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D-Index & Metrics

Mathematics

D-Index
54
Citations
10791
World Ranking
842
National Ranking
409

Research.com Recognitions

  • 2014 - Fellow of the American Association for the Advancement of Science (AAAS)
  • 2006 - Shewhart Medal

Overview

William Q. Meeker is affiliated with Iowa State University in the United States. Their research primarily spans the fields of Mathematics and Engineering, with a focus on Statistics and Probability within those disciplines.

The scientist's research topics include:

  • Statistical Distribution Estimation and Applications
  • Reliability and Maintenance Optimization
  • Probabilistic and Robust Engineering Design
  • Statistical Methods and Bayesian Inference
  • Fatigue and Fracture Mechanics
  • Software Reliability and Analysis Research
  • Statistical Methods and Inference

Frequent coauthors have included:

  • Qinglong Tian
  • Yili Hong
  • Daniel J. Nordman
  • Colin Lewis-Beck

Publications by William Q. Meeker have appeared in various venues, notably:

  • arXiv (Cornell University)
  • Applied Stochastic Models in Business and Industry
  • Technometrics
  • Scientific Reports
  • The American Statistician

Selected recent papers include:

  • Applications of the Fractional-Random-Weight Bootstrap, 2020, The American Statistician
  • Specifying prior distributions in reliability applications, 2023, Applied Stochastic Models in Business and Industry
  • Reliability Analysis of Artificial Intelligence Systems Using Recurrent Events Data from Autonomous Vehicles, 2022, Journal of the Royal Statistical Society Series C (Applied Statistics)
  • Methods to Compute Prediction Intervals: A Review and New Results, 2022, Statistical Science
  • Seasonal warranty prediction based on recurrent event data, 2020, The Annals of Applied Statistics

The scientist has received recognition including the Fellow of the American Association for the Advancement of Science (AAAS) in 2014 and the Shewhart Medal in 2006.

Best Publications

  • Statistical Intervals: A Guide for Practitioners

    Gerald J. Hahn;William Q. Meeker;Luis A. Escobar

  • A Review of Accelerated Test Models

    Luis A. Escobar;William Q. Meeker

  • Accelerated degradation tests: modeling and analysis

    William Q. Meeker;Luis A. Escobar;C. Joseph Lu

  • Teaching about Approximate Confidence Regions Based on Maximum Likelihood Estimation

    William Q. Meeker;Luis A. Escobar

  • Estimating fatigue curves with the random fatigue-limit model

    Francis G. Pascual;William Q. Meeker

  • Theory for Optimum Accelerated Censored Life Tests for Weibull and Extreme Value Distributions

    Wayne Nelson;William Q. Meeker

  • The nontruncated marginal of a truncated bivariate normal distribution

    Barry C. Arnold;Robert J. Beaver;Richard A. Groeneveld;William Q. Meeker

  • Reliability Meets Big Data: Opportunities and Challenges

    William Q. Meeker;Yili Hong

  • A Review of Recent Research and Current Issues in Accelerated Testing

    William Q. Meeker;Luis A. Escobar

  • A Comparison of Accelerated Life Test Plans for Weibull and Lognormal Distributions and Type I Censoring

    William Q. Meeker

  • Selected Tables in Mathematical Statistics

    Norman D. Neff;William Q. Meeker

  • Assessing influence in regression analysis with censored data.

    Luis A. Escobar;William Q. Meeker

  • A Comparison of Maximum Likelihood and Median-Rank Regression for Weibull Estimation

    Ulrike Genschel;William Q. Meeker

  • Statistical tools for the rapid development and evaluation of high-reliability products

    W.Q. Meeker;M. Hamada

  • Prediction of remaining life of power transformers based on left truncated and right censored lifetime data

    Yili Hong;William Q. Meeker;James D. McCalley

  • Bayesian Methods for Planning Accelerated Life Tests

    Yao Zhang;William Q Meeker

  • Optimum Accelerated Life Tests Wth a Nonconstant Scale Parameter

    Carol A. Meeter;William Q. Meeker

  • An Accelerated Life Test Model Based on Reliability Kinetics

    William Q. Meeker;Michael J. LuValle

  • Planning accelerated life tests with two or more experimental factors

    Luis A. Escobar;William Q. Meeker

  • Optimum Accelerated Life-Tests for the Weibull and Extreme Value Distributions

    William Q. Meeker;Wayne Nelson

  • System Reliability Theory: Models, Statistical Methods, and Applications, Second Edition

    Thomas P. Ryan;William Q. Meeker

  • Statistical Intervals: A Guide for Practitioners and Researchers

    William Q. Meeker;Gerald J. Hahn;Luis A. Escobar

  • Accelerated Testing: Statistical Models, Test Plans, and Data Analyses

    William Q. Meeker

Frequent Co-Authors

James D. McCalley
James D. McCalley Iowa State University
Jiming Song
Jiming Song Iowa State University
Vasant Honavar
Vasant Honavar Pennsylvania State University
Jonathan W. Martin
Jonathan W. Martin Stockholm University
Larry V. McIntire
Larry V. McIntire Georgia Institute of Technology
Robert A. Good
Robert A. Good University of Minnesota
Sri Sritharan
Sri Sritharan Iowa State University
Slawomir Koziel
Slawomir Koziel Reykjavík University
Dianne Cook
Dianne Cook Monash University
James M. Anderson
James M. Anderson Case Western Reserve University

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