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IEEE

ARFTG Microwave Measurement Conference (ARFTG)

Location: Las Vegas , United States

Conference dates: 1/22/2023 - 1/25/2023

Research H-index
5

Ranking & Metrics

Discipline name Position Best Scientists Publications D-Index
Electronics and Electrical Engineering 391 32 47 5

Call for Papers

ARFTG-100th Conference focus topics:

Calibration and characterization, incl. cryogenic, for quantum technology
EM characterization, incl. de-embedding, of materials and biological samples
On-wafer measurements of RF to subTHz devices and circuits
Waveguide and free-space subTHz and THz measurements
Generation and measurement of sub-THz signals with wideband modulation
Nonlinear characterizations, incl. linearization, of devices, circuits, and systems
Over the air (OTA) calibration and measurement for 5G/6G and Internet of Things (IoT)
Other recent developments in metrology incl. measurement uncertainty

Overview

The conference ranking presented on this page provides a comprehensive evaluation of scientific conferences within the field of Electronics and Electrical Engineering. This ranking has been prepared by Research.com, recognized as one of the leading platforms for science research across all major disciplines. Since 2014, Research.com has been delivering reliable and trusted data on scientific contributions, including those in Electronics and Electrical Engineering.

The placement of each conference in the list is determined by a proprietary bibliometric score uniquely developed by Research.com. This score is the result of a meticulous calculation that incorporates both the estimated h-index and the number of leading scientists who have participated in the conference over the preceding three years. Such an approach ensures that the ranking reflects not only the quantity but also the quality and relevance of scientific engagement at each event.

Impact Score values included in this ranking were collected on 2024-11-27, ensuring that the data presented is both current and reflective of recent scientific activities. The rigorous ranking process involved the careful examination of more than 2,204 conferences, selected following a detailed inspection of conference characteristics and a thorough analysis of over 95,378 scientific documents published within the last three years. This extensive review was performed in collaboration with 6,160 distinguished and respected scientists active in the field of Electronics and Electrical Engineering.

These measures guarantee that the ranking is the outcome of a comprehensive and robust analytical process, leveraging in-depth expertise and exhaustive research methodology. To maintain transparency and academic rigor, further details regarding the computation of the ranking scores and an explanation of the underlying methodology are available on our Methodology Page.

Papers citation over time

A key indicator for each conference is its effectiveness in reaching other researchers with the papers published at that venue.

The chart below presents the interquartile range (first quartile 25%, median 50% and third quartile 75%) of the number of citations of articles over time.

The top authors publishing at ARFTG Microwave Measurement Conference (based on the number of publications) are:

  • Dominique Schreurs (27 papers) published 4 papers at the last edition, 1 more than at the previous edition,
  • Masahiro Horibe (25 papers) published 2 papers at the last edition, 1 less than at the previous edition,
  • Karel Hoffmann (24 papers) published 1 paper at the last edition the same number as at the previous edition,
  • Nick M. Ridler (23 papers) published 1 paper at the last edition the same number as at the previous edition,
  • Patrick Roblin (22 papers) published 1 paper at the last edition the same number as at the previous edition.

The overall trend for top authors publishing at this conference is outlined below. The chart shows the number of publications at each edition of the conference for top authors.

Only papers with recognized affiliations are considered

The top affiliations publishing at ARFTG Microwave Measurement Conference (based on the number of publications) are:

  • National Institute of Standards and Technology (49 papers) published 10 papers at the last edition, 4 more than at the previous edition,
  • National Physical Laboratory (31 papers) published 2 papers at the last edition, 1 less than at the previous edition,
  • Agilent Technologies (30 papers) absent at the last edition,
  • Ohio State University (27 papers) published 1 paper at the last edition the same number as at the previous edition,
  • Katholieke Universiteit Leuven (27 papers) published 4 papers at the last edition, 1 more than at the previous edition.

The overall trend for top affiliations publishing at this conference is outlined below. The chart shows the number of publications at each edition of the conference for top affiliations.

Publication chance based on affiliation

The publication chance index shows the ratio of articles published by the best research institutions at the conference edition to all articles published within that conference. The best research institutions were selected based on the largest number of articles published during all editions of the conference.

The chart below presents the percentage ratio of articles from top institutions (based on their ranking of total papers).Top affiliations were grouped by their rank into the following tiers: top 1-10, top 11-20, top 21-50, and top 51+. Only articles with a recognized affiliation are considered.

During the most recent 2017 edition, 10.20% of publications had an unrecognized affiliation. Out of the publications with recognized affiliations, 54.55% were posted by at least one author from the top 10 institutions publishing at the conference. Another 2.27% included authors affiliated with research institutions from the top 11-20 affiliations. Institutions from the 21-50 range included 2.27% of all publications and 40.91% were from other institutions.

Returning Authors Index

A very common phenomenon observed among researchers publishing scientific articles is the intentional selection of conferences they have already attended in the past. In particular, it is worth analyzing the case when the authors participate in the same conference from year to year.

The Returning Authors Index presented below illustrates the ratio of authors who participated in both a given as well as the previous edition of the conference in relation to all participants in a given year.

Returning Institution Index

The graph below shows the Returning Institution Index, illustrating the ratio of institutions that participated in both a given and the previous edition of the conference in relation to all affiliations present in a given year.

The experience to innovation index

Our experience to innovation index was created to show a cross-section of the experience level of authors publishing at a conference. The index includes the authors publishing at the last edition of a conference, grouped by total number of publications throughout their academic career (P) and the total number of citations of these publications ever received (C).

The group intervals were selected empirically to best show the diversity of the authors' experiences, their labels were selected as a convenience, not as judgment. The authors were divided into the following groups:

  • Novice - P < 5 or C < 25 (the number of publications less than 5 or the number of citations less than 25),
  • Competent - P < 10 or C < 100 (the number of publications less than 10 or the number of citations less than 100),
  • Experienced - P < 25 or C < 625 (the number of publications less than 25 or the number of citations less than 625),
  • Master - P < 50 or C < 2500 (the number of publications less than 50 or the number of citations less than 2500),
  • Star - P ≥ 50 and C ≥ 2500 (both the number of publications greater than 50 and the number of citations greater than 2500).

The chart below illustrates experience levels of first authors in cases of publications with multiple authors.

Related Online Degrees & Career Pathways

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Best Scientists who published in this Conference

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