What is he best known for?
The fields of study he is best known for:
- Organic chemistry
- Ion
- Oxygen
His main research concerns Analytical chemistry, Secondary ion mass spectrometry, Ion, Mass spectrometry and Static secondary-ion mass spectrometry.
He works in the field of Analytical chemistry, namely Auger electron spectroscopy.
His Secondary ion mass spectrometry research includes themes of Ion beam, Monatomic ion, Polyatomic ion, Ion source and Aqueous solution.
His research in Ion intersects with topics in Peak intensity, Sputtering and Crystallite.
His Mass spectrometry research is multidisciplinary, incorporating elements of Spectral imaging and Sample preparation.
His Static secondary-ion mass spectrometry research incorporates elements of Fast atom bombardment and Adsorption.
His most cited work include:
- Surface analysis : the principal techniques (544 citations)
- ToF-SIMS : surface analysis by mass spectrometry (433 citations)
- A C60 Primary Ion Beam System for Time of Flight Secondary Ion Mass Spectrometry: Its Development and Secondary Ion Yield Characteristics (424 citations)
What are the main themes of his work throughout his whole career to date?
His primary areas of investigation include Analytical chemistry, Secondary ion mass spectrometry, Ion, Static secondary-ion mass spectrometry and Mass spectrometry.
His Analytical chemistry research integrates issues from Ion beam, Adsorption and Polymer.
His Adsorption research is multidisciplinary, relying on both Inorganic chemistry and Copper.
His study in Secondary ion mass spectrometry is interdisciplinary in nature, drawing from both Ion source, Time of flight, Molecule and Polymer chemistry.
His work in the fields of Ion, such as Polyatomic ion, Fragmentation and Ionization, overlaps with other areas such as Cluster.
John C. Vickerman has included themes like Protonation and Nanotechnology in his Polyatomic ion study.
He most often published in these fields:
- Analytical chemistry (55.15%)
- Secondary ion mass spectrometry (43.01%)
- Ion (34.93%)
What were the highlights of his more recent work (between 2009-2019)?
- Analytical chemistry (55.15%)
- Secondary ion mass spectrometry (43.01%)
- Ion (34.93%)
In recent papers he was focusing on the following fields of study:
His main research concerns Analytical chemistry, Secondary ion mass spectrometry, Ion, Polyatomic ion and Mass spectrometry.
The Analytical chemistry study combines topics in areas such as Beam, Ion beam, Time of flight and Ion bombardment.
His work deals with themes such as Matrix, Ion source, Molecular physics and Mass spectrometry imaging, which intersect with Secondary ion mass spectrometry.
His Ion research includes elements of Yield and Sputtering.
His work focuses on many connections between Polyatomic ion and other disciplines, such as Atomic physics, that overlap with his field of interest in Laser power scaling, Laser and Femtosecond.
His work on Static secondary-ion mass spectrometry is typically connected to Molecular imaging as part of general Mass spectrometry study, connecting several disciplines of science.
Between 2009 and 2019, his most popular works were:
- Molecular imaging and depth profiling by mass spectrometry--SIMS, MALDI or DESI? (141 citations)
- TOF-SIMS with argon gas cluster ion beams: a comparison with C60+. (138 citations)
- Developments in molecular SIMS depth profiling and 3D imaging of biological systems using polyatomic primary ions (111 citations)
In his most recent research, the most cited papers focused on:
- Organic chemistry
- Ion
- Oxygen
John C. Vickerman spends much of his time researching Analytical chemistry, Secondary ion mass spectrometry, Mass spectrometry, Ion and Polyatomic ion.
His Analytical chemistry study combines topics in areas such as Sputtering, Ion bombardment, Time-of-flight mass spectrometry, Ion source and Time of flight.
His Sputtering research is multidisciplinary, incorporating perspectives in Ionization and Argon.
Within one scientific family, John C. Vickerman focuses on topics pertaining to Reflectron under Time of flight, and may sometimes address concerns connected to Optics.
John C. Vickerman has researched Secondary ion mass spectrometry in several fields, including Ion beam and Organic chemicals.
John C. Vickerman studies Mass spectrometry, focusing on Static secondary-ion mass spectrometry in particular.
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