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IEEE

9th IEEE Workshop on Wide Bandgap Power Devices and Applications (WiPDA)

Location: Redondo Beach , United States

Submission deadline: 6/10/2022

Conference dates: 11/7/2022 - 11/9/2022

Research H-index
11

Ranking & Metrics

Discipline name Position Best Scientists Publications D-Index
Materials Science 21 23 41 7
Electronics and Electrical Engineering 107 71 187 11
Engineering and Technology 256 11 22 3

Call for Papers

Topics of interest

Heteroepitaxial & Bulk Materials Growth
Gate Dielectrics & Surface Passivation
Device Structures & Fabrication Techniques
Device Characterization & Modeling
Very-High Efficiency Or Compact Converters
Safe Operating Areas Of Wide Bandgap Devices, including Short Circuit, Spike, &Transient Tolerance
Harsh Environment (High Temperature) Operation & Reliability
Packaging Power Modules & ICs
Gate Drive & Other Auxiliary Circuits
High-Performance Passive Components
Hard-Switched & Soft-Switched Application Analysis
Applications in Renewable Energy & Energy Storage, Transportation, Industrial Drives, Grid Power Systems, Space and Aerospace
Wide Bandgap System Design Philosophies & Strategies
Radio Frequency (RF) GaN
Technology Roadmap of Wide Bandgap Including Devices, Applications and Packaging

Overview

The ranking presented on this page offers a comprehensive evaluation of scientific conferences in the field of Engineering and Technology, meticulously curated to serve both the academic and professional communities. Developed by Research.com—one of the leading resources for science research across all major domains—it reflects an ongoing commitment to providing trusted and objective data on scientific contributions since 2014.

Each conference’s position in this ranking is determined by a unique bibliometric score, designed and calculated by Research.com. This score combines the estimated h-index with the number of leading scientists who have participated in the conference within the past three years, offering a robust measure of both impact and influence. The Impact Score values featured in this ranking were gathered on 2024-11-27, ensuring the relevance and currency of the information provided.

The ranking process involved the thorough examination of more than 2,262 conferences, all selected following detailed inspection and rigorous review of over 26,934 scientific documents published over the last three years. This analysis was supported by insights from 9,385 leading and well-respected scientists in Engineering and Technology, reflecting the depth and complexity of Research.com’s assessment framework.

To better understand the methodology and computations underlying the ranking scores, readers are encouraged to consult our Methodology Page, where additional details and explanations are provided.

Papers citation over time

A key indicator for each conference is its effectiveness in reaching other researchers with the papers published at that venue.

The chart below presents the interquartile range (first quartile 25%, median 50% and third quartile 75%) of the number of citations of articles over time.

The top authors publishing at IEEE Workshop on Wide Bandgap Power Devices and Applications (based on the number of publications) are:

  • Jin Wang (22 papers) absent at the last edition,
  • Alex Q. Huang (20 papers) absent at the last edition,
  • Subhashish Bhattacharya (15 papers) absent at the last edition,
  • Rolando Burgos (12 papers) absent at the last edition,
  • He Li (12 papers) absent at the last edition.

The overall trend for top authors publishing at this conference is outlined below. The chart shows the number of publications at each edition of the conference for top authors.

Only papers with recognized affiliations are considered

The top affiliations publishing at IEEE Workshop on Wide Bandgap Power Devices and Applications (based on the number of publications) are:

  • North Carolina State University (46 papers) absent at the last edition,
  • Ohio State University (34 papers) absent at the last edition,
  • University of Arkansas (29 papers) absent at the last edition,
  • University of Tennessee (22 papers) absent at the last edition,
  • Virginia Tech (20 papers) absent at the last edition.

The overall trend for top affiliations publishing at this conference is outlined below. The chart shows the number of publications at each edition of the conference for top affiliations.

Publication chance based on affiliation

The publication chance index shows the ratio of articles published by the best research institutions at the conference edition to all articles published within that conference. The best research institutions were selected based on the largest number of articles published during all editions of the conference.

The chart below presents the percentage ratio of articles from top institutions (based on their ranking of total papers).Top affiliations were grouped by their rank into the following tiers: top 1-10, top 11-20, top 21-50, and top 51+. Only articles with a recognized affiliation are considered.

During the most recent 2021 edition, 100.00% of publications had an unrecognized affiliation. Out of the publications with recognized affiliations, nan% were posted by at least one author from the top 10 institutions publishing at the conference. Another nan% included authors affiliated with research institutions from the top 11-20 affiliations. Institutions from the 21-50 range included nan% of all publications and nan% were from other institutions.

Returning Authors Index

A very common phenomenon observed among researchers publishing scientific articles is the intentional selection of conferences they have already attended in the past. In particular, it is worth analyzing the case when the authors participate in the same conference from year to year.

The Returning Authors Index presented below illustrates the ratio of authors who participated in both a given as well as the previous edition of the conference in relation to all participants in a given year.

Returning Institution Index

The graph below shows the Returning Institution Index, illustrating the ratio of institutions that participated in both a given and the previous edition of the conference in relation to all affiliations present in a given year.

The experience to innovation index

Our experience to innovation index was created to show a cross-section of the experience level of authors publishing at a conference. The index includes the authors publishing at the last edition of a conference, grouped by total number of publications throughout their academic career (P) and the total number of citations of these publications ever received (C).

The group intervals were selected empirically to best show the diversity of the authors' experiences, their labels were selected as a convenience, not as judgment. The authors were divided into the following groups:

  • Novice - P < 5 or C < 25 (the number of publications less than 5 or the number of citations less than 25),
  • Competent - P < 10 or C < 100 (the number of publications less than 10 or the number of citations less than 100),
  • Experienced - P < 25 or C < 625 (the number of publications less than 25 or the number of citations less than 625),
  • Master - P < 50 or C < 2500 (the number of publications less than 50 or the number of citations less than 2500),
  • Star - P ≥ 50 and C ≥ 2500 (both the number of publications greater than 50 and the number of citations greater than 2500).

The chart below illustrates experience levels of first authors in cases of publications with multiple authors.

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Best Scientists who published in this Conference