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International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale. (3M-NANO)

Location: Chengdu , China

Conference dates: 7/31/2023 - 8/4/2023

Research H-index
2

Ranking & Metrics

Discipline name Position Best Scientists Publications D-Index
Materials Science 160 23 39 1
Engineering and Technology 401 9 63 2

Call for Papers

3M-NANO is the annual International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale. It will be held on 31 July – 4 August 2023 in Chengdu, China. The ultimate ambition of this conference series is to bridge the gap between nanosciences and engineering sciences, aiming at technology opportunities and new markets. The advanced technologies for manipulation, manufacturing and measurement at nanoscale promise novel revolutionary products and methods in numerous areas of application. Scientists working in research fields related to 3M-NANO topics are invited to submit papers. All accepted full papers (presented at the conference and following IEEE format) will be submitted in IEEE Xplore database and Ei Compendex. Selected papers will be recommended for publication in the IEEE Trans. on Automation Science & Engineering, Int. J of Nanomanufacturing, IFAC Mechatronics, Int. J of Optomechatronics, J of Micro-Bio Robotics, Journal of Bionic Engineering, Light (Science & Applications), Optics and Precision Engineering and other SCI/Ei journals.

Overview

This ranking presents a comprehensive evaluation of scientific conferences from the field of Engineering and Technology. The list has been meticulously assembled by Research.com, recognized as one of the leading websites for science research encompassing all major disciplines, including Engineering and Technology, and has been providing trusted data on scientific contributions since 2014.

The conference positions in this ranking are determined by a unique bibliometric score developed by Research.com. This score is calculated based on two main factors: the estimated h-index and the number of leading scientists who have participated in each conference during the three most recent years. The ranking thus reflects both the scholarly impact and the degree of engagement by renowned researchers, ensuring a multi-dimensional perspective on conference quality.

Impact Score values, captured on 2024-11-27, form a core component of this analysis. The rigorous process involved examining more than 2,262 conferences, chosen following a detailed and thorough inspection of over 26,934 scientific documents published during the past three years. The review accounted for the contributions of 9,385 leading and well-respected scientists in Engineering and Technology, underscoring the depth and expertise applied throughout the ranking process.

For those interested in understanding the specific methodology and statistical approach underlying the computation of the ranking scores, more comprehensive information is available on our Methodology Page.

Papers citation over time

A key indicator for each conference is its effectiveness in reaching other researchers with the papers published at that venue.

The chart below presents the interquartile range (first quartile 25%, median 50% and third quartile 75%) of the number of citations of articles over time.

The top authors publishing at International Conference on Manipulation, Manufacturing and Measurement on Nanoscale (based on the number of publications) are:

  • Zuobin Wang (56 papers) published 7 papers at the last edition, 2 more than at the previous edition,
  • Jinkai Xu (39 papers) published 12 papers at the last edition the same number as at the previous edition,
  • Huadong Yu (33 papers) published 8 papers at the last edition, 2 less than at the previous edition,
  • Yanling Tian (29 papers) published 4 papers at the last edition, 1 more than at the previous edition,
  • Dayou Li (19 papers) published 2 papers at the last edition the same number as at the previous edition.

The overall trend for top authors publishing at this conference is outlined below. The chart shows the number of publications at each edition of the conference for top authors.

Only papers with recognized affiliations are considered

The top affiliations publishing at International Conference on Manipulation, Manufacturing and Measurement on Nanoscale (based on the number of publications) are:

  • Changchun University of Science and Technology (132 papers) published 22 papers at the last edition, 1 less than at the previous edition,
  • Chinese Academy of Sciences (53 papers) published 2 papers at the last edition, 2 less than at the previous edition,
  • Tianjin University (38 papers) published 6 papers at the last edition the same number as at the previous edition,
  • Soochow University (Suzhou) (28 papers) absent at the last edition,
  • Jilin University (21 papers) published 2 papers at the last edition, 4 less than at the previous edition.

The overall trend for top affiliations publishing at this conference is outlined below. The chart shows the number of publications at each edition of the conference for top affiliations.

Publication chance based on affiliation

The publication chance index shows the ratio of articles published by the best research institutions at the conference edition to all articles published within that conference. The best research institutions were selected based on the largest number of articles published during all editions of the conference.

The chart below presents the percentage ratio of articles from top institutions (based on their ranking of total papers).Top affiliations were grouped by their rank into the following tiers: top 1-10, top 11-20, top 21-50, and top 51+. Only articles with a recognized affiliation are considered.

During the most recent 2019 edition, 2.53% of publications had an unrecognized affiliation. Out of the publications with recognized affiliations, 54.55% were posted by at least one author from the top 10 institutions publishing at the conference. Another 19.48% included authors affiliated with research institutions from the top 11-20 affiliations. Institutions from the 21-50 range included 18.18% of all publications and 7.79% were from other institutions.

Returning Authors Index

A very common phenomenon observed among researchers publishing scientific articles is the intentional selection of conferences they have already attended in the past. In particular, it is worth analyzing the case when the authors participate in the same conference from year to year.

The Returning Authors Index presented below illustrates the ratio of authors who participated in both a given as well as the previous edition of the conference in relation to all participants in a given year.

Returning Institution Index

The graph below shows the Returning Institution Index, illustrating the ratio of institutions that participated in both a given and the previous edition of the conference in relation to all affiliations present in a given year.

The experience to innovation index

Our experience to innovation index was created to show a cross-section of the experience level of authors publishing at a conference. The index includes the authors publishing at the last edition of a conference, grouped by total number of publications throughout their academic career (P) and the total number of citations of these publications ever received (C).

The group intervals were selected empirically to best show the diversity of the authors' experiences, their labels were selected as a convenience, not as judgment. The authors were divided into the following groups:

  • Novice - P < 5 or C < 25 (the number of publications less than 5 or the number of citations less than 25),
  • Competent - P < 10 or C < 100 (the number of publications less than 10 or the number of citations less than 100),
  • Experienced - P < 25 or C < 625 (the number of publications less than 25 or the number of citations less than 625),
  • Master - P < 50 or C < 2500 (the number of publications less than 50 or the number of citations less than 2500),
  • Star - P ≥ 50 and C ≥ 2500 (both the number of publications greater than 50 and the number of citations greater than 2500).

The chart below illustrates experience levels of first authors in cases of publications with multiple authors.

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