World's Best Scientists 2026 revealed!

D-Index & Metrics

Engineering and Technology

D-Index
75
Citations
24075
World Ranking
738
National Ranking
255

Jeffrey H. Siewerdsen publication distribution in Engineering and Technology in 2026

The chart shows the distribution of publications by all Research.com ranked scientists in the field of Engineering and Technology in 2026. The highlighted bar marks where Jeffrey H. Siewerdsen sits on this spectrum.

38–47 publications: 20 scientists 48–57 publications: 35 scientists 58–67 publications: 96 scientists 68–77 publications: 135 scientists 78–87 publications: 190 scientists 88–97 publications: 259 scientists 98–107 publications: 283 scientists 108–117 publications: 369 scientists 118–127 publications: 341 scientists 128–137 publications: 386 scientists 138–147 publications: 372 scientists 148–157 publications: 457 scientists 158–167 publications: 415 scientists 168–177 publications: 407 scientists 178–187 publications: 421 scientists 188–197 publications: 378 scientists 198–207 publications: 403 scientists 208–217 publications: 317 scientists 218–227 publications: 346 scientists 228–237 publications: 321 scientists 238–247 publications: 260 scientists 248–257 publications: 280 scientists 258–267 publications: 240 scientists 268–277 publications: 214 scientists 278–287 publications: 242 scientists 288–297 publications: 203 scientists 298–307 publications: 166 scientists 308–317 publications: 154 scientists 318–327 publications: 175 scientists 328–337 publications: 159 scientists 338–347 publications: 99 scientists 348–357 publications: 131 scientists 358–367 publications: 106 scientists 368–377 publications: 118 scientists 378–387 publications: 97 scientists 388–397 publications: 108 scientists 398–407 publications: 82 scientists 408–417 publications: 71 scientists 418–427 publications: 64 scientists 428–437 publications: 55 scientists 438–447 publications: 54 scientists 448–457 publications: 60 scientists 458–467 publications: 47 scientists 468–477 publications: 40 scientists 478–487 publications: 30 scientists 488–497 publications: 29 scientists 498–507 publications: 38 scientists 508–517 publications: 40 scientists 518–527 publications: 32 scientists 528–537 publications: 23 scientists 538–547 publications: 28 scientists 548–557 publications: 23 scientists 558–567 publications: 19 scientists 568–577 publications: 16 scientists 578–587 publications: 17 scientists 588–597 publications: 18 scientists 598–607 publications: 22 scientists 608–617 publications: 15 scientists 618–627 publications: 9 scientists 628–637 publications: 11 scientists 638–647 publications: 21 scientists 648–657 publications: 12 scientists 658–667 publications: 9 scientists 668–677 publications: 11 scientists 678–687 publications: 9 scientists 688–697 publications: 6 scientists 698–707 publications: 14 scientists 708–717 publications: 7 scientists 718–727 publications: 8 scientists 728–737 publications: 10 scientists 738–747 publications: 9 scientists 748–757 publications: 5 scientists 758–767 publications: 5 scientists 768–777 publications: 11 scientists 778–787 publications: 7 scientists 788–797 publications: 2 scientists 798–803 publications: 4 scientists 804+ publications: 100 scientists
38 publications 804+

This scientist: 579 publications — 97th percentile

97% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 804 publications or more.

Jeffrey H. Siewerdsen D-index placement in Engineering and Technology in 2026

The chart shows the D-index (discipline H-index) distribution of Engineering and Technology scientists ranked by Research.com in 2026. The highlighted bar marks where Jeffrey H. Siewerdsen sits on this spectrum.

