The chart shows the distribution of publications by all Research.com ranked scientists in the field of Materials Science in 2026. The highlighted bar marks where Bruce H. T. Chai sits on this spectrum.
This scientist: 303 publications — 61st percentile
61% of scientists in this discipline score the same or lower.
The last bar groups every scientist with 1,163 publications or more.
The chart shows the D-index (discipline H-index) distribution of Materials Science scientists ranked by Research.com in 2026. The highlighted bar marks where Bruce H. T. Chai sits on this spectrum.
This scientist: 51 D-Index — 24th percentile
24% of scientists in this discipline score the same or lower.
The last bar groups every scientist with 165 D-Index or more.
Bruce H. T. Chai is affiliated with the University of Central Florida in the United States. Their research focus lies primarily within the field of Computer Science, with particular attention to subfields such as Computer Vision and Pattern Recognition, Aerospace Engineering, and Artificial Intelligence.
The scientist's work covers several main topics that include Infrared Target Detection Methodologies, Video Surveillance and Tracking Methods, Advanced Neural Network Applications, and Advanced Computational Techniques and Applications. These topics reflect a concentration on developing and applying computational methods for image analysis and object detection.
Recent publications by Bruce H. T. Chai include:
The venues where Bruce H. T. Chai frequently publishes comprise the ISPRS Journal of Photogrammetry and Remote Sensing and the IEEE Transactions on Geoscience and Remote Sensing.
The scientist has collaborated often with the following coauthors:
Bruce H. T. Chai's research contributions reflect a multidimensional approach that integrates neural networks and computational techniques aimed at improving detection and classification in remote sensing and surveillance contexts.
C. D. Marshall;J. A. Speth;Stephen A. Payne;William F. Krupke
Bruce H. T. Chai;John Joseph Gallagher;David Wayne Hill
Stephen A. Payne;Laura D. DeLoach;Larry K. Smith;Wayne L. Kway
T. Sandrock;T. Danger;E. Heumann;G. Huber
R.D. Shannon;R.A. Oswald;J.B. Parise;B.H.T. Chai
Qing Ye;Bruce H.T. Chai
F. Heine;E. Heumann;T. Danger;T. Schweizer
T. Jensen;A. Diening;G. Huber;B. H. T. Chai
E. Kuokstis;C. Q. Chen;M. E. Gaevski;W. H. Sun
Martin Stalder;Bruce H. T. Chai;Michael Bass
Martin Stalder;Michael Bass;Bruce H. T. Chai
L.K. Smith;S.A. Payne;W.L. Kway;L.L. Chase
Stephen A. Payne;Larry K. Smith;Raymond J. Beach;Bruce H. T. Chai
T. Danger;J. Koetke;R. Brede;E. Heumann
Andy Bayramian;James Armstrong;Glenn Beer;Rob Campbell
Shujun Zhang;Yiting Fei;Bruce H. T. Chai;Eric Frantz
R. Brede;E. Heumann;J. Koetke;T. Danger
C. Q. Chen;M. E. Gaevski;W. H. Sun;E. Kuokstis
Andrew O. Wright;Michael D. Seltzer;John B. Gruber;Bruce H. T. Chai
L. Fornasiero;S. Kück;T. Jensen;G. Huber
C. D. Marshall;J. A. Speth;S. A. Payne;W. F. Krupke
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