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Robert J. Burkholder publication distribution in Electronics and Electrical Engineering in 2026

The chart shows the distribution of publications by all Research.com ranked scientists in the field of Electronics and Electrical Engineering in 2026. The highlighted bar marks where Robert J. Burkholder sits on this spectrum.

34–53 publications: 24 scientists 54–73 publications: 52 scientists 74–93 publications: 114 scientists 94–113 publications: 203 scientists 114–133 publications: 269 scientists 134–153 publications: 355 scientists 154–173 publications: 403 scientists 174–193 publications: 445 scientists 194–213 publications: 430 scientists 214–233 publications: 431 scientists 234–253 publications: 399 scientists 254–273 publications: 366 scientists 274–293 publications: 335 scientists 294–313 publications: 300 scientists 314–333 publications: 276 scientists 334–353 publications: 250 scientists 354–373 publications: 214 scientists 374–393 publications: 187 scientists 394–413 publications: 152 scientists 414–433 publications: 169 scientists 434–453 publications: 147 scientists 454–473 publications: 111 scientists 474–493 publications: 117 scientists 494–513 publications: 103 scientists 514–533 publications: 99 scientists 534–553 publications: 92 scientists 554–573 publications: 75 scientists 574–593 publications: 58 scientists 594–613 publications: 69 scientists 614–633 publications: 50 scientists 634–653 publications: 62 scientists 654–673 publications: 54 scientists 674–693 publications: 44 scientists 694–713 publications: 37 scientists 714–733 publications: 28 scientists 734–753 publications: 26 scientists 754–773 publications: 26 scientists 774–793 publications: 19 scientists 794–813 publications: 23 scientists 814–833 publications: 20 scientists 834–853 publications: 16 scientists 854–873 publications: 20 scientists 874–893 publications: 11 scientists 894–913 publications: 11 scientists 914–933 publications: 16 scientists 934–953 publications: 13 scientists 954–973 publications: 10 scientists 974–993 publications: 11 scientists 994–1,013 publications: 9 scientists 1,014–1,033 publications: 9 scientists 1,034–1,053 publications: 10 scientists 1,054–1,064 publications: 6 scientists 1,065+ publications: 99 scientists
34 publications 1,065+

The last bar groups every scientist with 1,065 publications or more.

Robert J. Burkholder D-index placement in Electronics and Electrical Engineering in 2026

The chart shows the D-index (discipline H-index) distribution of Electronics and Electrical Engineering scientists ranked by Research.com in 2026. The highlighted bar marks where Robert J. Burkholder sits on this spectrum.

30 D-Index: 178 scientists 31 D-Index: 257 scientists 32 D-Index: 263 scientists 33 D-Index: 262 scientists 34 D-Index: 244 scientists 35 D-Index: 236 scientists 36 D-Index: 211 scientists 37 D-Index: 220 scientists 38 D-Index: 214 scientists 39 D-Index: 214 scientists 40 D-Index: 205 scientists 41 D-Index: 187 scientists 42 D-Index: 194 scientists 43 D-Index: 201 scientists 44 D-Index: 155 scientists 45 D-Index: 189 scientists 46 D-Index: 148 scientists 47 D-Index: 160 scientists 48 D-Index: 134 scientists 49 D-Index: 130 scientists 50 D-Index: 141 scientists 51 D-Index: 156 scientists 52 D-Index: 108 scientists 53 D-Index: 130 scientists 54 D-Index: 112 scientists 55 D-Index: 97 scientists 56 D-Index: 111 scientists 57 D-Index: 102 scientists 58 D-Index: 108 scientists 59 D-Index: 120 scientists 60 D-Index: 103 scientists 61 D-Index: 93 scientists 62 D-Index: 92 scientists 63 D-Index: 74 scientists 64 D-Index: 77 scientists 65 D-Index: 73 scientists 66 D-Index: 64 scientists 67 D-Index: 69 scientists 68 D-Index: 60 scientists 69 D-Index: 39 scientists 70 D-Index: 57 scientists 71 D-Index: 59 scientists 72 D-Index: 46 scientists 73 D-Index: 49 scientists 74 D-Index: 38 scientists 75 D-Index: 35 scientists 76 D-Index: 32 scientists 77 D-Index: 35 scientists 78 D-Index: 31 scientists 79 D-Index: 22 scientists 80 D-Index: 34 scientists 81 D-Index: 31 scientists 82 D-Index: 34 scientists 83 D-Index: 23 scientists 84 D-Index: 18 scientists 85 D-Index: 30 scientists 86 D-Index: 19 scientists 87 D-Index: 19 scientists 88 D-Index: 20 scientists 89 D-Index: 8 scientists 90 D-Index: 17 scientists 91 D-Index: 7 scientists 92 D-Index: 14 scientists 93 D-Index: 9 scientists 94 D-Index: 15 scientists 95 D-Index: 10 scientists 96 D-Index: 12 scientists 97 D-Index: 10 scientists 98 D-Index: 10 scientists 99 D-Index: 12 scientists 100 D-Index: 16 scientists 101 D-Index: 5 scientists 102 D-Index: 7 scientists 103 D-Index: 7 scientists 104 D-Index: 8 scientists 105 D-Index: 9 scientists 106 D-Index: 13 scientists 107 D-Index: 4 scientists 108 D-Index: 5 scientists 109 D-Index: 10 scientists 110 D-Index: 8 scientists 111+ D-Index: 96 scientists
30 D-Index 111+

The last bar groups every scientist with 111 D-Index or more.

Research.com Recognitions

  • 2005 - IEEE Fellow For contributions to computing electromagnetic wave scattering from realistically complex structures.

