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IEEE

INTERNATIONAL MICROWAVE AND RF CONFERENCE 2021 (IMaRC)

Location: Kanpur , India

Submission deadline: 8/31/2021

Conference dates: 12/17/2021 - 12/19/2021

Research H-index
3

Ranking & Metrics

Discipline name Position Best Scientists Publications D-Index
Electronics and Electrical Engineering 623 14 24 3

Call for Papers

The IEEE Microwave Theory and Techniques Society (MTT-S) in association with
Indian Institute of Technology Kanpur announces the 2021 IEEE MTT-S International
Microwave and RF Conference (IMaRC 2021) to be held during December 17-19,
2021 in the virtual mode.
This conference is held annually in India to provide a forum for the international
community of RF engineers to meet and present their latest technical achievements in
the field of microwave and RF components, circuits, systems, and modelling methods.
The IMaRC 2021 will be held with the major theme of RF technologies for
Telecommunications/5G, Space and Defense applications, and invites paper in
following areas of microwave and RF technology:
• Monolithic and hybrid integrated active components and circuits
• Passive components and circuits, filters, couplers, and transitions
• Transceiver design and components
• Microwave high power devices
• Active antennas and phased arrays
• MIMO techniques
• Novel waveguides and new phenomena in waveguides
• Plasmonic devices and their applications
• Microwave, millimeter-wave and THz systems
• Radar, SAR and microwave imaging
• RF sensors and testing techniques
• Microwave materials and processing
• Emerging areas including nanotechnology and biomedical applications
• Wireless and cellular architectures, components, and circuits
• Electromagnetic Interference and Compatibility (EMI/EMC)
• Medical and industrial applications of microwaves
• RF energy harvesting and wireless power transfer
• RF systems for emerging telecommunication infrastructure
• RF technologies for Space and Defense applications

Overview

The scientific conference ranking presented on this page offers an authoritative evaluation of conferences within the field of Electronics and Electrical Engineering. This ranking has been meticulously curated by Research.com, a leading platform recognized for providing reliable and comprehensive data on scientific research across all major disciplines, including Electronics and Electrical Engineering, since 2014. The purpose of this ranking is to assist the research community in identifying conferences of significant academic merit, leveraging trusted and up-to-date metrics.

The position of each conference in the ranking is determined by a unique bibliometric score developed by Research.com. This score is calculated by combining the estimated h-index of the conference with the number of leading scientists who have participated in presentations at that conference over the previous three years. This method ensures that the ranking reflects both the sustained scholarly influence and the ongoing engagement of high-impact contributors in each conference.

The current ranking incorporates Impact Score values gathered as of 2024-11-27. The determination process was both comprehensive and rigorous, involving the examination of more than 2,204 conferences selected following a detailed assessment of over 95,378 scientific documents published in the last three years by 6,160 distinguished scientists in Electronics and Electrical Engineering. Only those conferences that met the stringent selection criteria were included in the final ranking, underscoring the credibility and thoroughness of the evaluation process.

To ensure full transparency, a more detailed explanation of the methodology employed in computing the ranking scores is available on our Methodology Page. We invite readers to review this resource to gain a deeper understanding of the analytical processes and expert judgments informing our rankings.

Papers citation over time

A key indicator for each conference is its effectiveness in reaching other researchers with the papers published at that venue.

The chart below presents the interquartile range (first quartile 25%, median 50% and third quartile 75%) of the number of citations of articles over time.

The top authors publishing at IEEE MTT-S International Microwave and RF Conference (based on the number of publications) are:

  • M. Jaleel Akhtar (33 papers) published 8 papers at the last edition, 3 less than at the previous edition,
  • Shiban K. Koul (23 papers) published 7 papers at the last edition, 2 more than at the previous edition,
  • Mrinal Kanti Mandal (15 papers) published 7 papers at the last edition, 2 more than at the previous edition,
  • Ananjan Basu (13 papers) published 3 papers at the last edition, 2 less than at the previous edition,
  • Mohammad Jaleel Akhtar (10 papers) published 2 papers at the last edition the same number as at the previous edition.

The overall trend for top authors publishing at this conference is outlined below. The chart shows the number of publications at each edition of the conference for top authors.

Only papers with recognized affiliations are considered

The top affiliations publishing at IEEE MTT-S International Microwave and RF Conference (based on the number of publications) are:

  • Indian Institute of Technology Kanpur (49 papers) published 8 papers at the last edition, 5 less than at the previous edition,
  • Indian Institutes of Technology (34 papers) published 19 papers at the last edition, 15 more than at the previous edition,
  • Indian Space Research Organisation (32 papers) published 4 papers at the last edition, 3 less than at the previous edition,
  • Defence Research and Development Organisation (30 papers) published 5 papers at the last edition, 6 less than at the previous edition,
  • Indian Institute of Technology (BHU) Varanasi (22 papers) published 6 papers at the last edition, 5 less than at the previous edition.

The overall trend for top affiliations publishing at this conference is outlined below. The chart shows the number of publications at each edition of the conference for top affiliations.

Publication chance based on affiliation

The publication chance index shows the ratio of articles published by the best research institutions at the conference edition to all articles published within that conference. The best research institutions were selected based on the largest number of articles published during all editions of the conference.

The chart below presents the percentage ratio of articles from top institutions (based on their ranking of total papers).Top affiliations were grouped by their rank into the following tiers: top 1-10, top 11-20, top 21-50, and top 51+. Only articles with a recognized affiliation are considered.

During the most recent 2019 edition, 7.52% of publications had an unrecognized affiliation. Out of the publications with recognized affiliations, 48.78% were posted by at least one author from the top 10 institutions publishing at the conference. Another 13.82% included authors affiliated with research institutions from the top 11-20 affiliations. Institutions from the 21-50 range included 15.45% of all publications and 21.95% were from other institutions.

Returning Authors Index

A very common phenomenon observed among researchers publishing scientific articles is the intentional selection of conferences they have already attended in the past. In particular, it is worth analyzing the case when the authors participate in the same conference from year to year.

The Returning Authors Index presented below illustrates the ratio of authors who participated in both a given as well as the previous edition of the conference in relation to all participants in a given year.

Returning Institution Index

The graph below shows the Returning Institution Index, illustrating the ratio of institutions that participated in both a given and the previous edition of the conference in relation to all affiliations present in a given year.

The experience to innovation index

Our experience to innovation index was created to show a cross-section of the experience level of authors publishing at a conference. The index includes the authors publishing at the last edition of a conference, grouped by total number of publications throughout their academic career (P) and the total number of citations of these publications ever received (C).

The group intervals were selected empirically to best show the diversity of the authors' experiences, their labels were selected as a convenience, not as judgment. The authors were divided into the following groups:

  • Novice - P < 5 or C < 25 (the number of publications less than 5 or the number of citations less than 25),
  • Competent - P < 10 or C < 100 (the number of publications less than 10 or the number of citations less than 100),
  • Experienced - P < 25 or C < 625 (the number of publications less than 25 or the number of citations less than 625),
  • Master - P < 50 or C < 2500 (the number of publications less than 50 or the number of citations less than 2500),
  • Star - P ≥ 50 and C ≥ 2500 (both the number of publications greater than 50 and the number of citations greater than 2500).

The chart below illustrates experience levels of first authors in cases of publications with multiple authors.

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