30 D-Index: 59 scientists 31 D-Index: 114 scientists 32 D-Index: 129 scientists 33 D-Index: 189 scientists 34 D-Index: 200 scientists 35 D-Index: 262 scientists 36 D-Index: 311 scientists 37 D-Index: 312 scientists 38 D-Index: 350 scientists 39 D-Index: 385 scientists 40 D-Index: 348 scientists 41 D-Index: 362 scientists 42 D-Index: 426 scientists 43 D-Index: 380 scientists 44 D-Index: 310 scientists 45 D-Index: 341 scientists 46 D-Index: 301 scientists 47 D-Index: 306 scientists 48 D-Index: 271 scientists 49 D-Index: 246 scientists 50 D-Index: 210 scientists 51 D-Index: 253 scientists 52 D-Index: 213 scientists 53 D-Index: 221 scientists 54 D-Index: 195 scientists 55 D-Index: 186 scientists 56 D-Index: 170 scientists 57 D-Index: 167 scientists 58 D-Index: 166 scientists 59 D-Index: 144 scientists 60 D-Index: 152 scientists 61 D-Index: 141 scientists 62 D-Index: 138 scientists 63 D-Index: 131 scientists 64 D-Index: 118 scientists 65 D-Index: 114 scientists 66 D-Index: 119 scientists 67 D-Index: 95 scientists 68 D-Index: 87 scientists 69 D-Index: 77 scientists 70 D-Index: 89 scientists 71 D-Index: 69 scientists 72 D-Index: 54 scientists 73 D-Index: 46 scientists 74 D-Index: 55 scientists 75 D-Index: 54 scientists 76 D-Index: 49 scientists 77 D-Index: 53 scientists 78 D-Index: 46 scientists 79 D-Index: 28 scientists 80 D-Index: 39 scientists 81 D-Index: 36 scientists 82 D-Index: 24 scientists 83 D-Index: 26 scientists 84 D-Index: 36 scientists 85 D-Index: 18 scientists 86 D-Index: 25 scientists 87 D-Index: 19 scientists 88 D-Index: 26 scientists 89 D-Index: 27 scientists 90 D-Index: 23 scientists 91 D-Index: 15 scientists 92 D-Index: 12 scientists 93 D-Index: 9 scientists 94 D-Index: 15 scientists 95 D-Index: 10 scientists 96 D-Index: 13 scientists 97 D-Index: 13 scientists 98 D-Index: 9 scientists 99 D-Index: 7 scientists 100 D-Index: 7 scientists 101 D-Index: 8 scientists 102 D-Index: 7 scientists 103 D-Index: 7 scientists 104 D-Index: 9 scientists 105 D-Index: 6 scientists 106 D-Index: 9 scientists 107+ D-Index: 99 scientists
30 D-Index 107+

This scientist: 75 D-Index — 93rd percentile

93% of scientists in this discipline score the same or lower.

The last bar groups every scientist with 107 D-Index or more.

Research.com Recognitions

  • 2016 - Fellow of the Indian National Academy of Engineering (INAE)

Overview

Jeffrey H. Siewerdsen is affiliated with The University of Texas MD Anderson Cancer Center in the United States. Their research primarily spans the fields of Medicine and Engineering, with a focus on specialized areas including Radiology, Nuclear Medicine and Imaging, Biomedical Engineering, Surgery, Computer Vision and Pattern Recognition, and Radiation.

Their work covers several main topics, notably Medical Imaging Techniques and Applications, Advanced X-ray and CT Imaging, Radiation Dose and Imaging, Medical Imaging and Analysis, Advanced Radiotherapy Techniques, Spinal Fractures and Fixation Techniques, and Medical Image Segmentation Techniques.

Several recent papers highlight their contributions to the field. These include:

  • "Deformable MR-CT image registration using an unsupervised, dual-channel network for neurosurgical guidance", 2021, Medical Image Analysis
  • "Computed Tomography", 2022, Investigative Radiology
  • "Automated Registration-Based Temporal Bone Computed Tomography Segmentation for Applications in Neurotologic Surgery", 2021, Otolaryngology
  • "Imaging in Interventional Radiology: 2043 and Beyond", 2023, Radiology
  • "Cone-beam CT for imaging of the head/brain: Development and assessment of scanner prototype and reconstruction algorithms", 2020, Medical Physics

The scientist has collaborated frequently with a consistent group of coauthors, including Ali Uneri, Wojciech Zbijewski, Alejandro Sisniega, Pengwei Wu, and Craig Jones.

Their publications have appeared prominently in venues such as Medical Physics, Journal of Medical Imaging, Physics in Medicine and Biology, the 7th International Conference on Image Formation in X-Ray Computed Tomography, and Medical Imaging 2020: Physics of Medical Imaging.

Jeffrey H. Siewerdsen's research topics contribute to a broad understanding of advanced medical imaging techniques and their applications in clinical and interventional radiology. Their work also includes developments in image registration and segmentation techniques, as well as innovations in imaging hardware and reconstruction algorithms.

In 2016, they were recognized as a Fellow of the Indian National Academy of Engineering (INAE), an acknowledgment within the field of engineering.