Overview

Robert J. Burkholder is affiliated with The Ohio State University in the United States. Their main field of study is Engineering, with a specific focus on subfields including Aerospace Engineering, Electrical and Electronic Engineering, Atomic and Molecular Physics and Optics, Biomedical Engineering, and Ocean Engineering.

Their research spans various specialized topics such as:

  • Electromagnetic Scattering and Analysis
  • Microwave Imaging and Scattering Analysis
  • Geophysical Methods and Applications
  • Advanced SAR Imaging Techniques
  • Electromagnetic Compatibility and Measurements
  • Radio Wave Propagation Studies
  • Precipitation Measurement and Analysis

Robert J. Burkholder has contributed multiple articles to scientific literature. Some of their recent papers include:

  • Frequency Diversity in Electromagnetic Remote Sensing of Lower Atmospheric Refractivity, 2021, IEEE Transactions on Antennas and Propagation
  • Refractivity Inversions From Point-To-Point X-Band Radar Propagation Measurements, 2022, Radio Science
  • A 3-D Novel Fast Back-Projection Imaging Algorithm for Stratified Media Based on Near-Field Monostatic and Bistatic SAR, 2020, IEEE Transactions on Antennas and Propagation
  • Measurements Accuracy Evaluation for ATSC Signal-Based Passive Radar Systems, 2021, IEEE Transactions on Aerospace and Electronic Systems
  • On-the-Fly Dynamic Mode Decomposition for Rapid Time-Extrapolation and Analysis of Cavity Resonances, 2023, IEEE Transactions on Antennas and Propagation

The scientist frequently publishes in the following venues:

  • IEEE Transactions on Antennas and Propagation
  • IEEE Transactions on Electromagnetic Compatibility
  • IEEE Geoscience and Remote Sensing Letters
  • Radio Science
  • IEEE Transactions on Aerospace and Electronic Systems

Notable frequent co-authors include Danilo Erricolo, Sunny Tse, Francesco P. Andriulli, Vincenzo Galdi, and Jiro Hirokawa, with multiple collaborations recorded alongside each.

In 2005, Robert J. Burkholder was named an IEEE Fellow for contributions to computing electromagnetic wave scattering from realistically complex structures.

Best Publications

  • An iterative physical optics approach for analyzing the electromagnetic scattering by large open-ended cavities

    F. Obelleiro-Basteiro;J. Luis Rodriguez;R.J. Burkholder

  • The generalized forward-backward method for analyzing the scattering from targets on ocean-like rough surfaces

    M. Rodriguez Pino;L. Landesa;J.L. Rodriguez;F. Obelleiro

  • Loop star basis functions and a robust preconditioner for EFIE scattering problems

    Jin-Fa Lee;R. Lee;R.J. Burkholder

  • Modal, ray, and beam techniques for analyzing the EM scattering by open-ended waveguide cavities

    P.H. Pathak;R.J. Burkholder

  • Forward-backward iterative physical optics algorithm for computing the RCS of open-ended cavities

    R.J. Burkholder;T. Lundin

  • CASPER: Coupled Air–Sea Processes and Electromagnetic Ducting Research

    Qing Wang;Denny P. Alappattu;Stephanie Billingsley;Byron Blomquist

  • Novel Gaussian beam method for the rapid analysis of large reflector antennas

    Hsi-Tseng Chou;P.H. Pathak;R.J. Burkholder

  • Comparison of monostatic and bistatic radar images

    R.J. Burkholder;L.J. Gupta;J.T. Johnson

  • The application of FDTD in hybrid methods for cavity scattering analysis

    Tse-Tong Chia;R.J. Burkholder;R. Lee

  • A Numerical Study of the Retrieval of Sea Surface Height Profiles From Low Grazing Angle Radar Data

    J.T. Johnson;R.J. Burkholder;J.V. Toporkov;D.R. Lyzenga

  • Coherence Factor Enhancement of Through-Wall Radar Images

    R J Burkholder;K E Browne

  • Efficient method of moments formulation for large PEC scattering problems using asymptotic phasefront extraction (APE)

    Do-Hoon Kwon;R.J. Burkholder;P.H. Pathak

  • High‐frequency electromagnetic scattering by open‐ended waveguide cavities

    P. H. Pathak;R. J. Burkholder

  • Through-Wall Opportunistic Sensing System Utilizing a Low-Cost Flat-Panel Array

    K E Browne;R J Burkholder;J L Volakis

  • Spectral acceleration of the generalized forward-backward method

    M.R. Pino;R.J. Burkholder;F. Obelleiro

  • Hybrid matching pursuit for distributed through-wall radar imaging

    Gang Li;Robert J. Burkholder

  • Analysis of EM penetration into and scattering by electrically large open waveguide cavities using Gaussian beam shooting

    R.J. Burkholder;P.H. Pathak

  • High-Frequency EM Characterization of Through-Wall Building Imaging

    P.C. Chang;R.J. Burkholder;J.L. Volakis;R.J. Marhefka

  • RFID shelf antenna system

    Burnside Walter D;Burkholder Robert J;Lim Chan-Ping

  • Fast dual-MGS block-factorization algorithm for dense MoM matrices

    R.J. Burkholder;Jin-Fa Lee

Frequent Co-Authors

John L. Volakis
John L. Volakis Florida International University
Joel T. Johnson
Joel T. Johnson The Ohio State University
Asimina Kiourti
Asimina Kiourti The Ohio State University
Kubilay Sertel
Kubilay Sertel The Ohio State University
Leung Tsang
Leung Tsang University of Michigan–Ann Arbor
Do-Hoon Kwon
Do-Hoon Kwon University of Massachusetts Amherst
Agostino Monorchio
Agostino Monorchio University of Pisa
Randolph L. Moses
Randolph L. Moses The Ohio State University
William J. Plant
William J. Plant University of Washington
Raj Mittra
Raj Mittra Pennsylvania State University

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