The chart shows the distribution of publications by all Research.com ranked scientists in the field of Materials Science in 2026. The highlighted bar marks where Mark Huijben sits on this spectrum.
This scientist: 232 publications — 41st percentile
41% of scientists in this discipline score the same or lower.
The last bar groups every scientist with 1,163 publications or more.
The chart shows the D-index (discipline H-index) distribution of Materials Science scientists ranked by Research.com in 2026. The highlighted bar marks where Mark Huijben sits on this spectrum.
This scientist: 54 D-Index — 32nd percentile
32% of scientists in this discipline score the same or lower.
The last bar groups every scientist with 165 D-Index or more.
Mark Huijben is affiliated with the University of Twente in the Netherlands. Their research contributions are primarily situated at the intersection of engineering and materials science, with a focus on electrical and electronic engineering and materials chemistry. The scientist's work also spans into subfields such as electronic, optical and magnetic materials, condensed matter physics, and automotive engineering.
The core topics of Mark Huijben's research include:
Their frequent coauthors represent active collaborations in related scientific areas. Notable recurring collaborators include:
Mark Huijben has published extensively in venues that focus on materials and condensed matter sciences. Some of the most frequent publication venues with multiple papers include:
Some recent papers authored or coauthored by Mark Huijben are listed below. These papers reflect a strong emphasis on battery materials and oxide electronics:
A. Brinkman;M. Huijben;M. Huijben;M. van Zalk;J. Huijben
A. Brinkman;M. Huijben;M. van Zalk;J. Huijben
L. W. Martin;S. P. Crane;Ying-hao Chu;M. B. Holcomb
Mark Huijben;Guus Rijnders;Dave H. A. Blank;Sara Bals
P. Yu;J. S. Lee;S. Okamoto;M. D. Rossell
Nina Balke;Benjamin Winchester;Wei Ren;Ying Hao Chu
Nina Balke;Samrat Choudhury;Stephen Jesse;Mark Huijben;Mark Huijben
M. Salluzzo;J. C. Cezar;N. B. Brookes;V. Bisogni
Mark Huijben;Alexander Brinkman;Gertjan Koster;Guus Rijnders
Albina Y Borisevich;Hye Jung Chang;Mark Huijben;Mark Huijben;Mark P Oxley
Z. Liao;M. Huijben;Z. Zhong;N. Gauquelin
M. Huijben;M. Huijben;L. W. Martin;Ying-hao Chu;Ying-hao Chu;M. B. Holcomb
Lane W. Martin;Ying-Hao Chu;Mikel B. Holcomb;Mark Huijben
Lane W. Martin;Ying-hao Chu;Mikel B. Holcomb;Mikel B. Holcomb;Mark Huijben
M. Coll;J. Fontcuberta;M. Althammer;M. Bibes
Ying-hao Chu;T. Zhao;M. P. Cruz;Q. Zhan
Yunzhong Chen;Felix Trier;T. Wijnands;R. J. Green
H Boschker;M Huijben;A Vailionis;A Vailionis;J Verbeeck
Choongho Yu;Matthew L. Scullin;Mark Huijben;Ramamoorthy Ramesh
M. Huijben;G. Rijnders;D. H. A. Blank;S. Bals
Y. Z. Chen;F. Trier;T. Wijnands;R. J. Green
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