IEEE International Conference on Electronics and Nanotechnology (ELNANO)

The scientific conference ranking presented on this page offers a comprehensive evaluation of conferences within the field of Materials Science. This ranking has been meticulously developed by Research.com, a prominent authority in the domain of science research, known for delivering reliable data and insights about scientific contributions across all major fields since 2014.

Each conference's position in the ranking is determined through an exclusive bibliometric score, created by Research.com. This score is calculated using a combination of the estimated h-index and the number of leading scientists who have participated in the conferences over the previous three years. The assessment ensures that the ranking reflects both the quality of scholarly output and the prominence of contributors associated with each conference.

The ranking makes use of the most recent Impact Score values, which were collected as of 2024-11-27. The methodology involved a thorough consideration and analysis of more than 1,443 conferences, carefully selected following a detailed review process. This review included the examination of over 14,323 scientific documents, authored in the last three years by 12,755 leading and highly respected scientists specializing in Materials Science.

Further details regarding the methodology employed in computing these ranking scores, including criteria and step-by-step procedures, can be accessed on our Methodology Page.

Papers citation over time

A key indicator for each conference is its effectiveness in reaching other researchers with the papers published at that venue.

The chart below presents the interquartile range (first quartile 25%, median 50% and third quartile 75%) of the number of citations of articles over time.

Top authors and change over time

The top authors publishing at IEEE International Conference on Electronics and Nanotechnology (based on the number of publications) are:

• Sergey Edward Lyshevski (20 papers) published 5 papers at the last edition,
• Valeri Lozovski (19 papers) published 2 papers at the last edition the same number as at the previous edition,
• Sergey Krivenko (17 papers) published 3 papers at the last edition the same number as at the previous edition,
• Yuriy Prokopenko (17 papers) published 2 papers at the last edition the same number as at the previous edition,
• Yuriy Poplavko (16 papers) published 2 papers at the last edition, 1 less than at the previous edition.

The overall trend for top authors publishing at this conference is outlined below. The chart shows the number of publications at each edition of the conference for top authors.

Top affiliations and change over time

Only papers with recognized affiliations are considered

The top affiliations publishing at IEEE International Conference on Electronics and Nanotechnology (based on the number of publications) are:

• National Technical University (188 papers) published 33 papers at the last edition, 5 less than at the previous edition,
• Taras Shevchenko National University of Kyiv (103 papers) published 28 papers at the last edition, 5 more than at the previous edition,
• Kyiv Polytechnic Institute (49 papers) published 18 papers at the last edition, 7 more than at the previous edition,
• Lviv Polytechnic (45 papers) published 10 papers at the last edition, 1 less than at the previous edition,
• National Academy of Sciences of Ukraine (41 papers) published 7 papers at the last edition, 3 less than at the previous edition.

The overall trend for top affiliations publishing at this conference is outlined below. The chart shows the number of publications at each edition of the conference for top affiliations.

Publication chance based on affiliation

The publication chance index shows the ratio of articles published by the best research institutions at the conference edition to all articles published within that conference. The best research institutions were selected based on the largest number of articles published during all editions of the conference.

The chart below presents the percentage ratio of articles from top institutions (based on their ranking of total papers).Top affiliations were grouped by their rank into the following tiers: top 1-10, top 11-20, top 21-50, and top 51+. Only articles with a recognized affiliation are considered.

During the most recent 2020 edition, 10.87% of publications had an unrecognized affiliation. Out of the publications with recognized affiliations, 76.22% were posted by at least one author from the top 10 institutions publishing at the conference. Another 8.54% included authors affiliated with research institutions from the top 11-20 affiliations. Institutions from the 21-50 range included 7.32% of all publications and 7.93% were from other institutions.

Returning Authors Index

A very common phenomenon observed among researchers publishing scientific articles is the intentional selection of conferences they have already attended in the past. In particular, it is worth analyzing the case when the authors participate in the same conference from year to year.

The Returning Authors Index presented below illustrates the ratio of authors who participated in both a given as well as the previous edition of the conference in relation to all participants in a given year.

Returning Institution Index

The graph below shows the Returning Institution Index, illustrating the ratio of institutions that participated in both a given and the previous edition of the conference in relation to all affiliations present in a given year.

The experience to innovation index

Our experience to innovation index was created to show a cross-section of the experience level of authors publishing at a conference. The index includes the authors publishing at the last edition of a conference, grouped by total number of publications throughout their academic career (P) and the total number of citations of these publications ever received (C).

The group intervals were selected empirically to best show the diversity of the authors' experiences, their labels were selected as a convenience, not as judgment. The authors were divided into the following groups:

• Novice - P < 5 or C < 25 (the number of publications less than 5 or the number of citations less than 25),
• Competent - P < 10 or C < 100 (the number of publications less than 10 or the number of citations less than 100),
• Experienced - P < 25 or C < 625 (the number of publications less than 25 or the number of citations less than 625),
• Master - P < 50 or C < 2500 (the number of publications less than 50 or the number of citations less than 2500),
• Star - P ≥ 50 and C ≥ 2500 (both the number of publications greater than 50 and the number of citations greater than 2500).

The chart below illustrates experience levels of first authors in cases of publications with multiple authors.