World's Best Scientists 2026 revealed!
IEEE

International Conference on IC Design and Technology (ICICDT)

Location: Hanoi , Vietnam

Submission deadline: 7/15/2022

Conference dates: 9/21/2022 - 9/23/2022

Research H-index
6

Ranking & Metrics

Discipline name Position Best Scientists Publications D-Index
Materials Science 129 11 12 2
Electronics and Electrical Engineering 319 35 56 6
Engineering and Technology 566 6 11 1

Call for Papers

Contributed papers are solicited in the following subject areas (but not limited to):
Advanced materials and processing technologies, power semiconductor technologies and circuits;
Advanced transistor and interconnect structures;
Advanced packaging, heterogenous integration, lateral and vertical (2.5D/3D) integration;
Variation and fault-tolerant designs, reliability issues and mitigation approaches, EDA and design optimizations across system, circuit, and/or device levels for high performance, energy efficiency, yield, and/or reliability;
RF, analog, mixed signal, and I/O circuits for future technology generations;
Simulation and modeling of advanced processes, devices, and circuits;
Design for manufacturing, yield, and test, System-on-Chip (SoC) and System-in-Package (SiP) design integration;
Emerging technologies, circuits and applications (MEMS, Memory, Internet of Things, Autonomous cars, Machine Learning, Artificial Intelligence).

Overview

The scientific conference ranking presented on this page is an authoritative assessment of conferences in the field of Engineering and Technology. This ranking has been meticulously prepared by Research.com, a recognized leader in providing reliable data on scientific contributions across all major academic domains, including Engineering and Technology, and supporting the research community with trusted information since 2014.

Conference positions in the ranking are determined based on a unique bibliometric score developed by Research.com. This score is carefully computed by integrating the estimated h-index and the number of leading scientists who have participated in each conference during the previous three years. The ranking further incorporates Impact Score values, with data gathered as of 2024-11-27, to ensure the most up-to-date assessment of conference influence.

The comprehensive process for ranking involved the evaluation of more than 2,262 conferences. These were selected following a detailed inspection and rigorous examination of over 26,934 scientific documents published in the last three years by 9,385 leading and highly respected scientists within the Engineering and Technology sector. This in-depth approach ensures that the ranking reflects both the breadth and depth of contemporary scientific contributions, providing researchers, institutions, and practitioners with robust, data-driven insights into the prominence and impact of conferences in this field.

For a thorough explanation of the analytical framework and the specific metrics used in the ranking calculation, we encourage you to consult our Methodology Page.

Papers citation over time

A key indicator for each conference is its effectiveness in reaching other researchers with the papers published at that venue.

The chart below presents the interquartile range (first quartile 25%, median 50% and third quartile 75%) of the number of citations of articles over time.

The top authors publishing at International Conference on IC Design and Technology (based on the number of publications) are:

  • Aaron Thean (15 papers) absent at the last edition,
  • Chua-Chin Wang (14 papers) absent at the last edition,
  • Ching-Te Chuang (11 papers) absent at the last edition,
  • Koji Eriguchi (11 papers) absent at the last edition,
  • Dina H. Triyoso (11 papers) published 1 paper at the last edition, 1 less than at the previous edition.

The overall trend for top authors publishing at this conference is outlined below. The chart shows the number of publications at each edition of the conference for top authors.

Only papers with recognized affiliations are considered

The top affiliations publishing at International Conference on IC Design and Technology (based on the number of publications) are:

  • STMicroelectronics (48 papers) published 1 paper at the last edition, 1 less than at the previous edition,
  • IBM (47 papers) published 2 papers at the last edition, 1 more than at the previous edition,
  • Katholieke Universiteit Leuven (45 papers) published 2 papers at the last edition,
  • National Sun Yat-sen University (28 papers) absent at the last edition,
  • Intel (22 papers) absent at the last edition.

The overall trend for top affiliations publishing at this conference is outlined below. The chart shows the number of publications at each edition of the conference for top affiliations.

Publication chance based on affiliation

The publication chance index shows the ratio of articles published by the best research institutions at the conference edition to all articles published within that conference. The best research institutions were selected based on the largest number of articles published during all editions of the conference.

The chart below presents the percentage ratio of articles from top institutions (based on their ranking of total papers).Top affiliations were grouped by their rank into the following tiers: top 1-10, top 11-20, top 21-50, and top 51+. Only articles with a recognized affiliation are considered.

During the most recent 2017 edition, 6.90% of publications had an unrecognized affiliation. Out of the publications with recognized affiliations, 22.22% were posted by at least one author from the top 10 institutions publishing at the conference. Another 18.52% included authors affiliated with research institutions from the top 11-20 affiliations. Institutions from the 21-50 range included 37.04% of all publications and 22.22% were from other institutions.

Returning Authors Index

A very common phenomenon observed among researchers publishing scientific articles is the intentional selection of conferences they have already attended in the past. In particular, it is worth analyzing the case when the authors participate in the same conference from year to year.

The Returning Authors Index presented below illustrates the ratio of authors who participated in both a given as well as the previous edition of the conference in relation to all participants in a given year.

Returning Institution Index

The graph below shows the Returning Institution Index, illustrating the ratio of institutions that participated in both a given and the previous edition of the conference in relation to all affiliations present in a given year.

The experience to innovation index

Our experience to innovation index was created to show a cross-section of the experience level of authors publishing at a conference. The index includes the authors publishing at the last edition of a conference, grouped by total number of publications throughout their academic career (P) and the total number of citations of these publications ever received (C).

The group intervals were selected empirically to best show the diversity of the authors' experiences, their labels were selected as a convenience, not as judgment. The authors were divided into the following groups:

  • Novice - P < 5 or C < 25 (the number of publications less than 5 or the number of citations less than 25),
  • Competent - P < 10 or C < 100 (the number of publications less than 10 or the number of citations less than 100),
  • Experienced - P < 25 or C < 625 (the number of publications less than 25 or the number of citations less than 625),
  • Master - P < 50 or C < 2500 (the number of publications less than 50 or the number of citations less than 2500),
  • Star - P ≥ 50 and C ≥ 2500 (both the number of publications greater than 50 and the number of citations greater than 2500).

The chart below illustrates experience levels of first authors in cases of publications with multiple authors.

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Best Scientists who published in this Conference