The chart shows the distribution of publications by all Research.com ranked scientists in the field of Materials Science in 2026. The highlighted bar marks where Edward T. Samulski sits on this spectrum.
This scientist: 363 publications — 72nd percentile
72% of scientists in this discipline score the same or lower.
The last bar groups every scientist with 1,163 publications or more.
The chart shows the D-index (discipline H-index) distribution of Materials Science scientists ranked by Research.com in 2026. The highlighted bar marks where Edward T. Samulski sits on this spectrum.
This scientist: 74 D-Index — 72nd percentile
72% of scientists in this discipline score the same or lower.
The last bar groups every scientist with 165 D-Index or more.
Edward T. Samulski is affiliated with the University of North Carolina at Chapel Hill in the United States. Their research primarily focuses on Materials Science, with a notable emphasis on Electronic, Optical and Magnetic Materials. Additional areas of study include Mechanical Engineering, Spectroscopy, Organic Chemistry, and Biomaterials.
Their scholarly output comprises investigations in various niche fields such as Liquid Crystal Research Advancements, Advanced Materials and Mechanics, Molecular Spectroscopy and Chirality, Hydrogels: Synthesis, Properties, Applications, Synthesis and Properties of Aromatic Compounds, Supramolecular Self-Assembly in Materials, and Material Dynamics and Properties.
Frequent collaborators in their work include:
Among the publication venues where their research has appeared are:
Notable recent papers authored by Edward T. Samulski include:
Edward T. Samulski has received several fellowships throughout their career, including:
Yongchao Si;Edward T. Samulski
John R. Tumbleston;David Shirvanyants;Nikita Ermoshkin;Rima Janusziewicz
Yongchao Si;Edward T. Samulski
James Mark;Kia Ngai;William Graessley;Leo Mandelkern
L. A. Madsen;T. J. Dingemans;M. Nakata;E. T. Samulski
Bin Cheng;Joette M Russell;Wensheng Shi;Lei Zhang
Hommo T Edzes;Edward T Samulski
Bin Cheng;Edward T. Samulski
J. B. McClain;D. E. Betts;D. A. Canelas;E. T. Samulski
A. I. Cooper;J. D. Londono;J. D. Londono;G. Wignall;J. B. McClain
Desimone Joseph M;Alexander Ermoshkin;Nikita Ermoshkin;Edward T Samulski
Hommo T. Edzes;Hommo T. Edzes;Edward T. Samulski
Joseph M. Desimone;Alexander Ermoshkin;Nikita Ermoshkin;Edward T. Samulski
Joseph M. DeSimone;Alexander Ermoshkin;Edward T. Samulski
Bertrand Deloche;Edward T. Samulski
Doo Hyun Ko;John R. Tumbleston;Lei Zhang;Stuart Williams
Lei Zhang;Zhilian Zhou;Bin Cheng;Joseph M. DeSimone
Joseph M. Desimone;Jason P. Rolland;Ansley E. Exner;Edward T. Samulski
Alexander Dardin;Joseph M. DeSimone;Edward T. Samulski
Bin Cheng;Edward T. Samulski
Heino Finkelmann;W. Gleim;K. Hammerschmidt;J. Schätzle
Edward Samulski;Rene Lopez;Doo-Hyun Ko;John Tumbleston
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