P. Meer

  • Edge detection with embedded confidence

    P. Meer;B. Georgescu

  • Synergism in low level vision

    C.M. Christoudias;B. Georgescu;P. Meer

  • Robust clustering with applications in computer vision

    J.-M. Jolion;P. Meer;S. Bataouche

  • Collaborative diagnostic systems

    David J. Foran;Dorin Cominciu;Peter Meer

  • Robust and fast collaborative tracking with two stage sparse optimization

    Baiyang Liu;Lin Yang;Junzhou Huang;Peter Meer

  • Hierarchical image analysis using irregular tessellations

    A. Montanvert;P. Meer;A. Rosenfield

  • Distribution Free Decomposition of Multivariate Data

    Dorin Comaniciu;Peter Meer

  • Heteroscedastic Regression in Computer Vision: Problems with Bilinear Constraint

    Yoram Leedan;Peter Meer

  • Nonlinear Mean Shift over Riemannian Manifolds

    Raghav Subbarao;Peter Meer

Frequent Co-Authors

Dorin Comaniciu
Dorin Comaniciu Siemens (United States)
Oncel Tuzel
Oncel Tuzel Apple (United States)
Azriel Rosenfeld
Azriel Rosenfeld University of Maryland, College Park
Bogdan Georgescu
Bogdan Georgescu Princeton University
Lin Yang
Lin Yang University of Florida
Fatih Porikli
Fatih Porikli Australian National University
Yefeng Zheng
Yefeng Zheng Tencent (China)
Rae-Hong Park
Rae-Hong Park Sogang University
Visvanathan Ramesh
Visvanathan Ramesh Goethe University Frankfurt
Michael Lindenbaum
Michael Lindenbaum Technion – Israel Institute of Technology

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