Best Publications

  • Flat-panel cone-beam computed tomography for image-guided radiation therapy

    David A Jaffray;Jeffrey H Siewerdsen;John W Wong;Alvaro A Martinez

  • Cone-beam computed tomography with a flat-panel imager: Magnitude and effects of x-ray scatter

    Jeffrey H. Siewerdsen;David A. Jaffray

  • Cone‐beam computed tomography with a flat‐panel imager: Initial performance characterization

    D. A. Jaffray;J. H. Siewerdsen

  • Process for on-line cone beam computerized tomography guidance of radiation therapy procedures

    David A Jaffrey;デイヴィッド エイ ジャフリー;John W Wong;ジョン ダブリュー ウォン

  • Technical aspects of dental CBCT: state of the art

    Ruben Pauwels;K Araki;J H Siewerdsen;S S Thongvigitmanee

  • Evaluation of sparse-view reconstruction from flat-panel-detector cone-beam CT.

    Junguo Bian;Jeffrey H Siewerdsen;Xiao Han;Emil Y Sidky

  • Prostate gland motion assessed with cine-magnetic resonance imaging (cine-MRI).

    Michel J. Ghilezan;David A. Jaffray;Jeffrey H. Siewerdsen;Marcel Van Herk

  • Patient dose from kilovoltage cone beam computed tomography imaging in radiation therapy

    Mohammad K. Islam;Thomas G. Purdie;Bernhard D. Norrlinger;Hamideh Alasti

  • A simple, direct method for x-ray scatter estimation and correction in digital radiography and cone-beam CT.

    J. H. Siewerdsen;M. J. Daly;B. Bakhtiar;D. J. Moseley

  • Volume CT with a flat-panel detector on a mobile, isocentric C-arm: Pre-clinical investigation in guidance of minimally invasive surgery

    J. H. Siewerdsen;D. J. Moseley;S. Burch;S. K. Bisland

  • Accurate technique for complete geometric calibration of cone-beam computed tomography systems.

    Youngbin Cho;Douglas J. Moseley;Jeffrey H. Siewerdsen;David A. Jaffray

  • Spektr: A computational tool for x-ray spectral analysis and imaging system optimization

    J. H. Siewerdsen;A. M. Waese;D. J. Moseley;S. Richard

  • Empirical and theoretical investigation of the noise performance of indirect detection, active matrix flat-panel imagers (AMFPIs) for diagnostic radiology

    J. H. Siewerdsen;L. E. Antonuk;Y. El-Mohri;J. Yorkston

  • Cone-beam-CT guided radiation therapy: Technical implementation

    Daniel Létourneau;John W. Wong;Mark Oldham;Misbah Gulam

  • Comparison of localization performance with implanted fiducial markers and cone-beam computed tomography for on-line image-guided radiotherapy of the prostate.

    Douglas J. Moseley;Elizabeth A. White;Kirsty L. Wiltshire;Tara Rosewall

  • Signal, noise power spectrum, and detective quantum efficiency of indirect-detection flat-panel imagers for diagnostic radiology

    J. H. Siewerdsen;L. E. Antonuk;Y. El-Mohri;J. Yorkston

  • A ghost story: spatio-temporal response characteristics of an indirect-detection flat-panel imager.

    J. H. Siewerdsen;D. A. Jaffray

  • The influence of antiscatter grids on soft-tissue detectability in cone-beam computed tomography with flat-panel detectors.

    J. H. Siewerdsen;D. J. Moseley;B. Bakhtiar;S. Richard

  • Optimization of x-ray imaging geometry (with specific application to flat-panel cone-beam computed tomography).

    Jeffrey H. Siewerdsen;David A. Jaffray

  • High resolution gel-dosimetry by optical-CT and MR scanning

    Mark Oldham;Jeffrey H. Siewerdsen;Anil Shetty;David A. Jaffray

Frequent Co-Authors

David A. Jaffray
David A. Jaffray The University of Texas MD Anderson Cancer Center
John A. Carrino
John A. Carrino Hospital for Special Surgery
Jerry L. Prince
Jerry L. Prince Johns Hopkins University
Russell H. Taylor
Russell H. Taylor Johns Hopkins University
Alvaro Martinez
Alvaro Martinez Beaumont Health
Ziya L. Gokaslan
Ziya L. Gokaslan Brown University
Robert A. Street
Robert A. Street Palo Alto Research Center
Gregory D. Hager
Gregory D. Hager Johns Hopkins University
Sean W. Graham
Sean W. Graham University of British Columbia
Rebecca Fahrig
Rebecca Fahrig Siemens Healthcare (United States)

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